Apparatus for testing circuit packages including a test sequence generator which is connected to a contactor for making contact to the leads of a circuit package. The contactor includes an inclined track for slidably receiving integrated circuit packages, and circuit package storage tubes connected to the ends of the inclined track. The contactor has a test region at which a circuit package is held by a rocker member. Contact means having a plurality of fingers is operated to make contact with the leads of an integrated circuit package in the test region. A test sequence may then be conducted. After the test sequence the rocker member is operated to release the integrated circuit package which has just been tested from the test region. Another circuit package then moves into the test region and the testing sequence is initiated again.
Double-faced detecting devices for an electronic substrate, the detecting device have a base and two probe-detecting machines oppositely located beside the base. The base has a guiding groove and a substrate platform with a through hole rotatably and movably mounted on the base via the guiding groove. Therefore, when the electronic substrate mounts on the substrate platform, the substrate platform enables to rotate from a horizontal position to a vertical position to expose two faces of the electronic substrate to face the two probe-detecting machines for a double-faced detection of the electronic substrate in high-frequency properties. Additionally, each probe-detecting machine is mounted on a pivot base and pivoted by the pivot base to adjust the height of probe to touch the electronic substrate at the vertical position.
The device for separation of electrical components includes a slide track which runs obliquely downwards and is adjusted to correspond to the width of the components. A frame, intended for testing the components, is provided in the center area of the track. Above the slide track, there are a total of four levers engaging in the slide track or influencing the components in the slide track, which levers are arranged proximate one another at a distance that is approximately equal to or slightly greater than the length of the components with respect to the direction the components slide. The individual levers are activated via one single cam drive with four cams, whereby the cams are arranged so that both the first two levers and the last two levers are activated alternatingly in order to facilitate a step by step forwarding of the component resting below or against them.
A circuit handler provides a controllable environment for monitoring of an electrical device which is being subjected to a test procedure. The controllable environment may correspond to temperature extreme on the order of -55.degree. C. and +155.degree. C. The circuit handler has a support base with a conditioning input for receiving the conditioning fluid, which may be heated air or super-cooled nitrogen or hydrogen, a control input for receiving pneumatic signals, and a pressurized air input for forming an air curtain which prevents the cold conditioning fluid from forming ice on the transport rails. The mechanical operations within the support base are performed by pneumatic solenoids to avoid the generation of stray magnetic or electrical fields which might interfere with the electrical testing process. Delivery of the conditioning fluid to the test site, and possibly a pre-soak site, is achieved by manifold depressions formed on the underside of a test site portion of the transport rail. Additionally, the air curtain is formed by manifold depressions formed in inlet and outlet rail portions which, in combination with the support base, deliver the pressurized air to the junctions of the test site rail portion.
Integrated Circuit ("IC") handling and contact system including adjustable stacked vertical input tracks, a single moving oscillating singulatory mechanism, a contactor assembly including configurations for leaded and leadless chip carriers and pin grid arrays, a monodirectional sorter, and adjustable output tracks. The input tracks and output tracks are adjustable for width and thickness of the IC packages. The contactor assembly includes preloaded contacts for proper penetration and wiping action for each device, pad, or pin, and provides cantileaver and torsional positioning with respect to each pin of the IC packages. The system includes an environmental chamber with the electromechanical components located in a second chamber to one side thereof and coupled by actuating shafts to the environmental chamber. The output module includes a last bin grouping for ICs which fail testing.
A two-sided probe and clamshell fixture embodiment of the present invention comprises a vacuum-actuated bed-of-nails for probing the bottom side of a printed circuit board (PCB) device-under-test (DUT) and a pushrod-actuated bed-of-nails for probing the top side of the printed circuit board device-under-test. The fixture comprises a base, a bottom frame, and a bottom plate that are sealed for vacuum actuation by a gasket. When in place, the DUT completes the vacuum seal and the bottom bed-of-nails which includes a patterned array of spring loaded probe pins reaches through the bottom plate to contact probe points on the DUT. A set of push rods attached to the base push out through the bottom frame and operate a set of gear boxes attached to the outer edges of a top plate within a top frame. A patterned array of spring-loaded probe pins reaches through the top plate to contact probe points on the topside of DUT when a vacuum applied to the bottom assembly causes the pushrods to advance and operate the gear boxes. The gear boxes reverse the direction of force received to cause the topside pushrod-actuated bed-of-nails to engage the DUT.
