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Method and apparatus for producing high density plasma using whistler mode excitation    
United States Patent5225740   
Link to this pagehttp://www.wikipatents.com/5225740.html
Inventor(s)Ohkawa; Tihiro (La Jolla, CA)
AbstractHigh density plasma is produced in a long cylindrical cavity by the excitation of a high frequency whistler wave within the cavity. The cylindrical cavity, and hence the plasma, is imbedded in a high magnetic field, with magnetic lines of force passing axially (longitudinally) through the cavity. The magnetic field has an electron cyclotron frequency associated therewith that is much greater than the wave frequency associated with the whistler wave. In one embodiment, electromagnetic energy is coupled axially into the cylindrical cavity using a resonant cavity, which coupled energy excites the whistler wave. In another embodiment, electromagnetic energy is coupled radially into the cylindrical cavity using a slow wave structure. The plasma is created without using electrodes; and the excitation of the whistler wave is achieved at a high Q value. Various configurations are used to couple between the resonant cavity or circuit and the plasma, thereby allowing the invention to be used for numerous applications, such as plasma processing, e.g., plasma etching, stripping or deposition; or the excitation of high power lasers; ion sources; or sputtering guns.
   














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Drawing from US Patent 5225740
Method and apparatus for producing high density plasma using whistler

     mode excitation - US Patent 5225740 Drawing
Method and apparatus for producing high density plasma using whistler mode excitation
Inventor     Ohkawa; Tihiro (La Jolla, CA)
Owner/Assignee     General Atomics (San Diego, CA)
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Publication Date     July 6, 1993
Application Number     07/857,981
PAIR File History     Application Data   Transaction History
Image File Wrapper   Patent Term   Fees
Litigation
Filing Date     March 26, 1992
US Classification     315/111.41 204/298.37 313/231.31 315/111.21
Int'l Classification     H05H 001/18
Examiner     LaRoche; Eugene R.
Assistant Examiner     Yoo; Do Hyun
Attorney/Law Firm     Fitch, Even, Tabin & Flannery
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Priority Data    
USPTO Field of Search     315/111.21 315/111.41 315/111.71 315/111.81 313/231.31 204/298.38 204/298.37
Patent Tags     high density plasma whistler mode excitation
   
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3373357



[0 after 0 votes]
5081398
Asmussen

Jan,1992

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4990229
Campbell
204/298.06
Feb,1991

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4876983
Fukuda
118/722
Oct,1989

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4810935
Boswell
315/111.41
Mar,1989

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4745337
Pichot

May,1988

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4727293
Asmussen
315/111.41
Feb,1988

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4691662
Roppel
118/50.1
Sep,1987

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4630566
Asmussen
118/50.1
Dec,1986

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4585668
Asmussen
438/478
Apr,1986

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4507588
Asmussen
315/39
Mar,1985

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4401054
Matsuo
118/723MR
Aug,1983

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4101411
Suzuki
204/298.37
Jul,1978

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5003225
Dandl
315/111.41
Dec,1969

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What is claimed is:

1. Plasma production apparatus comprising:

a substantially cylindrical plasma chamber having a longitudinal axis, said plasma chamber having a prescribed gas therein;

magnetic field generating means for generating a magnetic field with an associated electron cyclotron frequency .omega..sub.cc and magnetic lines of force that axially traverse said plasma chamber; and

resonant excitation means for exciting a whistler wave having a frequency .omega. in said plasma chamber using resonant electromagnetic energy, where .omega..sub.cc <.omega., said whistler wave ionizing said prescribed gas, whereby ionized particles exist in said plasma chamber having a collisional frequency associated therewith, said ionized particles comprising a plasma;

said resonant excitation means comprising a resonant cavity positioned adjacent a first end of said plasma chamber, said resonant cavity being substantially axially aligned with said longitudinal axis so that electromagnetic energy resonating in said resonant cavity axially couples into the plasma within said plasma chamber.

2. The plasma production apparatus as set forth in claim 1 further including plasma delivery means for controlling the delivery of plasma from said plasma chamber to a workpiece.

3. The plasma production apparatus as set forth in claim 2 wherein said workpiece is positioned adjacent a second end of said plasma chamber, said plasma delivery means directing plasma from said plasma chamber to said workpiece, whereby plasma processing may be carried out on said workpiece.

