So that a staple driver does not perform a movement relative to a staple holder until the staple holder comes down on the material to be stapled, provision is made according to the invention for the staple holder and the staple driver of a stapling head to be driven by a common drive device via a cam control mechanism. The cam control mechanism has a cam plate which is made to perform a stroke movement via a drive pin on which it is rotatably mounted. The staple holder and staple driver are driven by two connecting rods which relative to the rotation axis act eccentrically on two sides on the cam plate. A stationary guide rail, against which the cam plate is supported with a guide surface during a first phase of the working stroke, prevents a rotary movement of the cam plate during the first phase of the working stroke and thereby fixes the staple driver relative to the staple holder.
The invention proposes a staple-forming apparatus which is intended for stapling machines for forming staples and may be designed to be smaller than priorart apparatuses. This is achieved according to the invention in that a locking bar (9) for locking a pusher in the forming apparatus during the operation of forming the staple is fitted in a moveable manner in the pusher and a fixed stop (13) for the locking bar (9) is provided on the housing (2) of the staple-forming apparatus.
Parametric test data is taken on a sampled set of a particular integrated circuit (IC) using both an Automatic Test Equipment (ATE) tester and a system test motherboard. The parametric test data comprises maximum operating frequency, maximum operating temperature and minimum operating power supply voltage. A maximum operating frequency is determined at a particular fixed operating temperature and power supply voltage. A maximum operating temperature is determined at a particular fixed operating frequency and power supply voltage. Finally, a minimum operating power supply voltage is determined at a particular fixed operating frequency and temperature. Multiple two parameter graphs are plotted and the slope or numerical derivative for each plot is calculated as conversion factors. During a normal production run for the particular IC performance limit data is taken on the ATE tester comprising the same three parameters of maximum operating frequency at a particular temperature and power supply voltage. The calculated conversion factors are used to scale the production parametric data from the ATE tester to new calculated expected performance limits. These new performance limits are used to sort production ICs into system performance classes for which the ICs are expected to qualify.
An improved surgical stapler which allows for the multi-directional release of staples includes a stapler body and a driver contained therein. A magazine is connected to the stapler body and includes a staple track for carrying a plurality of staples wherein each of the staples has staple legs. An anvil is associated with the staple track for providing a staple forming surface for forming a staple thereon. A feeder element which is spring biased against the staples is used for feeding each staple from the staple track to the anvil. A trigger is operatively connected to the driver and is movable from a pre-fire position to a firing position for advancing the driver against the anvil for forming the staple against the anvil. A kick-off spring is positioned beneath and substantially parallel to the staple track and the anvil. The kick-off spring has a deflectable tip which is deflected away from the anvil and engages the staple legs of the staple by downwardly camming against the staple legs when the trigger is moved from its pre-fire position to its firing position. The kick-off spring ejects the staples off of and away from the anvil by disengaging the staple legs with the deflectable tip by upwardly camming against the staple legs upon returning of the trigger from the firing position to the pre-fire position.
