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| United States Patent | 5019797 |
| Link to this page | http://www.wikipatents.com/5019797.html |
| Inventor(s) | Marstiller; John A. (Marston Mills, MA);
Bodensiek; Paul H. (Waltham, MA);
Grise; Frederick G. J. (Osterville, MA) |
| Abstract | An electrical resistance device includes a conductive metal pattern carried
on an insulating surface. A portion of the conductive metal pattern
includes a two-dimensional array of areas devoid of conductive material
("voids") within a mesh of conductive material. Typically, the voids are
hexagonal and are arranged such that the adjacent edges of adjacent
hexagons are parallel to each other and spaced apart a distance not more
than about 0.10 in. The hexagonal voids typically are arranged so that the
centers of sets of three adjacent voids lie on the corners of equilateral
triangles. |
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Title Information  |
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Drawing from US Patent 5019797 |
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Electrical resistance device |
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| Publication Date |
May 28, 1991 |
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| Filing Date |
September 29, 1989 |
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| Parent Case |
CROSS-REFERENCE TO RELATED APPLICATION
This application is a continuation-in-part of our application Ser. No.
138,857, filed Dec. 29, 1987 and entitled ELECTRICAL HEATING DEVICE, now
U.S./ Pat. No. 4,892,998 which application is hereby incorporated by
reference, and a division of Ser. No. 142,625, filed Jan. 11, 1988, now
U.S. Pat. No. 4,888,089. |
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Title Information  |
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Description  |
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BACKGROUND OF INVENTION
This invention relates to electrical resistance devices and, more
particularly, to devices including a thin layer or film of conductive
material on an insulating substrate.
A number of different types of electrical devices are made by depositing a
thin film of conductive material, for example, nickel or silver, on an
insulating substrate, e.g., paper or organic plastic. The resistivity
(ohms per square) of such a layer depends, of course, on the volume
resistivity (om-centimeters) of the conductive material and the thickness
of the layer. Using vacuum deposition procedures, it is possible to
deposit a metal layer as thin as, perhaps, 35 to 40 Angstrom. A nickel
layer of such a thickness has a resistivity of about 20 ohms per square.
On a commercial basis it is extremely difficult, if not impossible, to
deposit uniform metal films at thicknesses significant less than about 35
Angstroms, and it accordingly also has not been feasible to produce
uniform metal layers having a resistivity much greater than that of a
uniform 35 Angstrom layer.
It also has been difficult to produce electrical devices in which the
resistivity of the metal layer forming one arm of the device is different
from that of the metal layer forming another area.
SUMMARY OF INVENTION
We have discovered that the resistivity of an electric resistance device
comprising a thin metal layer on an insulating substrate may be increased
to substantially more than the resistivity of the layer itself by removing
spaced portions of the metal so that the remaining metal defines a regular
array of metal-free devices ("voids") within a metal mesh.
In preferred embodiments, the voids are hexagonal and are arranged with the
centers of sets of three adjacent voids at the corners of equilateral
triangles and with the edges of adjacent voids parallel to each other.
According to a preferred process, the mesh-void pattern is produced by
first depositing a continuous metal layer of the desired thickness and
then removing the metal in the desire "void" areas with an acid etching
process.
DESCRIPTION OF DRAWINGS
FIG. 1 a plan view of an electrical resistance device embodying the present
invention.
FIG. 2 is a section taken at line 2--2 of FIG. 1.
FIG. 3 is an enlarged plan view of a portion of the device of FIG. 1, more
clearly illustrating the mesh-void pattern.
DESCRIPTION OF PREFERRED EMBODIMENTS
Referring now to FIGS. 1-3, there is shown an electrical resistance device,
generally designated 10, comprising a metal pattern 12 deposited at
essentially uniform thickness (i.e., about 35 Angstroms) on an organic
plastic (e.g., polyester) substrate 14. Along the opposite side edges of
device 10, metal pattern 12 comprises continuous conductor contact strips
16 about one-half inch wide. In the illustrated embodiment, a tinned
copper conductor 18 overlies and is adhesively attached (e.g., with a
conventional conductive adhesive) to each conductor contact strip 14. In
other embodiments, the conductor contact strips may be deposited at a
greater thickness than the remaining portion of the metal pattern, often
in lien pattern, often in providing separate conductors.
