A transistor amplifier includes two coupled push-pull amplifier stages and bias stabilization is achieved by the use of a diode-transistor combination in the emitter leads of the respective complementary transistors which comprise the first stage.
A monolithic amplifier circuit including a differential stage, a differential-to-single ended converter stage, a bias circuit and complementary push-pull output transistors is disclosed. The bias circuit is comprised of a current supply, two semiconductor bias devices and two current sinks. The junctions of the bias devices are connected in series across the junctions of the complementary output transistors to provide bias and to compensate for temperature and process variations in the output transistors. One of the bias devices and one of the current sinks are connected in one parallel path and the other bias device and the other current sink are connected in another parallel path through which most of the current from the current supply flows. This parallel connection enables utilization of minimum geometry bias devices in addition to facilitating precise and predictable control of the bias voltages and currents.
A vertical deflection amplifier includes a driver amplifier stage having a source of sawtooth deflection signals at the vertical rate and direct current feedback from the vertical deflection winding as inputs. The driver amplifier stage drives a pair of voltage translation stages each of which drives a transistor in a complementary-symmetry output stage. The voltage translation stages are independent of each other and are biased to operate as constant current sources with no signal present for controlling the quiescent current of the output stage. The improved vertical amplifier can thus be utilized to pass a horizontal rate signal combined with the vertical rate signal to effect image rotation when the deflection amplifier is used with an image pickup tube.
A driver-sensor circuit for a circuit-testing device has a sensor amplifier (Q1, Q2, Q3, and Q4) for sensing the voltage on a device under test connected to its input-output terminal (12). The driver-sensor circuit also includes a driver amplifier (Q5, Q6, Q7, and Q8) for driving the same terminal (12). The driver amplifier (Q5, Q6, Q7, and Q8) can be switched on and off, and a limiting amplifier (Q9, Q10, Q11, and Q12) applies the sensor-amplifier output voltage to the input terminal (20) of the driver circuit (Q5, Q6, Q7, and Q8) to keep the reverse bias on the driver-amplifier transistors (Q5, Q6, Q7, and Q8) to a minimum. To eliminate offset bias current at the input terminal 12 of the sense amplifier (Q1, Q2, Q3, and Q4), compensation transistors (Q15, Q16 ) matching the input-stage transistors (Q1, Q2) of the driver amplifier have their bases tied together to force their base currents to cancel. The resultant emitter currents of the compensation transistors (Q15, Q16) are sensed by amplifiers (52, 54) that control the emitter currents of the first-stage transistors (Q1 and Q2) so that their emitter currents are the same as the emitter currents of the compensation transistors (Q15, Q16). In this way, the base currents of the first-stage transistors (Q1, Q2) are forced to be opposite and thus cancel.