An image processor based system and method for recognizing predefined-types of coating density imperfections in a web, specifically continuous type or streak imperfections. Continuous type imperfections are recognized in a continuous web moved at a certain rate through an imaging region illuminated by a stripe of substantially constant illumination. A time-delay integrating CCD camera is focused on the illuminated imaging region. The TDI CCD camera comprises an array of N rows of M light sensitive CCD elements each imaged on a fixed discrete pixel-related image area of the illuminated imaging region. The charge levels accumulated in the CCD elements of each row are shifted to the succeeding row or CCD elements and summed with the charge levels therein at a line shift clock frequency that ensures that an asynchronous relationship exists with respect to the incremental movement of the web. During the clock cycle of the N rows, the corresponding pixel areas of the illuminated web shift asynchronously or creep through the discrete pixel-related image areas. The accumulated pixel charge values derived from the pixel-related image areas of the illuminated region of said moving web emphasize imaging of longitudinal streak imperfections in the web due to the asynchronous movement the web.
REFERENCE TO PARENT APPLICATION
This application is a continuation-in-part application of commonly assigned, U.S. patent application Ser. No. 891,318 filed May 29, 1992 and entitled COATING DENSITY ANALYZER AND METHOD USING IMAGE PROCESSING, now U.S. Pat. No. 5,533,139, issued Jul. 2, 1996.
In a process for the optical inspection of at least partially transparent containers in an inspection area with an illuminating device and a camera for producing images to be evaluated, the degree of transparency of each container is determined, and a light field is configured for this specific container. The light intensity of the light field and/or the imaging sensitivity is adapted to the determined degree of transparency, and the traveling light field is shifted through the inspection area in synchrony with the container. The system for implementing the process has an LED light screen with a plurality of LEDs, which can be activated individually or in groups, and a device upstream of the inspection area for measuring the individual degree of transparency of each container. These components are connected to a control unit, which produces the traveling light field for each container and shifts it in synchrony with the container. The control unit also adapts the light intensity of the traveling light field to the degree of transparency found for the container in question.
The system comprises a high resolution camera (1) mounted above a conveyor plane (4) along which objects are displaced, thereby enabling the top face of each object to be observed. The camera (1) is fitted with an objective lens system (5) having a motor-driven focusing system that operates in association with a pickup (8) that produces a signal (S) representative of the vertical profile of the top face of each object relative to the conveyor plane. The profile signal serves to produce positioning references (C) for the focusing mechanism in order to take account of variations in the height of the top face of each object while that object is moving beneath the objective lens system of the camera. Such an image acquisition system is employed to read addresses automatically from postal packets for the purpose of performing automatic sorting.
Imaging techniques and devices for performing time-delayed integration based on active pixel sensors. An integrator array is integrated on the chip with the active pixel sensors to perform correlated double sampling and the signal summing based switching capacitor banks.
Three dimensional reconstruction of an object of interest moving at a constant velocity. The object of interest is centered. The object of interest is imaged with optical point sources located at multiple projection angles around the object of interest, in cooperation with opposing time delay and integration (TDI) image sensors located at a distance from the objects of interest such that there is no focal plane within the objects of interest during imaging. Each of the TDI sensors has a line transfer rate synchronized to the constant velocity of the objects of interest.
An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
