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| United States Patent | 5237881 |
| Link to this page | http://www.wikipatents.com/5237881.html |
| Inventor(s) | Ross; Thaddeus C. (Santa Barbara, CA) |
| Abstract | A filter probe for sampling components of a stack gas which includes means
for extracting a flow sample of the stack gas, means for inertial
filtering of the flowing stack gas sample extracted by the extracting
means, means for collecting the flowing stack gas sample after filtering
by the filtering means, means for conditioning the filtered and collected
stack gas sample based on predetermined criteria such as cooling and
drying, and means for flowing the filtered and collected stack gas sample
from the collecting means to the extracting means so that a constant flow
of the filtered stack gas sample is presented to the conditioning means to
permit essentially instantaneous analysis of the stack gas sample. |
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Title Information  |
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Drawing from US Patent 5237881 |
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Inertial dilution filter probe |
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| Publication Date |
August 24, 1993 |
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| Filing Date |
February 21, 1992 |
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Title Information  |
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Market Review  |
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Technical Review  |
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Claims  |
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Having thus set forth the nature of the invention, what is claimed is:
1. A filter probe for sampling components of a stack gas comprising:
means for extracting a flowing sample of said stack gas, said extracting
means having a flow input and a flow output, said flowing sample flowing
from said flow input to said flow output;
means for filtering said flowing stack gas sample extracted by said
extracting means, said filtering means being in communication with said
flowing sample in said extracting means;
means for collecting said flowing stack gas sample after filtering by said
filtering means, said collecting means being in communication with said
flowing stack gas sample after filtering by said filtering means;
means for conditioning said filtered and said collected stack gas sample
based on predetermined criteria, said conditioning means being in
communication with said collecting means; and
bypass means for flowing a portion of the filtered and collected stack gas
sample from said collecting means to said flow output of said extracting
means bypassing said conditioning means so as to permit a constant flow of
said filtered stack gas sample to said conditioning means, said bypass
means being in communication with said collecting means and said flow
output of said extracting means.
2. A filter probe in accordance with claim 1, wherein said extracting means
comprises a probe element disposed in a stack through which a stack gas
flows, said probe element serving as the flow input of said extracting
means.
3. A filter probe in accordance with claim 2, wherein said extracting means
further comprises eductor means, said eductor means being disposed
proximate to and in communication with the flow output of said extracting
means, said eductor means for regulating the flow of said stack gas
through said extracting means.
4. A filter probe in accordance with claim 1, wherein said extracting means
further comprises eductor means, said eductor means being disposed
proximate to the flow output of said extracting means, said eductor means
for regulating the flow of said stack gas through said extracting means.
5. A filter probe in accordance with claim 2, wherein said filtering means
has disposed therethrough a chamber for accommodating the flow
therethrough of the flowing sample of stack gas.
6. A filter probe in accordance with claim 1, wherein said filtering means
has disposed therethrough a chamber for accommodating the flow
therethrough of the flowing sample of stack gas.
7. A filter probe in accordance with claim 5, wherein said filtering means
comprises a filter medium, said chamber being elongated and having two
ends, said chamber being disposed in said filter medium, one end of said
chamber being in communication with said probe element.
8. A filter probe in accordance with claim 7, wherein said filter medium is
cylindrical, said chamber being disposed longitudinally therein.
9. A filter probe in accordance with claim 3, wherein said eductor means
comprises an air driven eductor, said air driven eductor for providing
suction.
10. A filter probe in accordance with claim 3, wherein said filtering means
comprises a chamber for accommodating the flow therethrough of the flowing
sample of stack gas, said chamber being in communication on one end
thereof with said probe element and on the other end thereof with said
eductor means.
11. A filter probe in accordance with claim 10, wherein said filter means
comprises a filter medium, said chamber being elongated and having two
ends, said chamber being disposed in said filter medium, one end of said
chamber being in communication with said probe element, the other end of
said chamber being in communication with said eductor means.
