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MULTIPLE JUNCTION DEVICE EMPLOYING A GLASSY AMORPHOUS MATERIAL AS AN ACTIVE LAYER
   
Document Number
US Patent 3864718
Issued Date
February 4, 1975
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Abstract
A semiconductive junction device comprises a thin layer of a glassy amorphous material exhibiting one type of conductivity (either N or P) disposed upon a semiconductive substrate possessing the other kind of conductivity. The glassy layer is sufficiently thin that it exhibits a useful level of conductivity. Preferably, the glassy layer is ion impermeable so that the device remains stable under a wide range of operating conditions. These junctions behave as diodes and can be incorporated in a wide variety of complex semiconductive devices.
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MULTIPLE JUNCTION DEVICE EMPLOYING A GLASSY AMORPHOUS MATERIAL AS AN ACTIVE LAYER - US Patent 3864718 Drawing
Drawing from US Patent 3864718
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Number of Claims:
9
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Owner
Innotech Corporation (Norwalk, CT)
Published
February 4, 1975
Application Number
05/415,435
Filed
November 13, 1973
US Classification
257/2   257/E29.081
Int'l Classification
H01L   29/02   (20060101)   H01L   29/267   (20060101)   H01L   31/00   (20060101)   G03G   5/043   (20060101)   G03G   5/082   (20060101)   H01L   33/00   (20060101)  
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Parent Case
CROSS REFERENCE TO RELATED APPLICATIONS This is a division, of application Ser. No. 227,933 filed Feb. 22, 1972 now U.S. Pat. No. 3,801,879, which application is a continuation-in-part of United States application Ser. No. 122,420 filed by the same inventor on Mar. 9, 1971.
USPTO Field of Search
317/234V   317/235AC   317/235N  
Related Patents
5403404 - Multijunction photovoltaic device and method of manufacture - Owned by Amoco Corporation (Naperville, IL) [*] Notice:The portion of the term of this patent subsequent to September 21, 2010 has been disclaimed.

A multijunction photovoltaic device includes first, second, and third amorphous silicon p-i-n photovoltaic cells in a stacked arrangement. The intrinsic layers of the second and third cells are formed of a-SiGe alloys with differing ratios of Ge such that the bandgap of the intrinsic layers respectively decrease from the first uppermost cell to the third lowermost cell. An interface layer, composed of a doped silicon compound, is disposed between the two cells and has a lower bandgap than the respective n- and p-type adjacent layers of the first and second cells. The interface layer forms an ohmic contact with the one of the adjacent cell layers of the same conductivity type, and a tunnel junction with the other of the adjacent cell layers.

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