As shown most clearly in FIGS. 1 and 3, the heating area 19 of device 10
(i.e., the portion between the spaced apart conductors 18 and conductor
contact strips 16) comprises a regular rectilinear array of hexagonal
voids 20 (i.e., hexagonally shaped areas that are free of metal or other
conductive material) in a metal mesh pattern 21. The voids 20 are arranged
on 0.375 in. centers, with the centers of strips of three adjacent voids
at the corners of equilateral triangles (each leg of each triangle being
0.375 in. long). The triangles are arranged so that their sides are
perpendicular to or form 30.degree. angles with the direction of current
flow, i.e., with a line extending transversely of device 10. The adjacent
side edges of adjacent hexagonal voids are parallel to each other, and the
size of the voids is such that the metal strip 22 between adjacent voids
is about 0.005 inches wide (i.e., the size of each hexagon is such that
the diameter of a circle within and tangent to the sides of the triangle
is 0.370 in.).
The exact resistivity (ohms per square) of the heating area 18 should be
determined empirically. To a close approximation, the resistivity (R) is
given by the following formula:
1.732rD/W
where r is the resistivity (ohms per square) of the metal layer, and D and
W are, respectively, the diameter of a circle inscribed within and tangent
to hexagonal voids 20 and W is the width of the strip 22 between adjacent
voids. Using the formula, it will be seen that resistivity (R) of the
heating area 19 of device 10 is about 74r. If, as in the illustrated
embodiment, the metal layer is nickel about 35A thick, r is about 20.5
ohms per square and R is about 1525 ohms per square.
In practice, the electrical device 10 of FIGS. 1-3 is made as follows:
a. Deposit a continuous metal layer of the desired thickness on substrate
14. In preferred practice the layer is deposited using a conventional
vacuum deposition or metallization procedure.
b. Deposit an acid resist pattern over the continuous metal layer. The acid
resist pattern is deposited such that resist material covers all the metal
that is not to be removed (i.e., it covers conductor contact strips 16 and
the metal mesh in heating area 19). The acid resist pattern may be
deposited using any of a number of conventional techniques. For example,
screen printing, roto-graveure or flexo-graveure. Alternatively, a solid
layer of acid resist may be deposited over the entire metal layer, and the
pattern then produced by selectively removing portions of the resist using
a conventional photoresist technique. Materials useful in forming the
resist pattern include Blake Acid Resist from Cudner & O'Connor, Dychem
(Type M or AX) film photoresist and Dupont (#4113) film photo resist.
c. Pass the device (with the resist plan pattern thereon) through an acid
bath to remove all the metal layer that is not protected (i.e., covered)
by the acid resist pattern (the remaining metal provides conductor contact
strips 16 and mesh 21.
d. Remove the resist pattern.
e. Adhesively attach conductors 18.
OTHER EMBODIMENTS
Other embodiments may include a number of different heating areas of
different resistivity. In such a device, for example, a pair of heating
areas may be provided between the spaced-apart conductors. In one such
area, the array of hexagonal voids may be as previously discussed with
respect to the embodiment of FIGS. 1-3. In the other, the hexagonal voids
may be arranged on different (e.g., 0.250 inch centers) and the width of
the metal strips between adjacent voids may be different also (e.g., a
width as small as about 0.001 in. may be produced using a photoresist
process). IN. such a device, it will be seen that the two heating areas
have different resistivities. One (that identical to that of the FIGS. 1-3
embodiment) will have a resistivity 74 times greater than that of the
metal layer; in the other, the resistivity will be about 250 times that of
the metal layer.
In other embodiments, other conductive materials (e.g., either metals such
as silver or gold or other conductive compositions or dispersions) may be
used in lieu of nickel, and different mesh-void patterns (e.g., those
described in our above-referenced and incorporated application) may be
used.
These and other embodiments will be within the scope of the following
claims.
* * * * *
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Description  |
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