4. Plasma production apparatus comprising:

a substantially cylindrical plasma chamber having a longitudinal axis, said plasma chamber having a prescribed gas therein;

magnetic field generating means for generating a magnetic field with an associated electron cyclotron frequency .omega..sub.cc and magnetic lines of force that axially traverse said plasma chamber; and

resonant excitation means for exciting a whistler wave having a frequency .omega. in said plasma chamber using resonant electromagnetic energy, where .omega..sub.cc <.omega., said whistler wave ionizing said prescribed gas, said resonant excitation means comprising:

a multiplicity of annular conductive rings within said plasma chamber, said rings being centered about and uniformly spaced along the longitudinal axis of the plasma chamber so as to form a slow wave structure inside of said plasma chamber, and

means for causing an electrical current to flow through said conductive rings so as to excite resonant electromagnetic energy that is radially coupled into said plasma, said radially coupled electromagnetic energy exciting said whistler wave within said plasma chamber;

whereby ionized particles exist in said plasma chamber having a collisional frequency associated therewith, said ionized particles comprising the plasma.

5. The plasma production apparatus as set forth in claim 4 wherein the electrical current flowing in said conductive rings excites said whistler wave using a TE.sub.01 mode.

6. The plasma production apparatus as set forth in claim 4 wherein the electrical current flowing in said conductive rings excites said whistler wave using a TE.sub.11 mode.

7. Apparatus for exciting a gas to produce a laser comprising:

a substantially cylindrical plasma chamber having a longitudinal axis, said plasma chamber having a prescribed gas therein;

magnetic field generating means for generating a mangetic field with an associated electron cyclotron frequency .omega..sub.cc and magnetic lines of force that axially traverse said plasma chamber; and

resonant excitation means for exciting a whistler wave having a frequency .omega. in said plasma chamber using resonant electromagnetic energy, where .omega..sub.cc <.omega., said whistler wave ionizing said prescribed gas;

said plasma chamber being closed at both ends;

said closed plasma chamber and the plasma confined therein comprising part of an optical system that allows coherent light to reflect between two reflective surfaces, one placed at each end of said plasma chamber;

said resonant excitation means including a resonant cavity that surrounds at least a portion of said plasma chamber;

said resonant excitation means including means for exciting electromagnetic energy within said resonant cavity that is radially coupled into said plasma chamber so as to excite said whistler wave, said whistler wave, in turn, ionizing said prescribed gas and producing coherent light that reflects between said two reflective surfaces, thereby producing the laser.

8. The apparatus as set forth in claim 7 wherein said resonant cavity comprises a slotted resonant cavity surrounding said plasma chamber, said slotted resonant cavity having an inner wall at a first radius from said longitudinal axis, said slotted resonant cavity having periodically slotted gaps, the spacing of said gaps being determined by the wavelength of the excited whistler wave, and a solid outer wall spaced at a second radius from said longitudinal axis, said second radius being greater than said first radius.

9. Plasma production apparatus comprising:

a cylindrical cavity having a prescribed gas therein;

a magnetic field generator that generates a magnetic field having magnetic lines of force that axially traverse said cylindrical cavity; and

an electromagnetic launcher that generates and launches resonant electromagnetic energy into the gas held in said cylindrical cavity, said electromagnetic energy exciting a whistler wave that axially propagates through said cylindrical cavity following said magnetic lines of force and ionizes said prescribed gas, thereby producing a plasma;

said electromagnetic launcher comprising:

a resonant cavity positioned adjacent a first end of said cylindrical cavity, said resonant cavity being substantially axially aligned with a longitudinal axis of said cylindrical cavity, and

means for exciting the resonant electromagnetic energy in said resonant cavity, said resonant electromagnetic energy being coupled axially into said cylindrical cavity.

10. Plasma production apparatus comprising:

a cylindrical cavity having a prescribed gas therein;

a magnetic field generator that generates a magnetic field having magnetic lines of force that axially traverse said cylindrical cavity; and

an electromagnetic launcher that generates and launches electromagnetic energy into the gas held in said cylindrical cavity, said electromagnetic energy exciting a whistler wave that axially propagates through said cylindrical cavity following said magnetic lines of force and ionizing said prescribed gas, thereby producing a plasma;

said electromagnetic launcher comprising

a multiplicity of annular conductive rings within said cylindrical cavity, said rings being centered about and uniformly spaced along a longitudinal axis of the cylindrical cavity so as to form a slow wave structure inside of said cylindrical cavity, and

means for exciting an electrical current in said conductive rings so as to excite resonant electromagnetic energy within said cylindrical cavity, said resonant electromagnetic energy being coupled radially into the gas contained within said cylindrical cavity.

