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FIELD OF THE INVENTION
The present invention relates to the field of spectroscopy, and
particularly to the field of diffuse reflectance infrared Fourier
transform (DRIFT) spectroscopy.
DESCRIPTION OF RELATED ART
A reflectance spectrum of a powdered, granular material or a ground
material in a matrix typically consists of two different spectroscopic
components which correspond to energy that is specularly reflected from
the surface of the sample and energy that is diffusely reflected from
within the sample. Specularly reflected energy contains spectroscopic
features that are derived from the surface of the sample, these features
often change in response to any change at the surface. Often, specular
reflectance spectra cannot be easily compared to a specular reflectance
reference spectrum to identify a sample material.
In contrast, diffusely reflected energy enters the sample and/or sample
matrix before reflecting. The spectroscopic features of a diffuse
reflectance spectrum, like the features of a transmittance spectrum, are
unique to a particular material. The reference spectrum of a material can
be established for diffuse reflectance and compared against a known
diffuse reflectance spectrum to identify the composition of the sample,
including its components and the concentration percentages of those
components. Sample identification and/or sample component concentrations
therefore require obtaining the spectrum of diffusely reflected energy
separate from the spectrum of specularly reflected energy.
Various spectroscopic systems have been devised to separate the diffuse
component of a reflection spectrum from the specular component. Several of
these spectroscopic systems work on the aperture exclusion principle first
advanced by Fuller and Griffiths. The aperture exclusion principle assumes
that the surface of the sample tends to behave like a mirror. A well
defined beam of incident energy specularly reflects off the sample
according to Snell's law and forms a somewhat well defined beam of
specularly reflected energy. The specularly reflected energy is thus
largely confined to a known area of the aperture of a collecting mirror.
Energy in all other regions is presumed to have been diffusely reflected.
The region of the aperture having the specularly reflected energy is
obstructed so that some or all of the diffusely reflected energy is
directed to the detector.
The aperture exclusion principle works only so long as the sample behaves
like a mirror. Many materials, however, have a granular surface. The
incident radiant energy specularly reflects from each grain according to
its particular orientation and size relative to the wave length of the
incident energy. The cumulative effect of specular reflection from all the
grains in an illumination area is a phenomenon that is called specular
scatter. Specular scatter can disperse specularly reflected energy over
all angles of reflection. Some materials exhibit so much specular scatter
that specularly reflected energy is distributed somewhat evenly over all
angles of reflection and the specular component of the reflectance
spectrum is thus inseparable from the diffuse component at the aperture of
the collecting mirror.
An alternative to aperture exclusion involves placing a blocker device on
or closely adjacent to the surface of the sample to block out specularly
reflected energy, as is shown, for example, in U.S. Pat. No. 4,661,706
owned by the assignee of the present invention. A beam of incident energy
is incident to the sample on one side of the blocker and diffusely
reflected energy is collected from the other side of the blocker. The
incident energy must penetrate into the sample to get under the blocker
and reach the detector. Thus, the detector receives only diffusely
reflected energy. Experiments have repeatedly shown that the blocker
device removes essentially all specularly reflected energy from a
reflectance spectrum.
The blocker device, however, has some limitations. The incident side of the
blocker should diffusely reflect more energy since it has more total
energy. The blocker thus prevents a majority of the diffusely reflected
energy from reaching the detector. Moreover, a common reason for taking a
reflectance spectrum, in preference to a conventional transmittance
spectrum, is that the sample is opaque to the source energy. Thus, diffuse
reflection usually only occurs from regions of the sample that are near
the surface. The blocker device therefore has the unintended effect of
limiting the sample area to a region that is adjacent to the blocker. The
relatively low throughput efficiency and limited sample size obtained
using the blocker device are undesirable attributes in some applications,
such as quality control that involve sampling macroscopic samples without
regard to microscopic inhomogeneities.
There exists a need for a diffuse reflectance optical system that has a
high throughput efficiency as well as good exclusion of specularly
reflected energy from samples that exhibit specular scatter.
