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Document Number
US Patent 5390424
Issued Date
February 21, 1995
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Abstract
An analogue probe has a fixed structure and a stylus supporting member connected to the fixed structure by three serially mounted pairs of leaf springs interconnected by first and second intermediate members. The stylus supporting member supports an elongate stem upon which a cube, which supports three scales, is mounted. Readheads are mounted on the fixed structure, in register with the scales, to transduce movement of the stylus supporting member in three substantially orthogonal directions. The alignment of the scales about the yaw axis (extending in a direction perpendicular to the plane of the scale) determines the alignment of the measuring axes of the probe, while the straightness of the lines of the scales determines the straightness of the axes.
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Analogue probe - US Patent 5390424 Drawing
Drawing from US Patent 5390424
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Number of Claims:
4
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Owner
Renishaw Metrology Limited (Gloucestershire,GB)
Published
February 21, 1995
Application Number
08/034,770
Filed
March 19, 1993
US Classification
33/561   33/558 33/707
Int'l Classification
G01B   11/00   (20060101)   G01B   5/008   (20060101)   G01B   5/012   (20060101)  
Examiner
Attorney/Law Firm
Parent Case
This is a continuation-in-part of application Ser. No. 07/643,373, filed Jan. 22, 1991, now U.S. Pat. No. 5,212,873.
Priority Data
Jan 25, 1990 [GB] 9001682
USPTO Field of Search
33/559   33/561   33/556   33/558   33/707   73/865.8   356/374  
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Description
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