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Method and apparatus for optimizing control of an immobilized film photoreactor
   
Document Number
US Patent 5494643
Issued Date
February 27, 1996
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Abstract
In a photocatalysis system for degrading toxic compounds to constituent components, an improved photoreactor system optimizes reaction rates on the surface of a wide bandgap semiconductor electrode material. The semiconductor material has a first surface exposed to light having a higher energy than the bandgap and a second surface exposed to the toxic compound. An electrical conductor contacts the semiconductor electrode material in a geometry effective to produce an electric field within the semiconductor material. A controlled voltage source is connected to the electrical conductor for applying a voltage bias effective to produce the electric field. A closed circuit current sensor or an open circuit voltage sensor is connected to the electrical conductor and outputs a current or voltage signal, respectively, that is indicative of an excess electrical charge in the semiconductor material. A processor monitors the current or the voltage signal and controls the voltage source to minimize the excess electrical charge.
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Method and apparatus for optimizing control of an immobilized film photoreactor - US Patent 5494643 Drawing
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Number of Claims:
20
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Owner
University of New Mexico (Albuquerque, NM)
Published
February 27, 1996
Application Number
08/416,264
Filed
April 4, 1995
US Classification
422/186.3   422/186 422/906
Int'l Classification
B01J   19/00   (20060101)   B01J   19/08   (20060101)   B01J   19/12   (20060101)  
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Assistant Examiner
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USPTO Field of Search
422/186   422/906   422/186.3  
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