12. A filter probe in accordance with claim 11, wherein said filter medium
is cylindrical, said chamber being disposed longitudinally therein.
13. A filter probe in accordance with claim 6, wherein said filter means
comprises a filter medium, said chamber being elongated and having two
ends, said chamber being disposed in said filter medium, the flow of the
flowing sample of stack gas being from one end of the chamber to the other
end of the chamber.
14. A filter probe in accordance with claim 13, wherein said collecting
means comprises an envelope enclosing said filter medium, said envelope
for collecting the flowing stack gas sample after the flowing stack gas
sample is filtered by said filter medium.
15. A filter probe in accordance with claim 14, wherein said filter medium
is cylindrical and said envelope is cylindrical, said envelope being
coaxially disposed about said filter medium, a collection chamber being
formed by the space between said filter medium and said envelope.
16. A filter probe in accordance with claim 14, wherein said envelope is
heated.
17. A filter probe in accordance with claim 1, wherein said collecting
means is heated.
18. A filter probe in accordance with claim 14, further comprising means
for providing a calibration gas to said envelope.
19. A filter probe in accordance with claim 1, wherein said conditioning
means comprises a first secondary filter in communication on one side
thereof with said collecting means, a second secondary filter in
communication on one side thereof with a clean source of air, a first
critical flow orifice in communication on one side thereof with the other
side of said first secondary filter, a second critical flow orifice in
communication on one side thereof with the other side of said second
secondary filter, said conditioning means further comprising a suction
pump having an input and an output, the input of said suction pump being
in communication with the other sides of said first and second critical
flow orifices, the output of said suction pump being adapted to be in
communication with predetermined analysis means.
20. A filter probe in accordance with claim 19, further comprising a
housing, said first and second secondary filters and said first and second
critical flow orifices being disposed therein.
21. A filter probe in accordance with claim 20, further comprising means
for maintaining said housing at a preselected temperature.
22. A filter probe in accordance with claim 1, wherein said bypass means
comprises a valve in communication on one side thereof with said
collecting means, the other side of said valve being in communication with
said flow output of said extracting means.
23. A filter probe in accordance with claim 9, wherein said bypass means
comprises a valve in communication on one side thereof with said
collecting means, the other side of said valve being in communication with
said flow output of said extracting means.
24. A filter probe in accordance with claim 8, wherein said flowing means
comprises a valve in communication on one side thereof with said
collecting means, the other side of said valve being in communication with
said flow output of said extracting means. |
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Claims  |
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Description  |
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BACKGROUND AND/OR ENVIRONMENT OF THE INVENTION
1. Field of the Invention
The present invention relates to apparatuses for analyzing a stack gas
produced by combustion, and more particularly to a filter probe for
sampling components of a stack gas which employs a non-clogging flow
through inertial filter and means for conditioning the stack gas sample to
optimize the analyzation thereof.
2. Description of the Contemporary and/or Prior Art
The desire to analyze stack gases produced by combustion processes is well
known in the art. Typically, a sample extracted from the combustion
process is drawn off by a sampling probe which is installed in a stack.
The output of the probe then connects to sample line leading to remotely
located analyzers. Depending upon how the probe is designed and how
analysis takes place, the gases may need to be filtered, cooled, and dried
in sample conditioning stages before being presented to the analyzers. Two
of the currently employed major probe design styles differ as to whether
the sample is sent down the line in an as is condition, that is hot, wet
and at a full concentration or whether the sample is diluted with a
neutral carrier gas, usually clean instrument air. Further, extraction
probes usually include some kind of filtering medium so as to avoid
loading the sample line with dust. One such probe includes a "inertial"
bypass filter element which consists of a ceramic or metallic porous wall
tube through which the gas extracted from the stack is drawn at a high
speed. This element is attached to the outlet end of the probe which in
itself is just a piece of straight pipe and is followed by an air driven
eductor or jet pump to provide the suction for moving the gases through
the probe and inertial filter, without the danger of clogging the straight
inline bore of this device. A small portion of the total gas flow through
the filter element permeates through the filter walls and is collected in
a surrounding jacket from which it is drawn by a sample line to subsequent
stages for analysis.