SUMMARY OF THE INVENTION
The present invention contemplates a diffuse reflectance system that uses a
new principle of focal plane differentiation to extract the diffuse
reflectance component of a reflectance spectrum. Many samples that exhibit
substantial amounts of specular scatter have a well defined surface with
many small grains of specularly reflecting material. Thus, the present
invention presumes that specular reflection and specular scatter occur at
a well defined plane, such as the surface of a sample, and that diffuse
reflection occurs from within the sample or sample/matrix combination. For
sample surfaces having relatively small grains, the specular reflection
and specular scatter components of the reflectance spectrum are filtered
at a remote field stop plane that corresponds to a sample image plane.
Diffuse energy in the sample reflection spectrum which appears to emanate
from areas not excluded by the image of the filter is directed to a
detector of a spectrometer, such as a conventional FT-IR
spectrophotometer. The effectiveness of the image plane filter at
eliminating specular scatter depends upon the extent to which specular
scatter is confined to a well defined optical plane at the surface of the
sample, the extent to which the energy penetrates the sample or sample
matrix, the numerical aperture of the observing system, and the imaging
quality of the observing system.
In the preferred embodiment of the present invention the sample is placed
at a focal plane of an optical system. The optical system forms an image
on the surface of the sample that includes optical information about a
remote field stop filter or splitter. The optical system then images the
surface of the sample onto the remote field stop. Specularly reflected
energy from the surface of the sample is in focus and therefore retains
the image information about the image of the filter. In contrast, energy
that is diffusely reflected from within the sample is out of focus and
spread across the field stop. Assuming that the energy from the surface of
the sample is specularly reflected and the energy from within the sample
is diffusely reflected, the specular component of the reflectance spectrum
is spatially confined to certain select areas or bands where it is
excluded, for example, by reflecting it back to the source. Part of the
diffusely reflected energy not confined to those select areas is directed
by the field stop filter to the detector.
The field stop filter may comprise a reflective area beam splitter having
an array of reflective surfaces with reflective "islands", including, for
example, a grid of reflective flat wires or reflective faces. The
reflective surfaces that receive the incident energy from the source need
have no particular symmetry relative to the optical axis of the optical
system. The optical system images the incident reflective areas of the
filter onto the sample and images energy reflected from the sample onto
the filter. Radiant energy specularly reflected from the surface of the
sample is in focus and reflects back onto the incident reflective areas of
the filter to be discarded from the system. Some of the radiant energy
diffusely reflected from within the sample is out of focus. Thus, part of
this defocused, diffusely reflected energy fills areas between the
incident reflective areas of the filter. The spatial separation of the
components of the reflection spectrum at the field stop filter permits the
defocused, diffusely reflected energy to be directed to a detector.
The optical system may also include a first field stop grid filter, a
refractive beam splitter and a second grid filter. The first grid filter
is the negative of the second field stop grid filter, meaning that energy
going through the first filter and remaining in focus through the rest of
the optical system will be blocked by the second filter. The optical
system forms an image on the surface of the sample that includes optical
information about the first grid filter. The optical system then images
the surface of the sample onto the second grid filter. Specularly
reflected energy from the sample is in focus and is thus blocked by the
second filter while diffusely reflected energy from the sample passes
though the second grid filter to a detector.
The incident reflective areas or incident grid transmissive areas are
spaced close together to better define a flat sample image plane. To avoid
significant diffraction effects, the spacing between incident reflective
areas or grid areas, however, must be larger than X where
##EQU1##
In that equation, LRS is the least resolvable separation, .lambda. is the
wavelength of the energy and NA is the numerical aperture of the optical
system. The relative size and spacing of the reflective areas may increase
with the granularity of the sample to partially compensate for the rougher
surface of a granular sample by still being able to eliminate most
specular scatter from the system by back reflection off the larger
incident reflective areas.
By utilizing one or more remote field stop filters to separate the
diffusely reflected energy from the specularly reflected energy in the
reflectance spectrum, the present invention has eliminated the effect of
the morphalogy or microscopic geography of the sample or sample matrix.
The present invention does not require the sample to be heated, mixed,
stirred or treated in any manner for the spectroscopic analysis to be
made.
