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Description  |
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BACKGROUND OF THE INVENTION
1. Field of the Invention
This invention relates to an elastic surface wave propagation device which
can be employed as a delay line or a band-pass or band-rejection filter,
and more particularly to an elastic surface wave propagation device which
comprises a substrate for the propagation of elastic surface wave and at
least one transducer disposed on the major surface of the substrate for
converting an electric signal into an elastic surface wave or vice versa
and in which the elastic surface wave derived from the transducer is
propagated on the major surface of the substrate or an elastic surface
wave is propagated towards the transducer.
2. Description of the Prior Art
There has heretofore been proposed an elastic surface wave propagation
device of this kind which employs, as a substrate for the propagation of
the elastic surface wave, a quartz crystal substrate whose major surface
is a 42.75.degree. rotated Y cut plane, that is, the ST cut plane. The
quartz crystal is mechanically hard. Further, in the case where a pair of
electrodes are disposed side by side on the major surface of the quartz
crystal substrate whose main surface is such an 42.75.degree. rotated Y
cut plane, the quartz crystal substrate presents a piezoelectric effect
between the pair of electrodes, and its electro-mechanical coupling
coefficient is relatively large. Accordingly, only by disposing electrodes
directly on the major surface of the quartz crystal substrate, a
transducer of relatively high conversion efficiency can be constructed.
Moreover, even if the quartz crystal substrate having its major surface
formed in the ST cut plane is affected by temperature change, it does not
cause any substantial change in the propagation velocity of the elastic
surface wave, particularly, a Rayleigh wave which is most typical of it.
Accordingly, the elastic surface wave can be effectively propagated on the
major surface of the quartz crystal substrate with practically no
temperature dependency.
In such a conventional elastic surface wave propagation device, the angle
.theta. between the direction of propagation of the elastic surface wave
on the major surface of the quartz crystal substrate and the X-axis
direction of the quartz crystal is usually selected to be zero. As a
result of this, the conventional device is defective in that spurious
components of such magnitude as not to be negligible appear in a frequency
range which is 1.7 to 1.8 times higher than the center frequency of an
elastic surface wave based on a desired electric signal propagating in the
quartz crystal substrate.
Thus, the conventional elastic surface wave propagation device has such
advantages that it can be constructed mechanically rigid as a whole, that
a transducer can be easily formed on the quartz crystal substrate and that
an elastic surface wave can be propagated on the major surface of the
quartz crystal without temperature dependency. However, the conventional
device is defective in that spurious components of such magnitude as not
to be negligible get mixed in the elastic surface wave converted from a
desired electric signal.
SUMMARY OF THE INVENTION
Accordingly, this invention is to provide a novel elastic surface wave
propagation device which has the abovesaid advantages of the prior art
device but is free from the aforesaid defects encountered in the past.
In accordance with one aspect of this invention, the substrate for the
propagation of an elastic surface wave is a quartz crystal substrate whose
major surface is a 43.degree. rotated Y cut plane. As a result of this,
the elastic surface propagation device of this invention has such
advantages that it can be constructed mechanically rigid as a whole, that
a transducer can easily be formed on the quartz crystal substrate and that
the elastic surface wave can be propagated on the major surface of the
quartz crystal substrate without temperature dependency.
Further, in accordance with another aspect of this invention, the angle
.theta. between the direction of propagation of the elastic surface wave
in the aforesaid quartz crystal substrate and the X-axis direction of the
quartz crystal is selected in the range of 8.degree. to 12.degree..
Consequently, according to this invention, spurious responses are
sufficiently suppressed or negligible.
Other objects, features and advantages of this invention will become
apparent from the following description taken in conjunction with the
accompanying drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a schematic perspective view illustrating one example of the
elastic surface wave propagation device produced according to this
invention;
FIGS. 2A to 2C, inclusive, are graphs showing the relationships of
insertion gain to frequency;
FIGS. 3A and 3B are graphs, similar to FIGS. 2A to 2C, showing the
relationships of insertion gain to frequency; and
FIG. 4 is a graph showing the relationship of response of spurious
components to the angle formed between the direction of propagation of an
elastic surface wave and the X-axis direction of quartz crystal.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
In FIG. 1, there is depicted one example of the elastic surface wave
propagation device produced according to this invention, which comprises a
substrate 1 for the propagation of an elastic surface wave and
transmitting and receiving transducers A1 and A2 disposed on the flat
major surface 2 of the substrate 1 in a predetermined spaced relation to
each other. The substrate 1 is a piezoelectric quartz crystal substrate
whose major surface is a 43.degree. rotated Y plane. The transducer A1 is
composed of a pair of electrodes E1 and E2 disposed in the ST cut plane of
the quartz crystal substrate 1. These electrodes E1 and E2 each have an
interdigital conductor structure and their fingers are formed to extend in
a direction perpendicular to the direction indicated by a line 7 joining
the transducers A1 and A2. The distance between the centers of adjacent
ones of the fingers is selected to be substantially equal to the half
wavelength of an elastic surface wave based on an electric signal which is
desired to obtain on the major surface of the quartz crystal substrate 1.
The transducer A2 is also composed of a pair of electrodes E1 and E2 of
the interdigital conductor structure disposed on the major surface 2 of
the quartz crystal substrate 1, as is the case with the transducer A1.
