The invention relates to a test device for testing electronic components mounted on a carrier such as a lead frame, comprising: a transport path for supplying a carrier for testing; a manipulator for engaging and displacing a supplied carrier; a test contact with which a carrier and/or at least one component mounted on the carrier can be placed in contact by the manipulator; and a transport path for discharging a tested carrier. The invention also embraces a test assembly which includes at least one described test device. The invention furthermore provides a method for testing electronic components mounted on a carrier and method for calibrating a test device.

An integrated circuit test system tests a plurality of integrated circuit devices which are classified by an auto-handler. The test system comprises a test board for receiving the device under test, circuit tester for carrying out the tests, an auto-handler for mounting, demounting and classification the devices based on the test results. Individual test result signals are related to the respective individual devices. Equipment on the test board correspond to the respective devices and transmit both an individual existence signal and a device identification signal synchronized with the individual test result signal. The device identification signal identifies the individual information signal as being related to a particular device, in order to avoid an error in classification of the device by the auto-handler irrespective of possible wrong connections and of the order of the transmission of the individual test result signals.

An automatic motor tester runs performance and quality control checks on newly assembled motors. The motor tester includes a vertical support, contacts contained within a housing which is mounted to the vertical support so as to be movable horizontally and vertically relative to the vertical support, and a controller operatively connected to the contacts to send signals to and receive signals from the motor for motor testing. The motor is positioned above a lifter which is operable to lift the motor so as to automatically electrically connect the motor contacts to the test contacts so that the test operator does not handle electrical leads.

Automatic seminconductor part handler. In one aspect the handler includes a source of parts and a transfer mechanism for transferring a part from the source to a belt assembly. The belt assembly includes a belt, a belt displacement controller, and an image forming device for forming an image of the part with respect to a desired end point. The belt displacement controller is coupled to the belt to move the belt based upon the image of the part with respect to the desired end point, thereby positioning the part in a precise location with respect to the direction of motion of the input belt.

A test board includes a plurality of sockets for connection to a plurality of integrated circuit chips to be tested. A test control device on the board turns on at least one test engine for testing the plurality of chips simultaneously. A checking circuit verifies the functionality of each chip by comparing outputs of chips with each other or with a golden chip. Failing chips are disconnected from further testing and passing or failing chips are recorded.