The present invention further contemplates large scale area sampling to
reduce the effects of localized heterogeneity and to improve the signal to
noise ratio of the resulting spectrum. The scaling is most simply
accomplished by increasing the focus area on the surface of the sample. A
focus area diameter of between 1 mm and 25 mm is thought to have
particular utility for infrared measurement of substances in a quality
control environment. However, the present invention is not limited to this
focus area diameter and has been used in conjunction with an IR microscope
accessory.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1a schematically illustrates a diffuse reflectance optical system that
uses a faceted splitter at a field stop to filter out the specular
component of a diffuse reflectance spectrum;
FIG. 1b is an enlarged detail view of the faceted splitter of FIG. 1a
illustrating the energy input to, energy output from and reflectance
patterns of the saw tooth reflective surface of the faceted splitter;
FIG. 1c is a greatly magnified, detail elevation of a sample area having an
irregular granular surface at the sample plane of the optical system, the
elevation schematically illustrating some input energy that is specularly
reflected, some input energy that is specularly scattered and some input
energy that is diffusely reflected from the sample;
FIG. 2 is an alternate embodiment of the system shown in FIG. 1 that
includes a simplified optics system for macrosampling purposes;
FIG. 3 is an alternate embodiment of the diffuse reflectance optical system
shown in FIG. 2 wherein the faceted splitter is replaced with a reflective
area beam splitter;
FIG. 3a is an elevation of a wire grid used as the filter at the field stop
plane in the FIG. 3 embodiment; and
FIG. 4 is an alternate embodiment of the system shown in FIG. 1 including
first and second remote field stop filters and a refractive beam splitter.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
FIG. 1a shows an embodiment of a diffuse reflectance spectroscopy system,
indicated generally at 1, that uses a filter or mask at a field stop. The
system 1 includes an energy source 2 directing a beam of energy 3 through
the system. The terms energy or energy beam as used herein encompass
energies of different wavelengths from visible light through the radiant
energy spectrum, with infrared energy being preferred.
Energy beam 3 is reflected from a concave transfer mirror 4 to a focus at a
field stop plane 5. A filter, indicated generally at 6, is positioned at
field stop plane 5. As discussed in more detail below, the filter 6 is
preferably a faceted beam splitter having input faces reflecting the
incident energy in spaced bands in a normal direction from the field stop
plane. A condensing lens mirror system 8 focuses the spatially banded
energy at a remote image plane mask 9. The energy emanating from the
remote image plane mask 9 enters a Cassegranian lens, indicated generally
at 10. The Cassegranian lens 10 includes a secondary mirror 12 and a
primary mirror 13 operative to focus the incident energy onto a sample
area 14 on sample plane 15.
The sample 14 comprises a granulated powder material or a ground material
in a matrix. The sample may be a single material or may be comprised of a
number of constituent or component materials. The sample does not have to
be specially treated or mixed, but instead can be placed on the sample
plane in its untreated state for analysis.
Energy specularly reflected from the sample area is returned to and imaged
at remote image plane mask 9 and filter 6. As explained below, the filter
6 reflects focused, specularly reflected energy back to mirror 4, while
directing defocused, primarily diffusely reflected energy to detector 16
by way of concave transfer mirror 17. The detector 16 receives the
diffusely reflected energy and converts the same into spectroscopic data
about the sample area, the data being available to the researcher for
analysis at the data terminal 18. From this diffuse reflectance data, the
researcher can identify the composition of the sample and its
constituents, including the concentration percentages of those
constituents.
In use, the image of the incident reflective face of faceted splitter or
filter 6 at field stop plane 5 is spatially defined or imaged at remote
image plane mask 9 before being imaged onto sample 14 at sample plane 15.
The energy forms an odd number of image planes so that energy that is
specularly reflected from sample 14 returns to the incident face of the
faceted splitter from which it was originally reflected. The focused
energy returned from the sample area is thus reflected by the faceted
splitter 6 back to source 2. Some defocused energy returned from sample 14
is contained in bands between the incident or input faces of the faceted
beam splitter and thus strikes other output faces of the faceted splitter
6 for reflection of this defocused energy to output detector 16.
FIG. 1b aids in understanding the structure and operation of faceted
splitter 6. The faceted splitter 6 includes a body 20 having a saw tooth
edge or cross section forming a plurality of parallel input faces 21 and a
plurality of parallel output faces 22. The input faces 21 are inclined at
an angle .theta..sub.1 relative to a normal to the field stop plane output
faces 22 are oppositely inclined at an angle .theta..sub.2 relative to the
normal.
The incoming incident energy forms an angle .phi. with respect to the field
stop plane 5. The incident energy beam from source 2 impinges upon the
reflective surfaces on each individual input face 21 in the beam's path.