11. A method of producing plasma comprising:

(a) selectively injecting a specified gas into a cylindrical cavity, said cylindrical cavity having a longitudinal axis;

(b) generating a magnetic field having an associated electron cyclotron frequency .omega..sub.cc and magnetic lines of force that are substantially parallel to said longitudinal axis; and

(c) generating resonant electromagnetic energy in a resonant cavity, said resonant cavity being positioned adjacent said cylindrical cavity; and

(d) exciting a whistler wave in said cylindrical cavity by coupling the resonant electromagnetic energy from said resonant cavity into said cylindrical cavity, said whistler wave propagating through said cylindrical cavity following said magnetic lines of force and ionizing said prescribed gas, thereby producing a plasma, said whistler wave having a frequency .omega., where .omega..sub.cc >.omega..

12. The method as set forth in claim 11 wherein step (c) further includes axially coupling the resonant electromagnetic energy into said cylindrical cavity.

13. The method as set forth in claim 11 wherein step (c) further includes radially coupling the resonant electromagnetic energy into said cylindrical cavity.

14. The method as set forth in claim 11 wherein said plasma is a high density plasma.
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BACKGROUND OF THE INVENTION

The present invention relates to apparatus and methods for producing high density plasma for use with plasma processing and other applications, such as high power lasers. More particularly, the invention relates to plasma production apparatus and methods that axially or radially excite whistler waves in a cylindrical plasma imbedded in a high magnetic field.

A plasma is an ionized gas. Because a plasma is a gas, it exhibits fluid characteristics that allow it to fill a desired space, assume a specific shape, or otherwise be formed for desired purposes. Because a plasma is an ionized gas, it is electrically conductive, meaning that electrical currents can flow therethrough, and the plasma can be controlled and managed to a certain extent through the application of magnetic and electric fields. Because a plasma is ionized, the ionized atoms and atomic particles therein may be chemically active or energetic, and can thereby also be used to trigger or promote a desired chemical reaction or physical process, e.g., the removal of material, as is done in plasma etching.

Most known applications for using plasma are significantly enhanced if the density of the plasma can be increased and maintained. Disadvantageously, most known techniques for making and maintaining a plasma do not result in a high density plasma. Hence, there is a need in the art for high density plasma production techniques.

There are several ways in which a plasma can be made. One of the most effective ways to make a plasma is to inject microwave energy into a gas. The energy associated with the microwave signal ionizes molecules and atoms in the gas, thereby forming the plasma Unfortunately, there is a limit to how dense the plasma can become As the plasma begins to form and become more dense, for example, it also becomes more conductive and starts to appear as an electrical short. Such an electrical short can reflect the microwave signal out of the plasma. Thus, the microwave energy may only be able to penetrate into the plasma a short distance before it is reflected out of the plasma. For this reason, the prior art teaches limiting the thickness of the plasma into which the microwave energy is injected. See, e.g., U.S. Pat. No. 4,507,588 (Asmussen et al.); U.S. Pat. No. 4, 585,668 (Asmussen et al.); U.S. Pat. No. 4,691,662 (Roppel et al.); and U.S. Pat. No. 4,727,293 (Asmussen et al.); wherein the plasma is confined to a very shallow disk.

Unfortunately, a shallow plasma disk is of limited utility for many plasma processing applications. There are at least two reasons for this. First, the "loss rate" of the plasma in a shallow disk may be higher than the loss rate for a "long" or "deep" plasma. (The "loss rate" of a plasma is the rate at which the plasma is lost either through the ions and electrons in the plasma recombining to form neutral molecules and atoms in the gas or through the ions and electrons hitting the walls of the containment vessel. In the formation of a plasma, an equilibrium point is thus reached where the ion production rate equals the ion loss rate. The loss rate may depend on such factors as the surface to volume ratio.) Second, a shallow plasma disk does not generally provide a sufficient volume of plasma for efficient use in downstream processing applications. Downstream processing applications preferably position the microwave plasma formation apart from the location where the plasma is used. See, e.g., Plasma Processing of Materials, p. 31 National Research Council, (National Academy Press, Washington, D.C., 1991). It would thus be desirable for the plasma volume positioned upstream from the location where the plasma is used to be a relatively large volume, such as a "long" or "deep" plasma cylinder, or equivalent large volume, rather than a relatively small volume, such as a shallow plasma disk. What is needed, therefore, is a technique that allows a microwave signal to be injected into a plasma volume without having the microwave signal reflected back out of the plasma due to the plasma's conductivity, thereby allowing a "deeper" or "longer" plasma volume, and thus a potentially larger plasma volume, to be formed and maintained at a location upstream from the location where the plasma is to be used.

