An indexing assembly designed for use in combination with a conveyor assembly which includes a feeding conveyor for pans, each of which has a plurality of receiving molds therein in which dough is delivered on a synchronized basis by a separate conveyor than the pan feeding conveyor. The subject indexing assembly is provided to properly orient and position the individual pans as well as the receiving molds therein into receiving relation to the quantities of dough, or other objects being delivered, in a predetermined and preferred indexed manner so as to eliminate waste of product or the delivery of the dough to a portion of the pan other than the receiving mold.

Apparatus for manufacturing bakery products is disclosed where an individual dough packet 26 is deposited in a pan 24 made of magnetic material. Endless belts 16 and 18 including magnets 62 has a portion thereof in a path along which the pans 24 are advanced by conveyor belts 12 and 14. The pans 24 are magnetically coupled to the belts 16 and 18, and a sensor 20 is positioned along the path nearby a position Y where an individual dough packet 26 is deposited in a pan at this position.. The sensor 20 provides a control signal upon a pan 24 moving to this position. A motor 22 having a brake 70 and a clutch 72 drives the belts 16 and 18, and a pan 24 held by the belts is advanced upon actuation of the clutch and stopped upon actuation of the brake. A control circuit 80 includes a signal generator that provides a timing signal indicating that a dough packet 26 has been deposited in a pan 24. This circuit regulates the operation of the brake 70 and clutch 72 in response to the control signal and timing signal, enabling the control circuit 80, so that the belts 16 and 18 move a pan 24 in a step-wise fashion past the position Y where dough packets 26 are deposited in the pan.

A mechanism for positioning IC devices to be tested aligned in a test tray of an automatic handler for an IC test system capable of reducing a time for transferring the test tray from a supply area to a test head area which has a plurality of test contactors and from a test head area to a discharge area is disclosed. The mechanism includes a stopper which determines the first stop position of the test tray when said test tray contacts with the outer surface of the test tray and the second stop position of the test tray when said stopper contacts with the end surface of a groove being provided with on its side portion of the test tray to receive and engage with the projection of the stopper. The distance between the adjacent test contactors is adjusted to be equal to two times or integer multiple of the distance between the adjacent IC devices to be tested aligned in the test tray and the distance between the first position and the second position is adjusted to be equal to the distance between the adjacent IC devices to be tested so that minimizing the index time for transferring the test tray becomes possible.

In order to be able to quickly and inexpensively feed articles, in particular bags, into spaces, for example insides of folding boxes of a continuously moving, transporting device, the speed of the transporting device is slower during a feed-in operation than the speed of the transporting device outside of the feed-in operation. A control device is provided in a device for feeding in the articles in order to control this change in speed.

A device for cleaning containers, especially bottle containers. To make it more compact while ensuring thorough cleaning it is characterized by a container intake (2), by a subsequent helical guide (6) for the containers (1), by at least one container carrier (5) positioned within the helical guide with integrated spray nozzles (16) for the cleaning agent, and by a container outtake (8) downstream of the helical guide.