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Subcriticality measurement apparatus and method
   
Document Number
US Patent 4515749
Issued Date
May 7, 1985
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Abstract
A method and apparatus for determining the subcriticality of masses of uranium by directing epithermal neutrons toward said mass, isolating said material from external thermal neutrons, and measuring the ratio of thermal and epithermal neutrons to epithermal neutrons which enables the establishment of a subcriticality value representative of the mass of uranium.
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Subcriticality measurement apparatus and method - US Patent 4515749 Drawing
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Number of Claims:
8
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Owner
Published
May 7, 1985
Application Number
06/587,445
Filed
March 8, 1984
US Classification
376/254   376/257 376/259 976/DIG.231
Int'l Classification
G21C   17/06   (20060101)  
Examiner
Parent Case
CROSS REFERENCE TO RELATED APPLICATION This is a continuation of application Ser. No. 295,322, filed Aug. 24, 1981, now abandoned.
USPTO Field of Search
376/254   376/257   376/259  
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