An inspection system utilizing a CCD includes a CCD data transfer generator which allows the changing of the CCD without redesigning the system. The numbers of horizontal rows and vertical columns of pixels of the CCD are set into a digital memory and into a waveform generator. The waveform generator provides horizontal scanning and vertical scanning waveforms in accordance with the row and column settings whereby the CCD can be replaced with a different size CCD and new numbers set into the memory and waveform generator.
The identification of permissible variations in a CCD image perimeter as blemishes is avoided by sequentially considering the adjacent pixels of a selected plurality of pixels. Pixel motions are defined between adjacent pixels and can be either straight or diagonal. Diagonal pixel motions are recorded as straight when the first and last pixel motions are diagonal in opposite directions and the intervening pixel motions are straight.
Blemishes in the proximity of the perimeter of an image on a charge coupled device (CCD) are detected. The image pixels adjacent to the perimeter are sequentially detected and three consecutive pixels define a motion as either straight, clockwise or counterclockwise. The detection occurs in a clockwise direction and straight or clockwise motions are permitted. When two counterclockwise motions are detected, and a clockwise motion has not occurred between them, a blemish signal is provided.
An on-line method of and apparatus for inspecting an apertured mask sheet to be formed into a shadow mask for a color cathode ray tube are disclosed. In one of several embodiments described the mask sheet is linearly scanned by a laser spot transverse to the direction of advancement of the mask sheet. The peak values of the grey levels of the laser light transmitted by the mask sheet are detected and the data is convoluted electronically to form a series of convolution windows. The grey levels of the successively formed convolution windows are compared to at least one reference value and an output is produced at least in those cases where an error in the mask aperture size is detected.
A solid state image pickup apparatus includes a solid state image pickup device for receiving an optical image of an object and generating an electrical image signal representing the optical image of the object in synchronism with a driving pulse from a driving circuit. A sampling circuit generates a sampled image signal by sampling the electrical image signal read out of the solid state image pickup device with a first sampling pulse from a first pulse circuit synchronized with the driving pulse. An analog-to-digital convertor converts the sampled image signal to a digital image signal with a second sampling pulse from a second pulse circuit. A test signal generator generates a test signal which is synchronized with the driving pulse and alternately changes in level between consecutive pixels. A controller controls the phase of the first sampling pulse and the phase of the second sampling pulse relative to each other by processing the test signal.
In a method of detecting blemishes in the phosphor screen on the inside surface of a kinescope faceplate while simultaneously avoiding detecting deposits on the outside surface of the faceplate as blemishes, the faceplate is arranged between a light source and a light detector in an orientation wherein light from the light source passes through the faceplate and subsequently through the phosphor screen prior to reaching the detector.