In order to prevent the plasma from shorting out, it is known in the art to immerse the plasma in a strong magnetic field. The strong magnetic field, in general, makes it more difficult for the charged particles within the plasma to cross the magnetic field lines, and thus prevents the charged particles from shorting out. Hence, by orienting the microwave electric field used to create the plasma so that it is perpendicular to the magnetic field in which the plasma is immersed, it is possible to prevent the shorting of the plasma, and thereby improve the density limit of the plasma. U.S. Pat. No. 4,101,411 (Suzuki et al.); U.S. Pat. No. 4,401,054 (Matsuo et al.); U.S. Pat. No. 4,810,935 (Boswell); and U.S. Pat. No. 4,876,983 (Fukuda et al.) are all examples of prior art apparatus and devices that utilize microwaves and a magnetic field for various plasma processing operations.

However, even when a magnetic field is used to prevent the plasma from shorting, the injected microwave signal is still subject to damping, and such damping imposes a further density limit on the plasma. What is needed, therefore, is a technique for injecting microwaves into a plasma while increasing the density limit imposed by the damping of the microwave signal.

Two sources of damping have been identified in the prior art. The first is collisional damping, caused by collisions between electrons associated with the injected microwave energy and the ions and neutral gas molecules present in the plasma. The more dense the ions or molecules in the plasma, the more collisions that occur, and the more difficult it is for the wave to penetrate further into the plasma. Collisional damping is believed to be the factor that has heretofore limited the available plasma density in the prior art devices. See, e.g., U.S. Pat. No. 4,990,229 (Campbell et al.), where the use of an excitation frequency of 13.56 MHz for the microwave energy creates a collision frequency on the order of 2.5.times.10.sup.8 sec.sup.-1. Such a collision frequency corresponds to a plasma density of about 10.sup.19 m.sup.-3 (10.sup.13 cm.sup.-3). It would be desirable if a plasma density greater than 10.sup.13 cm.sup.-3 could be achieved.

The second source of damping is collisionless damping, also known as Landau damping. Landau damping results when the particles in the plasma have a velocity nearly equal to the phase velocity of the microwave signal injected into the plasma. The theory is that because the particles in the plasma travel with the microwave signal, they do not see a rapidly fluctuating electric field, and hence can effectively exchange energy with the microwave signal. Further, although there are electrons in the plasma that travel faster and slower than the microwave signal, the distribution of electrons is such that there are more slow electrons than fast electrons. Hence, there are more particles taking energy from the microwave signal than adding to it, and the microwave signal becomes quickly damped. Landau damping is best controlled by assuring that the phase velocity of the injected microwave signal is sufficiently larger than the thermal velocity of the particles in the plasma.

It is known in the art to use a so called "whistler wave", also known as a helicon wave, in a plasma producing apparatus. See, e.g., U.S. Pat. No. 4,990,229 (Campbell, et al.). A whistler wave propagates along the magnetic field lines. Its frequency should be much less than the electron cyclotron frequency, .omega..sub.ce. (The electron cyclotron frequency, .omega..sub.ce, is equal to eB/mc where e and m are the electron charge and mass, respectively; B is the magnetic field strength; and c is the speed of light.) In order to excite the desired whistler wave in the plasma, Campbell, et al. show particular types of antenna configurations used to surround the plasma chamber of a given plasma processing device. These antenna configurations are determined by the frequency of the rf excitation that is used, which Campbell, et al. teach, must be a low frequency, e.g. 13.56 MHz. Collisional damping thus remains the limiting factor for configurations such as those shown in Campbell et al. Hence, what is needed is a means of exciting plasma, e.g., by using whistler mode microwave signals, in a way that increases the density limit caused by collisional damping.

The present invention advantageously addresses the above and other needs.

