In an electronic computer system wherein, when a microprogram-controlled central processing unit receives a stop signal from a console, the contents of a group of registers are assigned to predetermined fixed areas in a main memory and, in response to a start signal, the assigned contents of the group of registers are delivered from the fixed areas to the group of registers. The reading and writing of the contents of the group of registers within the central processing unit is effected for the fixed areas of the main memory in which the contents are assigned.
A data shunting and recovering device is provided to shunt and hold the data stored in a register and its address before writing the register during a delay period following generation of an interrupt. This data is then restored into the register when an instruction of recovering is given. Therefore, it is allowed to achieve the moderating effects of delaying the stopping of the stage advance in data processing upon generation of an instruction for interruption without loss of data stored in the memory prior to writing during this delay period.
Methods and systems of testing a processor are disclosed. A system includes a storage unit, a memory hierarchy, and a processor. The memory hierarchy is coupled to the storage element. The processor is coupled to the memory hierarchy. The processor reads instructions from the memory hierarchy. On a probe mode break, the processor initiates the transfer of original code of the memory hierarchy to the storage unit. Test code is loaded into the memory hierarchy. The test code is executed. The original code is loaded back into the memory hierarchy. Normal execution is resumed.
In a memory circuit having a memory device operative to read, write and hold data and an operation unit implementing computation between a first datum supplied externally and a second datum read out of the memory device, a selector for selecting one of operational function specification data preset externally and a selector for selecting one of bit write control data present externally are given with select control signals, so that a frame buffer memory operative in read-modify-write mode can be used commonly.
A memory device formed on an IC chip includes dynamic random access memories for effecting data read and write operations, first and second data terminals for receiving data from an external side of the IC chip, and a controller having a first data input connected to the first data terminal to receive first data, a second input connected to receive second data read, a third data input connected to the second data terminal to receive a function mode signal, and operation unit for executing operations between the first data provided from the first data input and the second data provided from the second input. The operation unit includes a function setting unit responsive to the function mode signal for setting a function indicated by the function mode signal prior to receipt of the first data. The second data is read out of a selected part of the storage locations. The operation corresponding to the function set by the function setting unit is executed for the first and second data. The result of the execution is written into the selected part of the storage locations via the input of the dynamic random access memories during one memory cycle.
Methods and systems of testing a processor are disclosed. A system includes a storage unit, a memory hierarchy, and a processor. The memory hierarchy is coupled to the storage element. The processor is coupled to the memory hierarchy. The processor reads instructions from the memory hierarchy. On a probe mode break, the processor initiates the transfer of original code of the memory hierarchy to the storage unit. Test code is loaded into the memory hierarchy. The test code is executed. The original code is loaded back into the memory hierarchy. Normal execution is resumed.
