A three-dimensional measuring apparatus including a multi-slit projector has an actuator for displacing at least one of first and second diffraction gratings by only a minute distance in a direction perpendicular to the slit lights. An image recognizing apparatus includes an image arithmetic unit for changing, each time a coded multi-slit light pattern is changed, weights assigned to the binarized image signals, and for summing up the last weighted binarized image signals or the image signals of the last added results read out from an image memory with newly weighted binarized image signals. This improves the image resolution reduces the memory capacity and increases the processing speed.
A method and an apparatus capable of accurately measuring the three-dimensional position and orientation of an object in a short data processing time are provided, wherein a first slit light is projected from a first light projector for scanning an object, and each light image is obtained by a CCD camera. Similarly, a second slit light is projected from a second light projector for scanning the object and each light image is obtained by the CCD camera. The first and second slit lights are perpendicular to each other. The individual images obtained are processed to find a bent point and a disconnection point in each slit-light scan image. From among these points, a group of points which are reckoned to be lying on the same straight line is extracted, and the obtained straight line of points is used as edge information of the object. Based on the edge information and shape data of the object, three-dimensional position/orientation data is obtained. Any edge of the object can surely be detected with at least one of the slit lights, regardless of its direction, and thus, even if the scanning intervals of the slit lights are rough, edges of the object can surely be detected in a shorter measuring time is shortened.
A process is disclosed for determining surface information by a projected structure with periodically changing brightness curve which is shifted by 1/n, n=whole number greater than two, of the grating constant, and the projection image is acquired of a CCD camera, and information is determined for every image point, which information represents the brightfield intensity multiplied by the respective grating phase, the sine components and cosine components are extracted from these images and gives: I. I.sub.xy =I.sub.obxy *m*sin x II. I.sub.xy =I.sub.obxy *m*cos x, where ##EQU1## and the modulation factor m is calculated from I. and II. and is used for representation, An arrangement is also disclosed for changing the projection direction of a grating which is projected on a surface via at least one wedge-shaped prism body which is rotatable about the optical axis and a parallel plate which is tiltable relative to the optical axis, wherein the control of the tilting movement of the parallel plate is coupled with the rotational movement of the prism body in such a way that a change in the orientation of the prism body is carried out after at least three tilting steps.
A three-dimensional shape measuring method and a three-dimensional shape measuring apparatus of excellent measurement accuracy. An optical system comprises a light source, a pattern forming unit which is disposed on the optical axis of the light source to form slit light from the light from the light source, and a projection lens to collect the slit light on the object for measurement. An asymmetric diaphragm having an aperture in which the size in the direction perpendicular to the slit direction is smaller than the size in the slit direction is provided in order to stop the slit light. An image pickup optical system is provided to measure the three-dimensional shape of the object for measurement on the basis of the slit light reflected from the object for measurement.
Laser-based methods and systems for real-time structured light depth extraction are disclosed. A laser light source (100) produces a collimated beam of laser light. A pattern generator (102) generates structured light patterns including a plurality of pixels. The beam of laser light emanating from the laser light source (100) interacts with the patterns to project the patterns onto the object of interest (118). The patterns are reflected from the object of interest (118) and detected using a high-speed, low-resolution detector (106). A broadband light source (111) illuminates the object with broadband/light, and a separate high-resolution, low-speed detector (108) detects broadband light reflected from the object (118). A real-time structured light depth extraction engine/controller (110) based on the transmitted and reflected patterns and the reflected broadband light.
Methods, systems, and computer program products for imperceptibly embedding structured light patterns in projected color images for display on planar and non-planar surfaces are disclosed. According to one method, an image exposure period for detecting an embedded structured light patterns in a projected image is selected based on analysis of pixel polarities for different pixel intensities of a pixel color. Pixel intensities for the color are varied in the user image so that pixel polarities encode the structured light patterns during image exposure period. The user image is projected with the structured light patterns onto the surface. Depth information is continuously acquired and used to adjust display of the user image.