SUMMARY OF THE INVENTION

In accordance with one aspect of the present invention, there is provided apparatus that creates a high density plasma in a long cylindrical cavity. As used herein, the term "high density plasma" refers to a plasma having a density in excess of about 10.sup.12 cm.sup.-3. The cylindrical cavity, and hence the plasma, is imbedded in a high magnetic field, with magnetic lines of force passing axially (longitudinally) through the cavity. In one embodiment, electromagnetic radiation is coupled axially into the cylindrical cavity using a resonant cavity in order to excite a whistler wave in the cylindrical cavity, and hence in the plasma. In another embodiment, electromagnetic radiation is coupled radially into the cylindrical cavity using a slow wave structure in order to excite the whistler wave in the plasma. In either embodiment, the plasma is advantageously created without using electrodes; and the excitation of the whistler wave is achieved at a high Q value, thereby allowing radio frequency (rf) power to be transmitted into the plasma at a good efficiency. For purposes of the present application, the definition of "Q" is that 1/Q is proportional to the fraction of energy lost per cycle of oscillation. Thus, if Q is large, a larger amount of energy may be stored in the resonant cavity. By "high Q" value, it is meant that the Q of the resonant circuit or cavity in the absence of a plasma must be high enough so that the dominant power loss will be to the plasma.

In accordance with another aspect of the invention, various geometries are provided for coupling energy between the resonant cavity and the plasma. Such varied geometries advantageously allow the invention to be used for numerous applications, for example, plasma processing applications, such as plasma etching, stripping or deposition; high power laser excitation applications; ion source applications; or sputtering gun applications.

For plasma processing applications, such as plasma etching, stripping or deposition, the invention provides the requisite coupling between a resonant cavity and a plasma column. A strong magnetic field is axially applied to the plasma column. The magnetic field has an electron cyclotron frequency .omega..sub.ce associated therewith (.omega..sub.ce =eB/mc, as previously described). A whistler wave having a sufficiently high frequency, .omega., e.g., .omega./2.pi.=2.45 GHz, is excited in the plasma column. Advantageously, the use of the whistler wave at such a high frequency increases the limiting collision frequency, thereby increasing the achievable plasma density. However, the use of higher frequencies and densities requires a totally different excitation geometry from that used in the prior art. The present invention advantageously provides such different excitation geometries. In a preferred geometry, for example, axial coupling is provided between a resonant cavity and the plasma column, with the resonant cavity being positioned at one end of the plasma column. In an alternative geometry, multiple loop structures are placed within the plasma chamber in order to radially excite the desired whistler wave in the plasma. Advantageously, such geometries yield plasma densities well in excess of those achievable using prior art devices. Further, the use of the resonant cavity allows for a high Q-value, thereby providing for the efficient coupling of rf energy into the plasma.

For high power laser applications, an axial excitation is inconvenient because it interferes with the optical system, which optical system typically utilizes two facing mirrors between which the lasing medium resonates. Hence, the present invention provides that the whistler wave is excited with a radial excitation geometry that comprises a microwave cavity with periodically slotted gaps that surround a cylindrical plasma chamber. The spacing of the gaps is determined by the wavelength of the excited mode.

For high density ion source applications, accelerating grids are placed at the end of the plasma column in either a radially or axially excited system to create a high density ion beam.

For sputtering gun applications, a sputtering target is placed in front of the grids of a high density ion source. The ion beam may then be directed towards the target, thereby creating a high density sputtering apparatus.

It should thus be apparent that it is a feature of the invention to provide apparatus and methods for producing dense plasma usable in a wide variety of applications, such as plasma processing, e.g., plasma etching, stripping or deposition; lasers; ion sources; or sputtering guns.

It is a further feature of the invention to provide configurations or geometries wherein microwave or other rf energy can be transmitted to penetrate into a gas confined within a suitable "long" cavity while allowing a high density plasma to be formed within the cavity. In particular, it is a feature of the invention to provide such apparatus and geometries wherein high frequency microwave energy, e.g., greater than 1 Ghz, may be coupled into the plasma so as to excite a whistler wave therein, which high frequency whistler wave advantageously allows for a much higher plasma density.

It is an additional feature of the invention to provide a technique for axially or radially exciting high frequency whistler waves in a cylindrical plasma imbedded in a high magnetic field.

It is yet a further feature of the invention to provide a means for exciting plasma without using electrodes.

