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Document Number
US Patent 4090080
Issued Date
May 16, 1978
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Abstract
Obtaining information about positional source of, for example, a gamma ray source, by slit collimating and detecting beam components from the source in a multiplicity of varying slit locations, and using the resulting data to plot the source position.
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Drawing from US Patent 4090080
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Number of Claims:
29
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Owner
Published
May 16, 1978
Application Number
05/646,917
Filed
January 6, 1976
US Classification
250/366   250/505.1
Int'l Classification
G01T   1/164   (20060101)   G01T   1/00   (20060101)  
Examiner
Assistant Examiner
USPTO Field of Search
250/578   250/505   250/394   250/366  
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