Particles entrained in the high velocity axial gas flow are precluded from
deposition on the porous filter walls or from penetrating therethrough by
the ballistic effect of particle inertia, hence the name "inertial" bypass
filter. The low radially velocity of such devices also inhibits particles
from penetrating the porous wall. Such devices are manufactured by Mott
Metallurgical Corporation, Farmington Industrial Park, Farmington, Conn.
and are disclosed in their brochure entitled Inertial Gas Sampling Filter
Systems DB 4600.
A disadvantage of currently known diluting stack samplers is that an
average of the analyzed components is presented rather than an
instantaneous reading.
Another type of extraction probe employs a filter in the tip of the probe
followed down stream by a dilution mixer made up of a critical flow
orifice and eductor. The critical flow orifice limits the stack gas flow
and is sized in conjunction with the air driven eductor in such a manner
that the flow ratio between the orifice flow and the eductor air set up a
defined dilution ratio.
This ratio is usually picked in the range of between 15 to 1 and 300 to 1
depending on the type of analyzer served. As a result, the hot stack gas
is immediately diluted and therefore the sample has a reduction in
temperature and moisture content which eliminates the need for additional
sample conditioning before the gas is fed to the analyzers. An unfortunate
disadvantage of this configuration is that the tip filter in the probe
frequently clogs leading to frequent probe maintenance and the instability
of the dilution ratio that depends on the uncertain relationship between
the critical orifice and the eductor flows as a function of variations in
the absolute stack pressure. Such a diluting stack sampler for monitoring
gaseous emissions is manufactured by Environmental & Process Monitoring of
Prospect, Illinois and is described in the Manual for Model 797 Diluting
Stack Sampler.
SUMMARY OF THE INVENTION
Therefore, the primary object of the subject invention is to provide a
filter probe for sampling components of a stack gas which dilutes the
stack gas for optimal analysis.
A further object of the present invention is to provide a filter probe for
sampling components of a stack gas wherein the filter material thereof
does not clog as a result of exposure to the stack gas.
A still further object of the subject invention is to provide filter probe
for sampling components of a stack gas which is essentially maintenance
free, although exposed to wet and dirty stack sample.
Still another object of the present invention is provide a filter probe for
sampling components of a stack gas which is rugged and trouble free.
Still another further object of the subject invention is to provide a
filter probe for sampling components of a stack gas which permits
instantaneous or real-time measurements to be made.
These objects as well as further objects and advantages of the present
invention, will become readily apparent after reading the ensuing
description of a non-limiting illustrative embodiment and viewing the
accompanying drawings.
A filter probe for sampling components of a stack gas, according to the
principles of the present invention, includes means for extracting a
flowing sample of stack gas, extracting means having a flow input and a
flow output; means for filtering the flowing stack gas sample extracted by
the extracting means; means for collecting the flowing stack gas sample
after filtering by the filtering means; means for conditioning the
filtered and collected stack gas sample based on predetermined criteria,
the conditioning means being in communication with the collecting means;
and means for flowing the filtered and collected stack gas sample from the
collecting means to the flow output of the extracting means so as to
create a constant flow of the filtered stack gas sample to the
conditioning means.
BRIEF DESCRIPTION OF THE DRAWINGS
In order that the present invention may be more fully understood, it will
now be described, by way of example, with reference to the accompanying
drawings in which:
FIG. 1 is a partially broken away perspective view of a filter probe
incorporating the principles of the present invention;
FIG. 2 is a cross sectional view taken substantially through the lines of
2--2 of FIG. 1; and
FIG. 3 is a pictorial representation of the preferred embodiment of the
present invention.