It is still an additional feature of the invention to provide a means of exciting a whistler wave in a cylindrical plasma through the use of a resonant cavity.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other aspects, features and advantages of the present invention will be more apparent from the following more particular description thereof, presented in conjunction with the following drawings and Appendix wherein:

FIG. 1 illustrates the interface between a microwave cavity and a plasma, and schematically depicts how an input wave excites both slow and fast waves in the plasma, as well as reflects from the plasma interface;

FIG. 2A shows a preferred configuration for axially coupling rf energy into a plasma chamber so as to excite a whistler wave therein;

FIG. 2B similarly shows a preferred configuration for radially coupling rf energy into a plasma chamber so as to excite a whistler wave therein;

FIG. 3 diagrammatically illustrates a plasma processing device made in accordance with the present invention utilizing the axial coupling shown in FIG. 2A;

FIG. 4A shows a perpendicular cross section of a TE.sub.01 slow wave structure that may be used to radially excite a whistler mode in a plasma processing device in accordance with the present invention;

FIG. 4B shows a longitudinal cross section of the structure of FIG. 4A;

FIG. 4C depicts a cross sectional profile of the axial magnetic field component associated with the structure of FIG. 4A;

FIG. 5A shows a perpendicular cross section of a TE.sub.11 slow wave structure that may be used to radially excite a whistler mode in a plasma processing device in accordance with the present invention;

FIG. 5B shows a longitudinal cross section of the structure of FIG. 5A; and

FIG. 6 diagrammatically illustrates a slotted resonant cavity used to radially excite a whistler wave in a high power gas laser.

Appendix A provides a mathematical analysis of the use of a whistler wave to produce a high density plasma.

Corresponding reference characters indicate corresponding components throughout the several views of the drawings.

DETAILED DESCRIPTION OF THE INVENTION

The following description is of the best mode presently contemplated for carrying out the invention. This description is not to be taken in a limiting sense, but is made merely for the purpose of describing the general principles of the invention. The scope of the invention should be determined with reference to the claims.

As indicated above, the present invention relates to the production of a high density plasma by axially or radially exciting whistler waves (one form of rf energy) in a cylindrical plasma imbedded in a high magnetic field. The strength of the magnetic field is sufficiently high so that the electron cyclotron frequency is several times greater than the wave frequency. In general, two conditions must be met in order to produce a high density plasma. First, a wave of rf energy must be transmitted so as to propagate into the plasma, thereby causing the requisite discharge to occur that creates and maintains the plasma. Second, once transmitted, the wave must not damp too quickly. A whistler wave advantageously does not have a high density cutoff associated therewith. Hence, such wave can easily penetrate into the plasma to sustain the requisite discharge, thereby fulfilling the first condition. The second condition means that the rf frequency must be higher than the electron collision frequency with the plasma ions and the neutral gas molecules, and the wave must not experience excessive collisionless damping Hence, the second condition may be satisfied largely through the proper selection of the rf frequency for the particular application at hand.

As will be evident from the description that follows, the present invention provides specific geometries that may be used to excite rf energy in the form of a whistler wave in a deep or long plasma cavity, thereby promoting the formation and maintenance of high density plasma within such cavity. Both the geometry of the launcher and the geometry of the plasma cavity are important. Such geometries will vary somewhat depending upon the particular application for which the plasma is being used.

Before describing some of the preferred geometries associated with the invention, it will be helpful to first present a brief overview of some basic concepts applicable to the coupling of rf energy into a plasma chamber. The description presented below in connection with FIGS. 1, 2A and 2B is intended to provide such a brief overview. A mathematical analysis of such coupling principles may be found in Appendix A, attached hereto and incorporated herein by reference. A good overview of the role plasma processing now plays, and will play in the years to come, may be found in Plasma Processing of Materials, Scientific Opportunities and Technological Challenges, National Research Council (National Academy Press, Washington, D.C. 1991).

Referring first to FIG. 1, a plasma chamber 20 is shown adjacent a microwave cavity 22. An interface 24 separates the microwave cavity 22 from the plasma chamber 20. The interface 24 is located (assuming an appropriate coordinate system having a z-direction that is horizontal for the orientation shown in FIG. 1) at z=0. In general, the plasma chamber 20 is cylindrically shaped, having a longitudinal axis 26 passing through the center thereof in the z-direction, thereby allowing the formation of a "deep" or "long" plasma (as compared to a shallow or thin disk-shaped plasma, as described in the prior art). A deep or long plasma is important because it provides a larger plasma mass having a lower loss rate, thereby giving rise to a higher density plasma. In addition, a deep or long plasma better provides for the possibility of downstream plasma processing. Note that as shown in FIG. 1, the microwave cavity 22 is aligned with the longitudinal axis 26 of the plasma chamber.

