A goniostat for a diffractometer or an instrument of similar type which goniostat is rotatable about a first axis, the omega axis, and comprises a goniometer head rotatable about its central axis, the phi axis, which intersects the omega axis in the center of the instrument. The goniometer head is supported on one end of a supporting arm, which at its other end is mounted in the goniostat for rotation about a third axis, the kappa axis, which likewise intersects the omega and phi axes in the center of the instrument. The angles enclosed between the kappa axis and the omega axis and between the kappa axis and the phi axis, respectively, are equal and are in the range of 45.degree.-60.degree..
An x-ray diffractometer system comprising an x-ray optic which directs x-rays, a sample placed into said directed x-rays, wherein said sample diffracts said directed x-rays, creating a diffraction pattern, a translation stage coupled to said sample for moving said sample within said directed x-rays, whereby the resolution, angular range, and intensity of said diffraction pattern may be adjusted, and an x-ray detector for registering said diffraction pattern.
