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| United States Patent | 5195374 |
| Link to this page | http://www.wikipatents.com/5195374.html |
| Inventor(s) | Parsons; Philip (Farnham, GB2);
Willson; Jolyon P. (Andover, GB2) |
| Abstract | In pressure sensor systems based upon a micromachined silicon pressure
sensor comprising a resonantly vibratable beam supported on a diaphragm,
the beam is excited into resonant vibration by directing an optical
excitation signal at the beam resonant frequency, via an optical fibre 26,
onto a part of the sensor other than the beam, preferably the diaphragm.
To detect the vibrations, the underside of the beam 16 and the adjacent
upper surface of the diaphragm 18 are together arranged to define a
Fabry-Perot cavity, and a continuous optical detection signal is directed
at this cavity, also via the optical fibre 26. The optical detection
signal is thus modulated at the vibration frequency of the beam 16 by the
cavity, and the modulated signal is reflected back into the optical fibre
26. |
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Title Information  |
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Drawing from US Patent 5195374 |
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Sensor systems |
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| Publication Date |
March 23, 1993 |
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| Filing Date |
December 11, 1991 |
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| Parent Case |
This application is a continuation-in-part of application Ser. No.
07/567024, filed on 14 Aug. 1990, now U.S. Pat. No. 5,105,665 issued on
Apr. 21, 1992. |
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| Priority Data |
Aug 30, 1989[GB]8919573
May 11, 1990[GB]9010660 |
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Title Information  |
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Description  |
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BACKGROUND OF THE INVENTION
This invention relates to sensor systems, and is more particularly but not
exclusively concerned with sensor systems based upon sensors in which the
parameter to be sensed affects the frequency of a resonantly vibrating
element whose resonant vibration is excited and/or sensed optically.
SUMMARY OF THE INVENTION
According to the present invention, there is provided a sensor system for
sensing a measurand, the system comprising:
a sensor comprising a resonantly vibratable element formed as part of a
unitary semiconductor structure which is arranged such that application of
the measurand to the structure affects the resonant frequency of the
vibratable element;
means for exciting said element into resonant vibration; and
means for detecting the frequency of said vibration;
wherein said element is arranged to define with an adjacent portion of said
structure a Fabry-Perot cavity whose width varies with the vibration of
said element; and
said frequency detecting means comprises means for directing an optical
detection signal at said cavity for modulation thereby at the frequency of
said vibration.
BRIEF DESCRIPTION OF THE DRAWINGS
The invention will now be described, by way of example only, with reference
to the accompanying drawings, of which:
FIG. 1 shows somewhat schematically an optically excitable silicon pressure
sensor in accordance with the present invention;
FIG. 2 is a plan view of a modified version of the sensor of FIG. 1; and
FIG. 3 is a schematic diagram of a complete sensor system based upon the
sensor of FIG. 1.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
The sensor of FIG. 1 is indicated generally at 10, and is basically similar
to the sensor described in detail in U.S. patent application Ser. No.
07/358,771 (Barth et al), filed on 30 May 1989, and entitled LAMINATED
SEMICONDUCTOR SENSOR WITH VIBRATING ELEMENT AND ASSOCIATED METHOD AND
PRODUCT, the disclosure of which is hereby incorporated by reference. Thus
the sensor 10 comprises first and second single crystal silicon wafers 12,
14, of which the first wafer has a beam 16 formed therein by cutting two
parallel slots therethrough to define the two longitudinally-extending
sides of the beam, while the second has a diaphragm 18 with a trench 20 in
its upper surface formed therein by electrochemical etching. The two
wafers 12, 14 are fusion bonded together at the dotted line 22, to form a
unitary structure 24 in which the beam 16 is disposed above the trench 20
in the diaphragm 18, as described in the aforementioned United States
patent application.
To use the sensor 10 as a pressure sensor, the unitary silicon structure 24
is sealed in a suitable housing (not shown), with the upper surface of the
diaphragm 18 facing into an evacuated chamber within the housing. The beam
16 is excited into resonant vibration, and a pressure to be sensed is
admitted to the housing beneath the diaphragm 18, so that the diaphragm
flexes in dependence on the pressure, and thus varies the tension in, and
therefore the resonant frequency of, the beam.
In the aforementioned U.S. patent application, the principal methods
described for exciting the beam 16 into resonant vibration and sensing the
frequency of the resulting vibrations are electrostatic and piezoelectric
respectively, although direct optical excitation, by applying pulses of
light energy directly to the beam, is also disclosed. In accordance with
prior art teachings, e.g., of the aforementioned letter by Venkatesh and
Culshaw, this would typically have involved providing the beam 16 with a
metal coating, e.g. of gold, at the location indicated at C in FIG. 1,
with the disadvantage mentioned earlier. However, we have found that it is
possible to excite the beam 16 into resonant vibration indirectly, by
directing the optical excitation signal at a region of the unitary
structure 24 other than the beam.