The angle of the incident energy .phi. and input face angle .theta..sub.1
are chosen such that the radiant energy reflects from the input faces 21
in a direction along the optical path of the system. Since the incident
energy is striking a plurality of spaced parallel input faces 21, the
normally reflected energy leaves the faceted splitter in a pattern of
generally parallel energy bands, schematically illustrated in shaded band
areas 23. The bands of energy 23 are separated by bands 24 without energy
from the source, the bands 24 being aligned with output faces 22 which do
not reflect energy from the source because of their orientation.
The image of faceted splitter 6 is projected by the banded incident energy
23 onto sample 14 of sample plane 15. The splitter image comprises a
series of energy bands corresponding to the incident reflective surfaces
of each incident input face 21 of the faceted splitter.
FIG. 1c aids in understanding the interaction of the radiant energy with
the sample surface area of a diffusely reflecting sample which exhibits
specular scatter. A granular sample surface having an irregular surface
contour 25 is shown of the type typically encountered with diffusely
reflecting material.
Incident energy bands 23a-d would be specularly reflected, as though from a
mirror, at the sample focal plane to form beams 23a'-d' but for the
presence of surface discontinuities or irregularities introduced by the
granular nature of the sample. The incident energy beams partially scatter
by reason of being irregularly reflected off the contoured surface of each
grain near the focal plane as emplified by beams 23a"-d". However, since
the granules are normally relatively small, the specularly scattered
reflections 23a"-d" off the granules normally occur fairly close to the
sample focal plane. As such and because of the relative size and spacing
of input faces 21, the specularly reflected energy 23a"-d" is still mainly
in focus with the optic system. The specular reflective energy 23a'-d' and
specular scattered energy 23"-d" by being in focus retain the information
about the image of the splitter at the sample and thus return to the
splitter in bands 23a-d to strike the same input faces 21 of the splitter.
The specular reflections returning from the surface of sample 14 are
reflected by input faces 21 back toward the source 2 to effectively be
discarded or filtered from the system.
Some of the incident energy 23a-d may penetrate the surface of sample 14
and invade that sample before being diffusely reflected back out of the
sample as schematically illustrated at 23a"'-d"'. The diffuse reflectance
energy 23a"'-d"' is spread across the entire optical path as it returns
through the optical system to the faceted beam splitter for filtering.
Thus, some of the diffusely reflected energy from the sample area will
return to faceted splitter 6 in the bands 24 between the focused energy
bands 23. This defocused diffusely reflected energy in bands 24 appears to
emanate from surface areas not excluded by the image of the filter at the
sample. This defocused or filtered energy will strike output faces 22 on
the faceted splitter and be directed to the detector 16. Thus, faceted
splitter 6 separates or filters the energy by where the energy emanates
from relative to the focused image of the faceted splitter at sample plane
15, so that only the defocused, presumably diffusely reflected radiant
energy is reflected to detector 16.
The relative efficiency of the present invention in separating the specular
and diffuse components of the reflective spectrum from the sample depends
on the spacing of the faces 21 and 22 on faceted splitter 6 relative to
the depth of penetration of the energy at the sample area compared to the
focused image of the splitter at sample plane 15. A sample area having
shallow depth of energy penetration requires that the faces 21 and 22 on
faceted splitter 6 be placed closely together so that the surface of the
sample area is almost uniformly energized. Conversely, a sample area,
which has a large depth of energy penetration, should have larger faces 21
and 22 separated by larger distances.
The upper limit of the spacing of the faces of the faceted splitter 6 is
determined by design and sampling considerations. For example, the size
and separation of the faces 21 and 22 of splitter 6 should be correlated
to the wave length of the incident energy. In addition, the faces 21 and
22 should be separated by a sufficient distance that the faceted splitter
6 does not produce significant diffraction effects.
The location of the sample is particularly critical in that the sample
surface must be located at a good quality optical focus. One method of
positioning the sample at a good focus is to direct visible light along
part of the same optical path as the sampling energy and to use the visual
observation system shown in FIG. 1a to focus that visible light at the
sample plane 15.
In this regard, a portion of a beam of visible light 27 from lamp 28
reflects off refractive beam splitter 29 to a pivotable mirror 30. If
pivotal mirror 30 is arcuately moved into the optical path of the energy
as illustrated by the dotted line 30a, the energy from source 1 is blocked
and visible light from lamp 28 is reflected off mirror 29. This reflected
visible light is focused at remote image plane mask 9 so that secondary
mirror 12 and primary mirror 13 focus the visible light onto the same
sample plane that the radiant energy is focused upon in the sampling mode.