DESCRIPTION OF THE PREFERRED EMBODIMENT
Referring now to the figures and more particularly to FIGS. 1, 2 and 3
thereof, there is illustrated therein a filter probe 10 which incorporates
the principles of the present invention. The filter probe 10 includes a
housing 12, illustrated as partially broken away in FIG. 1, such housing
serving to contain an inertial filter 14, a sample dilution block 16, an
exhaust eductor 18 and various other components of the subject invention
as will be hereinafter described. A supply interface 20 permits passage
through the housing 12 by a compressed air line 22, a diluted sample line
24, a clean air line 26, and a filter pressure sensing/calibrator input
line 28.
Lines 22, 24, 26 and 28 are bundled together and are protected by a
sheathing 30. Compressed air line 22 is coupled by fitting 32 to the
exhaust eductor 18 as shown only in FIG. 1. Diluted sample line 24 is
coupled to the dilution block 16 by a fitting 34 and provides an output
for the sample dilution block 16. Clean air line 26 is coupled by a
fitting 36 to the sample dilution block 16 and pressure sensor/gas input
line 28 is coupled by a fitting 38 to the inertial filter 14.
The inertial filter 14 includes an outer cylinder 40 and has disposed
therein a filter 42 having a longitudinal bore 44. The filter 42 is sized
so that a collection chamber 46 is formed between the filter 42 and the
outer cylinder 40. Also disposed in the outer cylinder 40 is a heating
unit 48 (shown only in FIG. 3) of a conventional thermostatically
controlled design. The heating element 48 serves to heat the chamber 46
and therefore the filter 42. Similarly, the sheathing 30 is also
preferably heated.
The longitudinal bore 44 of the filter 42 is in communication on the end 50
thereof with a probe 52 having a mounting flange 54. The probe 52 is
coupled to the filter 42 by a fitting 56. The flange 54 is for mounting on
the wall of a stack S, with the section 58 of the probe 52 extending into
the stack gas.
The other end 60 of the filter 42 is coupled by a fitting 62 to the exhaust
eductor 18. Axially mounted in the fitting 62 is a fitting 64 that couples
bypass tube 66 on one end thereof to the bore of filter 42, the bypass
tube 66 being in communication on the other end thereof with the chamber
46 of the inertial filter 14 as coupled through a coupling 68. The
coupling 68 also is in communication with the sample dilution block 16.
Sample dilution block 16 includes a filter 70 disposed adjacent to the
coupling 68 and a filter 72 disposed adjacent to the fitting 36. Formed
within the sample dilution block is a dilution chamber 74 which is in
communication with the coupling 68 through the filter 70 and with the
clean air line 26 through the coupling 36 and filter 72. Also in
communication with the dilution chamber 74 is the diluted sample line 24.
The eductor 18 is provided with a eductor exhaust 76. The filter 42 can be
constructed of a porous ceramic or porous metallic material as is well
known in the art.
Although the operation of the subject invention is performed by the
apparatus shown in FIGS. 1 and 2, the operation thereof can best be
understood by viewing the pictorial representation of the subject
invention shown in FIG. 3. Therefore, with reference to FIGS. 1, 2 and
particularly FIG. 3, the probe 52 has the mounting flange 54 thereof
mounted to a stack S such that the section 58 is exposed to a sample of
stack gas G. The probe 52 has longitudinal bore 78 thereof in
communication with the input of the inertial filter 14 through coupling
56. Disposed within the inertial filter 14 is the filter 42 having a
longitudinal bore 44 in communication with the longitudinal bore 78 of the
probe 52 on an end 50 thereof. The other end 60 of the filter 42 is in
communication with the fitting 62 and the central bore of the exhaust
eductor 18.
The exhaust eductor 18 is fed compressed air through compressed air line
22. As a result of the introduction of compressed air into the eductor
through the port 80 thereof, a suction effect is created and gas G is
extracted from the stack sand is drawn through the probe 52 and the filter
42 out through the eductor 18 and through the exhaust 82 thereof.
The compressed air at air line 22 is regulated so that the stack gas is
drawn through the filter element at a high speed such that particles
moving at high speed along the axis of the tubular filter 42 have too much
inertia to stick to the filter walls, while gaseous constituents permeate
through the porous filter body at right angles to the direction of flow.
