An image analysis system is described in which the video signal information is processed so that only the measurements on any one feature are delivered to the output during any one frame scan. In a modification, the function of the computing circuit performing the measurements on the signals arising from scanning the features is changed from frame scan to frame scan until a complete programme of different parameter measurements has been performed on the signals relating to one feature (one parameter being dealt with during each frame scan). The analysis is then transferred to the next feature in the field as outlined above and the same programme of measurements is carried out on the next feature. In a further modification a portion of the video signal containing signals relating to the end of a feature is stored for a number of frame scan periods and is substituted for the corresponding portion arising during the subsequent frame scans, so that the position of the end of the selected feature is fixed whilst the different parameter measurements are made thereon.
A group control system comprises multi-combinations of image pick-up devices and an automatic assembly apparatus controlled by information from the image pick-up devices. A computer responds to demands from the image pick-up devices and the automatic assembly apparatus which independently operate with the computer. A plurality of visual information processing apparatus are provided between the interface of the computer and the image pick-up devices, for processing information therefrom, and a pulse generator is coupled to the image pick-up devices and the visual information processing apparatus, for controlling the operations thereof. The image pick-up devices are grouped into a plurality of groups each of which is coupled to each visual information processing apparatus. The plurality of visual information processing apparatuses are timed by different timing pulses from the pulse generator, whereby processing of the information from a great number of the image pick-up devices is efficiently performed by the computer.
An image analysis measurement system is capable of performing a variety of measurements on single features within a field of scan or independently on multiple features within the field. The system provides direct determination of measurements across multiple features in the field for specific parameters. The measurements include, for example, projected length in any direction, perimeter, Feret's diameter in any direction, longest dimension, convex perimeter, and breadth.
Techniques are disclosed for extracting measurement data from single or multiple fields of scan. Techniques are disclosed for obtaining alignment of data extracted from different fields of scan of the same image and for performing multiple fields of scan to extract data. Communication and control means are disclosed to permit the selection of a wide range of measurements using a keyboard and for the rapid presentation of data on a cathode ray tube display.
Described are techniques for extracting indexing data from images scanned in a television raster format and for processing a wide variety of measurement data from images during or subsequent to the scanning operation for determining measurement parameters related to image features. Techniques are described for extracting data at specific multiple points of a feature and correlating the multiple point data from the feature during subsequent data processing. Systems and techniques are also described for storing and indexing data.
This system measures features or objects each represented by an image by scanning the image in a line scan raster and processing the resulting video signal to determine measurement parameters describing each feature. The system practices methods for obtaining the measurements from signals generated from line intercepts of individual or groups of features. Signal information defining the position of line intercepts intersecting the features, or topological points of each feature is obtained. This information is related to X and Y coordinates and is stored for subsequent use to generate index signals at respective positions in the scan format relating to the stored positions of the X and Y coordinates. The index signals are used to read measurement parameter information from measurement logic or memory.
