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ELECTRON LENS FOR ELECTRON MICROSCOPE AND THE LIKE
   
Document Number
US Patent 3643191
Issued Date
February 15, 1972
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Abstract
Movable magnetic compensating pieces are disposed on a lower magnetic path unit of an electron lens. The compensating pieces are in partial contact with the lower magnetic path unit and moved toward and away from each other on the lower magnetic path unit by manipulation form the exterior of the lens.
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ELECTRON LENS FOR ELECTRON MICROSCOPE AND THE LIKE - US Patent 3643191 Drawing
Drawing from US Patent 3643191
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Number of Claims:
4
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Owner
Hitachi, Ltd. (Tokyo,JA)
Published
February 15, 1972
Application Number
05/044,935
Filed
June 10, 1970
US Classification
335/212   250/396ML 250/396R
Int'l Classification
H01J   37/10   (20060101)   H01J   37/141   (20060101)   H01J   37/14   (20060101)  
Examiner
Priority Data
Jun 13, 1969 [JA] 44/55077
USPTO Field of Search
335/210   335/212   335/298   250/49.5D  
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