Between the pair of electrodes E1 and E2 of the transducer A1 is supplied
an electric signal S1 from an electric signal source 3 and the electric
signal S1 is converted into an elastic surface wave. The elastic surface
wave thus obtained is propagated towards the transducer A2 on the major
surface 2 of the quartz crystal substrate 1. Since the electrodes E1 and
E2 of the transducer A1 each have the interdigital conductor structure and
since their fingers extend in the direction perpendicular to the direction
indicated by the line 7 joining the transducers A1 and A2, the elastic
surface wave on the major surface 2 of the quartz crystal substrate 1
propagates in the direction of extension of the line 7 while forming an
equiphase line perpendicular thereto. In FIG. 1, reference numeral 5
indicates the equiphase line of such an elastic surface wave.
The elastic surface wave propagating on the major surface 2 of the quartz
crystal substrate 1 is received by the receiving transducer A2 and
converted thereby into an electric signal S2, thereafter being supplied to
a load 4 connected between the electrodes E1 and E2.
The X-axis 6 of the quartz crystal forming the substrate 1 is parallel with
the major surface 2 of the substrate 1, that is, the ST cut plane, but the
angle formed between the direction of extension of the X-axis 6 and the
direction of propagation of the eleastic surface wave, that is, the
direction indicated by the line 7 or the direction perpendicular to the
line 5, is selected to be in the range of 8.degree. to 12.degree.,
preferably 10.degree.. The selection of the value of the angle .theta. in
the range of 8.degree. to 12.degree. is based on the finding of the fact
that when the angle .theta. is in the above range, only those spurious
components of response which are sufficiently suppressed or negligible get
mixed in the elastic surface wave converted from the desired electric
signal S1.
FIGS. 2A to 2C, 3A, 3B and 4 show experimental data indicating that the
preferred value of the angle .theta. is in the range of 8.degree. to
12.degree..
FIGS. 2A to 2C are graphs respectively showing the relationships of
insertion gain to frequency in the cases of .theta. = 0.degree., .theta. =
10.degree.12' and .theta. = 12.degree.55' when the distance between the
centers of adjacent ones of the fingers of the interdigital conductor
structure forming the electrodes E1 and E2 of the transducers A1 and A2 is
selected so that a narrow-band filter characteristic having a center
frequency of 32 MHz may be obtained between the electrodes E1 and E2 of
each of the transducers A1 and A2. In the figures, the abscissa represents
frequency (in MHz) and the ordinate the relative insertion gain (in dB).
As is seen from FIGS. 2A to 2C, in the case of .theta. = 0.degree.,
spurious components are produced in the vicinity of 55 MHz which is
substantially 1.7 to 1.8 times higher than the center frequency 32 MHz of
the desired electric signal and the insertion gain (maximum response) of
the spurious components is close to that (maximum response) of the desired
electric signal; in the case of .theta. = 10.degree.20', the maximum
response of spurious components is negligible with respect to the maximum
response of the desired electric signal; and, in the case of .theta. =
12.degree.55', the maximum response of spurious components is not
negligible with respect to the desired electric signal. Accordingly, it is
apparent that an excellent narrow-band filter characteristic can be
obtained in the case of .theta. = 10.degree.20'.
FIGS. 3A and 3B are graphs, similar to FIGS. 2A to 2C, respectively showing
the relationships of insertion gain to frequency in the cases of .theta. =
0.degree. and .theta. = 10.degree. when the distance between the centers
of adjacent ones of the fingers of the interdigital conductor structure
forming the electrodes E1 and E2 of each of the transducers A1 and A2 is
selected such that a narrow-band filter characteristic having a center
frequency 145 MHz may be obtained. As is evident from FIGS. 3A and 3B,
spurious components of large insertion gain are obtained in the
neighborhood of 260 MHz which is about 1.7 to 1.8 times higher than 145
MHz but, in the case of .theta. = 10.degree., the insertion gain of the
spurious component is suppressed more than 20 dB as compared with the case
of .theta. = 0.degree.. Accordingly, it is seen that an excellent
narrow-band filter characteristic can be obtained in the case of .theta. =
10.degree.. Further, FIG. 4 shows the relationship of the maximum response
of the spurious component to the angle .theta. in the case of adopting
such a construction as to obtain the narrow-band filter characteristic, as
described above with regard to FIGS. 2 and 3, the abscissa representing
the value of the angle .theta. and the ordinate the maximum response (in
dB) of the spurious component. With .theta. = 10.degree., the maximum
response of the spurious component is minimum and, as the angle .theta.
becomes smaller than 10.degree., the value of the maximum response
increases. Especially, with the angle .theta. being less than about
8.degree., the value of the maximum response becomes remarkedly larger
and, with the angle .theta. being larger than 10.degree., the value of the
maximum response increases and, especially when the angle .theta. becomes
larger than 12.degree., the maximum response remarkedly increases.
Although this invention has been described above as being applied to the
elastic surface wave propagation device which has two transducers disposed
on a 43.degree. rotated Y cut plane of a quartz crystal substrate and can
be employed as a delay line or a narrow-band pass or band-rejection
filter, the invention is also applicable to an elastic surface wave
propagation device which has one transducer and a reflector disposed
opposite thereto on the 43.degree. rotated Y cut plane of the quartz
crystal substrate and can be used, for example, as a delay line.
Further, this invention is also applicable to an elastic surface wave
propagation device of such a construction that a plurality of pairs of
transmitting and receiving transducers are disposed on the quartz crystal
substrate, and an elastic surface wave propagation device of such a
construction that one transmitting transducer and a plurality of receiving
transducers are disposed opposite to each other on the quartz crystal.
It will be apparent that many modifications and variations may be effected
without departing from the scope of the novel concepts of this invention.
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