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Process and apparatus for the measurement of the factor of infra-red absorption or emission of materials
   
Document Number
US Patent 4204120
Issued Date
May 20, 1980
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Abstract
A method of measuring the absorptivity or emissivity factor of a sample at ambient temperature comprises maintaining a thermopile at a constant temperature substantially above ambient temperature and exposing the sample to radiation exclusively from the thermopile. The voltage across the thermopile is measured and provides a measure of the absorptivity or emissivity factor. The thermopile may be disposed in a temperature-controlled furnace extending into a conical cavity.
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Process and apparatus for the measurement of the factor of infra-red absorption or emission of materials - US Patent 4204120 Drawing
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Number of Claims:
10
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Published
May 20, 1980
Application Number
05/908,021
Filed
May 22, 1978
US Classification
250/341.1   250/338.1
Int'l Classification
G01J   5/00   (20060101)  
Examiner
Priority Data
May 20, 1977 [FR] 77 15497
USPTO Field of Search
250/338   250/340   250/341   250/352   250/353   250/358R   73/355EM  
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