The present invention describes a method for testing an electronic part which may be an integrated circuit by using an air brush spray gun to apply an atomized flux coating to the part. The purpose of the method is to simulate soldering and is used on only a sample of parts as part of a reliability procedure before subjecting the part to an additional stress test or before actually soldering the part. The method comprises the steps of: spraying each part with an atomized flux coating; heating each part to simulate a soldering process; and removing each part from a heat source.
A furnace for testing integrated circuits has a furnace body for holding the integrated circuits undergoing testing. A water outlet pipe and an air exhaust pipe are connected to the furnace body. The water outlet pipe and the air exhaust pipe are automatically opened when a test is complete. An air supply pipe is connected to the furnace body. The air supply pipe is automatically opened when the test is complete for injecting low-temperature gas into the furnace body. A liquid inlet pipe is connected to the furnace body. The liquid inlet pipe is automatically opened when the test is complete for pouring cooling liquid into the furnace body. With the supply of low-temperature gas and cooling liquid, the furnace can be cooled down quickly thereby avoiding damages to the integrated circuits.