Thus we have found that resonant vibration of the beam 16 can be optically
excited by directing a suitable pulsed optical excitation signal, via an
optical fibre 26 which passes sealingly through the aforementioned
evacuated chamber and terminates immediately above the beam, onto an
optically absorptive coating 28 of a suitable metal, e.g. aluminium,
chromium or gold, deposited, typically by sputtering, on the upper surface
of the diaphragm 18 in the base of the trench 20, at the position
indicated at B in FIG. 1. It will be noted that the optical excitation
signal passes through the beam 16, which can readily be achieved by using
a signal whose wavelength is of the order of 1300 nm, to which the unitary
silicon structure 24 is substantially transparent.
Since the beam 16 does not require to be coated and therefore consists
solely of single crystal silicon, it has a very high Q and its vibration
characteristics are very stable and repeatable: in particular, its
temperature coefficient is much lower than that of a coated beam, and much
more predictable and stable.
When the coating is deposited at B, it forms with the underside of the beam
16 a Fabry-Perot optical cavity, whose width varies with vibration of the
beam 16. This cavity can be used as an interferometer to modulate a
continuous optical detection signal, applied via the fibre 26 as will
become apparent hereinafter with reference to FIG. 3, in order to sense
the frequency of vibration of the beam 16.
Even without a coating at B, the space between the underside of the beam 16
and the upper surface of the diaphragm 18 in the base of the trench 20
still acts as a Fabry-Perot cavity, albeit slightly less effectively.
The width of the Fabry-Perot cavity should not normally change sufficiently
with movement of the diaphragm 18 in response to changing pressure to
cause fading of the modulated detection signal. However, if fading does
occur, the problem can be overcome using the two-wavelength detection
technique which forms the subject of U.S. patent application Ser. No.
07/629310 (Willson).
As an alternative, the coating 28 can be deposited at the position
indicated at D in FIG. 1, adjacent one end of the beam 16 (which would
clearly necessitate relocating the optical fibre 26), or at the position
indicated at A in FIG. 1, on the underside of the diaphragm 18. Also,
instead of an optically absorptive metal coating, a coating of a material
exhibiting surface piezoelectric effect, e.g., zinc oxide, can be used.
We have also found that by exciting the diaphragm 18, it is possible to
indirectly excite two resonant elements, e.g. beams, simultaneously. FIG.
2 is a plan view of such an arrangement, with a first beam 30
substantially identical to the beam 16 of FIG. 1 (i.e. arranged to be
tensioned by an associated diaphragm not shown in FIG. 2), and a second,
cantilever beam 32, disposed at right angles to the first beam. The beam
32 is formed in the same cutting operation as is used to form the beam 30,
and is used for temperature compensation purposes as described in more
detail in our U.S. Pat. No. 4,972,076.
The way in which the sensor 10 is incorporated into a sensor system for
sensing pressure is illustrated in FIG. 3. Thus an excitation light source
40, typically a laser diode or an LED which produces an optical output at
a first wavelength l.sub.1 of about 1300 nm, is driven by an amplifier 42
to produce a pulsed optical excitation signal at a frequency approximately
equal to the expected resonant frequency of the beam 16 in the sensor 10.
The output of the source 40 is coupled via an optical fibre 43 and one
input port of an optical coupler 44 into the optical fibre 26, along with
a continuous optical signal, of lower wavelength l.sub.2, which is
produced by a source 46, typically also a laser diode or an LED, and
applied via an optical fibre 47, to another input port of the coupler 44.
The pulsed optical output signal of wavelength l.sub.1 exits the end of the
optical fibre 26, and is incident upon and absorbed by the coating 28,
thus creating localised thermal stress which excites the diaphragm 18 into
vibration and thereby indirectly exciting the beam 16 into resonant
vibration.
The optical signal of wavelength l.sub.2 is modulated by the resonantly
vibrating beam 16 in the sensor 10, and reflected back along the optical
fibre 26 to a splitter 48, and thence through a Fabry-Perot or like filter
50 to a photoelectric detector 52. The output of the detector 52, which
contains a component at the resonant frequency of the beam 16, is applied
to the input of the amplifier 42 to create a positive feedback loop, which
adjusts the operating frequency of the source 40 so as to maintain the
beam vibrating at its resonant frequency, while a secondary output from
the amplifier 42, again containing a component at the resonant frequency
of the beam 16, constitutes the pressure dependent output of the system.
Several modifications can be made to the described embodiments of the
invention.
For example, suitable optically absorbent coatings other than metal or a
piezoelectric material can be used to absorb the optical excitation
signal: indeed, in the limit, the coating may be omitted altogether,
particularly if an especially sensitive part of the structure 24 (other
than the beam 16) is located and/or slightly more optical power is used.
Also, the beam 16 can be indirectly excited into resonant vibration by
excitation signals other than an optical excitation signal. Thus the
optical excitation signal is believed to work by creating
vibration-inducing stresses resulting from local heating due to absorption
of the light constituting the optical signal (which stresses are enhanced
or supplanted by stresses due to piezoelectric effect when the absorptive
coating 28 exhibits surface piezoelectric effect). Similar local heating
and/or piezoelectric effects can be created by forming a resistor or
piezoelectric resistor in the wafer 12 or the wafer 14 at a location
corresponding to a respective one of the locations A, B, D specified for
the coating 28. This resistor can be formed as described in the
aforementioned United States patent application of Barth et al, and would
enable resonant vibration of the beam 16 to be excited by an electrical
excitation signal, rather than an optical one.
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Description  |
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