Of course, this is expedited by the heating of the ceramic filter element
42 by the heater 48.
The constituents which permeate the filter 42 are temporarily collected in
the collection chamber 46 of the inertial filter 14. The chamber 46 is in
communication with the dilution block 16 through the coupling 68. The
material collected in the chamber 46 is drawn into the dilution chamber 74
of the dilution block 16 through filter 70 and a critical flow orifice 84.
Simultaneously, air from a clean source is supplied through clean air line
26 and through filter 72 to a second critical flow office 86 and
ultimately is supplied so it mixes within dilution chamber 74 with the gas
constituent entering through critical orifice 84.
In the preferred embodiment of the present invention the filters 70 and 72
are constructed of porous metal frit which permits passage of materials up
to 2 microns and the critical flow orifice has a diameter of 4 mils. This
sets up a ratio with a range of 15 to 1 and 300 to 1 which can be selected
by varying the size of the critical flow orifices used in conjunction with
selected analyzers. The gas constituent which is diluted by the air in
dilution chamber 74 is drawn therefrom by a sample pump 88, shown in FIG.
3, the output 90 thereof which is fed to suitable analyzing instruments,
well known in the art.
Crucial to the subject invention is the bypass tube or loop 66 which is in
communication on one end thereof through fitting 68 with the gaseous
constituent input of the sample dilution block 16 and on the other end
thereof through fitting 64 to the output of the longitudinal bore of the
filter 44. A bypass flow restrictor 92 of the valve type may be disposed
in the bypass line 66 as shown in FIG. 3. The effect of the bypass tube 66
is to create a bypass loop so that there is a continuous flow of gas
constituent from the chamber 46 past the filter 70 of the sample dilution
block 16. As a result, rather than the sample block 16 providing a reading
which is the average of collected constituent, what essentially is
provided is an instantaneous or real time measurement of the flow of the
gas from the stack S into the probe 52.
Also shown in FIG. 3 is a filter pressure sensing and gas inlet line 28
connected to a selection valve 94. Selection valve 94 can alternatively
couple pressure sensor 96 or calibration gas line 98 to which calibration
gas is supplied to the chamber 46 of the inertial filter 14. This permits
adjustment of the pressure within the chamber 46 with a correction factor
so any pressure related errors in the dilution ratio can be corrected.
It therefore should be clear that the present invention provides a filter
probe for sampling components of a stack gas which, through use of an
inertial bypass filter, provides a filter surface that is without danger
of clogging because of gas moving at a high speed in an inline flow
through a heated ceramic or metallic filter element. As such, particles
moving at a high speed along the axis of the tubular filter have too much
inertia to stick to the filter walls. Nonetheless, gaseous constituents
permeate through the porous filter body and then these hot gas samples are
drawn off into a dilution mixer where the hot moisture laden sample is
diluted with clean air in a ratio predetermined by the parameters of the
mixer such as the critical flow orifices and the design of the sample pump
88 to obtain a sample which is lower in temperature and lower in relative
humidity than the stack gases directly extracted by the probe. This
conditioned sample is therefore directly usable in gas analyzers without
concern over condensation.
As a result of such configuration, a very rugged and trouble free sample
conditioning system is provided that permits wet basis of sample analysis
when this mode of measurement is preferred by the user. Further,
incorporated into the configuration is dilution ratio stability with
temperature and stack pressure. Control of dilution mixer temperature with
thermostatically operated heater elements well known in the art eliminates
the effects of temperature on the ratio of flow through the two critical
flow orifices and the availability of a tube connection to the space
around the inertial filter affords the ability to sense the pressure at
that point and to apply correction factors to any pressure related errors
of the dilution ratio to the computer which controls the data read from
the analyzers. Of course, the analyzers are well known in the art and will
not be herein discussed.
It will be understood that various changes in the details, materials,
arrangements of parts and operational conditions which have been herein
described and illustrated in order to explain the nature of the invention
may be made by those skilled in the art within the principles and scope of
the invention.
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Description  |
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