Part of the reflected light passes through refractive beam splitter 29 to
mirror 31 where it may be observed with eyepiece 32. In the visible light
viewing mode, the user can adjust the mask 9 to vary the size of the
opening at the remote image plane to control the size of the surface area
being sampled and can vertically adjust the sample plane to bring the
optical system into proper focus for subsequent radiant energy sample
testing.
It is to be appreciated that the optical system shown in FIG. 1a may
comprise either a low magnification sampling system or a high
magnification microscope.
FIG. 2 illustrates a simplified version of the system shown in FIG. 1 that
is particularly well adapted to macrosampling of sample surface areas for
quality control purposes. The structural elements in the FIG. 2 embodiment
that are common with the structural elements of the FIG. 1 embodiment are
identified by the same reference numerals. As is apparent from comparing
the common reference numerals and as described in more detail below, the
diffuse reflectance spectroscopy system 1A of FIG. 2 is very similar to
the FIG. 1 embodiment except that the remote image plane mask and
associated lenses are eliminated and the visible viewing system
simplified.
In FIG. 2, concave transfer mirror 4 focuses energy from source 1 onto
input faces of faceted splitter 6. Secondary mirror 12 directs the energy
reflected from faceted splitter 6 to primary mirror 13. Mirror 13 forms an
image of faceted splitter 6 on sample 14 at sample plane 15.
Primary mirror 13 collects the energy reflected from sample 14 so that it
is returned to faceted splitter 6 by secondary mirror 12. The faceted
splitter 6 separates specularly reflected energy from sample 14 from
energy that is diffusely reflected from within the sample area surface as
explained above. The input faces 21 of the faceted splitter return focused
energy specularly reflected from the sample to the source while the output
faces 22 of the faceted splitter direct unfocused energy diffusely
reflected from the sample to the detector 16 by way of concave transfer
mirror 17.
The macrosampling system shown in FIG. 2 can also comprise means for
automatically positioning a plurality of samples 14 at the focus of
primary mirror 13. For example, samples 14 may be sequentially moved into
position on an endless track or conveyor including a plurality of sample
holders.
The optical system of the macrosampling apparatus shown in FIG. 2 may be
focused in a visible light viewing mode. The visible light viewing system
includes a lamp 28 producing a visible light beam 27, which is reflected
along the optical path of the radiant energy by refractive beam splitter
29. The eyepiece 32 is positioned in axial alignment with that optical
path. Sample plane 15 may be visually observed by pivoting or sliding
faceted splitter 6 out of the optical path of eyepiece 32. Visible light
beam 27 reflects off refractive beam splitter 29 to sample plane 15 and
returns through refractive beam splitter 29 to eyepiece 32. Alternately,
the source of visible light may be placed between the primary mirror and
the sample so that eyepiece 32 receives a "dark field" view of sample
image plane 15. Aligned eyepiece 32 permits aligning and focusing sample
plane 15 and the sample 14 thereon at the focus of primary mirror 13.
FIG. 3 shows an alternate embodiment of the diffuse reflectance
spectrometer apparatus shown in FIG. 2 utilizing a different type of
filter or mask at the field stop plane. Transfer mirrors 35 and 36 direct
radiant energy 3 from source 2 to a focus at a filter 37, such as an
"island" splitter or wire grid. The filter 37 may take numerous forms
having different patterns of reflective surfaces or different patterns of
reflective surface areas coupled with transmissive surface areas or open
areas. As shown for example in FIG. 3a, the filter 37 may have a crossing
grid of reflective wires 38 defining a pattern of open transmissive areas
39. The reflective wires 38 are analogous to input faces 21 on splitter 6
while open transmissive areas 39 are analogous to output faces 22.
The incident energy reflected in patterned bands from filter 37 enter
secondary mirror 12 and primary mirror 13 of Cassegranian lens 10 to focus
the diverging beam of banded radiant energy at sample plane 15. A focused
image of the filter 37 is formed at the sample plane 15 by the energy
striking the sample 14.
