A chip type electronic part which comprises a chip main body of a cylindrical external shape having a circular cross section, and cap terminals also of a circular cross section applied onto opposite ends of the chip main body. The chip main body is covered, on its side peripheral face not applied with the cap terminals, by an outer covering member having a rectangular cross section, with an interval between a side face of the outer covering member and a corresponding side face of each of the cap terminals being set within a range of +0.2 mm to -0.2 mm.
A system for testing circuits of digital data telecommunications networks provides selected physical and protocol testing on an integrated basis. Systems and test methods provide for analysis of test results to provide diagnosis of probable cause of actual or apparent faults related to data transmission and may also provide automatic implementation of additional diagnosis, followed by a second level of fault diagnosis using the additional test results. Display screens provide the results of fault analysis, provide comparative viewing of fault-free benchmark data and provide suggestions as to probable cause of faults. A central test unit portion of the system may be installed at a carrier's offices and testing may be controlled on a dial-up basis over telephone lines from a remote customer location using a personal computer as the test selection entry and information screen viewing device.
