High emitter-coupled logic switching speeds and low standby power are achieved with a dual-port RAM cell in which two NPN Schottky transistors in a non-saturable bistable flip-flop configuration are flanked by a second pair of transistors whose collectors are individually coupled to the flip-flop collectors. The two output digit lines of the RAM are individually connected to the emitters of the flanking transistors, and their bases are individually coupled to the two select lines. A read signal on either select line enables a flanking transistor to sense the state of the RAM. Writing is accomplished by applying a high logic signal to both select lines and one digit line while the other digit line is dropped to a low state.
A high density, static random access memory (SRAM) circuit with single-ended memory cells employs a plurality of (4T-2R) or (6T) type SRAM cells and a regenerative sense amplifier. Each of the SRAM cells employs a single bit-line (BL) and two word lines.
Bipolar transistor memory cell and method for use in a random access memory. A pair of state elements are cross coupled so that they assume opposite states in accordance with signals applied thereto, a pair of bipolar pass transistors are connected to respective ones of the state elements for applying signals to the state elements, and current flow through the pass transistors is monitored to determine the states of the state elements.