Incident radiant energy that is specularly reflected from the sample 14 at
sample plane 15 is imaged onto the reflective regions of filter 37 so as
to be lost from the system by being reflected back toward source 2. As
described above, some of the incident radiant energy that is diffusely
reflected from the sample is out of focus and passes between the
reflective regions of filter 37 to mirror 40. Transfer mirrors 41 and 42
direct the diffusely reflected radiant energy from mirror 40 to detector
16. Reflective area splitter or filter 37 thus functions in much the same
manner as the reflective faceted splitter 6 of FIG. 1a except that the
diffusely reflected radiant energy passes between the reflective areas
rather than reflecting off output faces having reflective surfaces.
The embodiment of FIG. 3 also has a visible light viewing and focusing
system as described in conjunction with FIG. 2 including lamp 28,
refractive beam splitter 29 and eyepiece 32 axially aligned with the
optical path. When mirror 40 and splitter 37 are slid or pivoted out of
the way, visible light is focused on the sample 14 by Cassegranian lens
10, with the sample image being viewed in eyepiece 32 to allow adjustment
of sample plane 15 to bring the optical system into focus.
FIG. 4 shows alternate embodiment of the diffuse reflectance spectrometer
apparatus shown in FIGS. 1 through 3 utilizing two filters at two discrete
field stop planes and a refractive beam splitter. Transfer mirrors 44 and
45 direct radiant energy 3 from source 2 to a focus at a first remote
field stop plane 47. A first filter 48 is positioned in the field stop
plane in the optical path of the system. First filter 48 comprises a grid
having crossed reflective wires 38 defining open transmissive areas 39
therebetween as illustrated in FIG. 3A.
The radiant energy striking the reflective wire grids is discarded from the
system. The energy passing through the open or transmissive areas 39 in
first grid filter 48 is directed in discrete energy bands toward
refractive beam splitter 50. The incident energy bands reflected from
refractive beam splitter 50 enter secondary mirror 12 and primary mirror
13 of Cassegranian lens 10 to focus the banded radiant energy at the
sample 14 on sample plane 15. A focused image of the first grid filter 48
is formed at the sample plane 15 by the energy striking the sample 14.
Primary mirror 13 collects the energy reflected from sample 14 so that it
is returned to refractive beam splitter 50 by secondary mirror 12. Some of
the energy reflected from sample 14 passes through the refractive beam
splitter 50 to a second wire grid filter 50 positioned at a second remote
field stop plane 51. The second wire grid filter 50 is positioned the same
distance from refractive beam splitter 50 as is the first grid filter 48.
The second grid filter 50 is a negative to or a complement of the first
grid filter 48 meaning that energy going through the first filter and
remaining in focus through the rest of the optical system will be blocked
by the reflective wires of the second grid filter 50.
As discussed above, the specularly scattered and specularly reflected
energy from sample 14 will remain in focus and will be discarded from the
system by being reflected from the wire grids 38 of second filter 50. The
diffusely reflected energy from sample 14 will be spread across the entire
reflectance spectrum, with that diffusely reflected energy positioned
between the bands of focused energy passing through the open or
transmissive areas 39 of second filter 50 to pivotal mirror 52. Transfer
mirrors 54 and 55 direct the diffusely reflected radiant energy from
pivotal mirror 52 to detector 16.
The embodiment of FIG. 4 also has a visible light viewing and focusing
system as described in conjunction with FIGS. 2 and 3. This visible light
system includes lamp 28, refractive beam splitter 29 and eyepiece 32
axially aligned with the optical path. When mirror 52 is pivoted out of
the optical path, visible light is focused on sample 14 by Cassegranian
lens 10, with the sample image being viewed in eyepiece 32 to allow
vertical adjustment of sample plane 15 to bring the optical system into
focus.
The principles, preferred embodiments and modes of operation of the present
invention have been described in the foregoing specification. The
invention which is intended to be protected herein should not, however, be
construed as limited to the particular forms described as these are to be
regarded as illustrative rather than restrictive. Variations and changes
may be made by those skilled in the art without departing from the spirit
of the invention. For example, the optical systems could all be inverted
with the incident energy striking the sample from below rather than from
above. In such case, the sample would be supported from below by an energy
transmitting window. This orientation may provide some advantages, such as
being able to utilize a smaller quantity of sample to perform the
analysis. Accordingly, the foregoing detailed description is considered
exemplary in nature and not as limiting to the scope and spirit of the
invention set forth in the appended claims.
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