In order to couple rf energy into the plasma chamber, an input wave W.sub.i is excited in the microwave cavity 22, or equivalent rf energy source, so as to propagate in the z-direction towards the plasma chamber 20. The presence of a strong magnetic field B.sub.0, having lines of force that are substantially parallel to the longitudinal axis 26, helps guide the input wave W.sub.i in the desired direction, and further helps confine the plasma within the plasma chamber 20. As explained more fully in Appendix A, if a high density plasma is to be produced, it is important that the electron cyclotron frequency (associated with the magnetic field B.sub.0) be much larger than the wave frequency (associated with the whistler wave), and that the wave frequency, in turn, be larger than the collision frequency (associated with the creation and maintenance of the plasma).

The input wave W.sub.i, upon encountering the interface 24, excites a slow wave W.sub.s and a fast wave W.sub.f in the plasma. The fast wave is cut off at high density. The slow wave continues to propagate in the z-direction. A portion of the wave W.sub.i is also reflected from the interface as a wave W.sub.re. The present invention describes various geometries suitable for directing the input wave W.sub.i into the plasma chamber 20 so that the desired slow wave W.sub.s, or whistler wave, is launched in the plasma chamber. The energy associated with the slow wave, or whistler wave, is then efficiently transferred to the gas in the plasma chamber 20 in order to ionize the gas, thereby forming the desired plasma. The plasma thus formed is then available for use for a desired application.

A preferred approach for launching or coupling rf energy into the plasma chamber in order to excite the desired whistler wave is illustrated in FIGS. 2A and 2B. In FIG. 2A, such launching involves axially coupling the microwave energy into the plasma chamber in order to excite the desired whistler wave. In FIG. 2B, such launching involves radially coupling the microwave energy into the plasma chamber in order to excite the desired whistler wave.

Referring to FIG. 2A, a resonant cavity 30 is positioned at one end of the plasma chamber 20. Appropriate input power is directed into the resonant cavity 30 so as to excite a resonant condition, which resonant condition is manifest by the presence of a resonant signal. A resonant condition advantageously assures that reflected energy is not wasted, but rather goes back into the resonance for later use. This is especially true when a high Q resonance exists. The resonant signal may comprise an appropriate microwave signal, e.g., of the TE.sub.01 or TE.sub.11 modes, which when it enters the plasma chamber 20 launches the desired whistler wave in the plasma. The resonance of the cavity operates at a high Q value, thereby allowing a portion 32 of the energy associated with the resonant signal to be efficiently coupled into the plasma chamber 20. As further seen in FIG. 2A, a suitable magnetic field generating means 28, which may comprise a coil wound around the plasma chamber 20, generates the requisite magnetic field B.sub.0 needed to help sustain the production of the high density plasma.

Similarly, referring to FIG. 2B, an annular resonant structure 31 is positioned around the periphery of the plasma chamber 20. Appropriate input power is directed into the resonant structure 31 so as to excite a high Q resonant condition, which resonant condition is manifest by the presence of a resonant signal. Such resonant signal may comprise an appropriate microwave signal, e.g., of the TE.sub.01 or TE.sub.11 modes, which excites the desired axially traveling whistler wave in the plasma. The magnetic and electrical fields at the boundary of the plasma chamber 20 that are created by the resonant electrical current excite the desired axially traveling whistler wave in the plasma. The resonance of the cavity operates at a high Q value, thereby allowing a portion 33 of the energy associated with the resonant signal to be efficiently coupled into the plasma chamber 20. As further seen in FIG. 2B, a suitable magnetic field generating means 29, which may comprise a coil wound around the plasma chamber 20, generates the requisite magnetic field B.sub.0 needed to help sustain the production of the high density plasma.

Turning next to FIG. 3, a diagrammatic illustration of a plasma processing device 40 made in accordance with the present invention is shown. The device 40 represents one particular geometry that may be used to axially launch a whistler wave into a plasma chamber 42. As seen in FIG. 3, the plasma chamber 42 comprises a cylindrical chamber 42 coupled to a suitable source of gas 44 through an inlet valve 46. The side walls 48 of the plasma chamber 42 may be made from any suitable material, and are preferably simply an extension of the walls of a resonant cavity 30'. A window 49, which may