A high-resolution range imaging system and method can sense the presence of and determine the position or range of each point on the surface of an object through triangulation calculation methods. A moving pattern of light is projected onto the object to be imaged. This resulting moving light pattern, comprised of vertical planes of light, is achieved by projecting light through a moving mask having a DeBruijn code formed thereon, the light being projected through the mask to provide blurring. The light source has a slit or the like which is between one and two times as wide as the narrowest stripe on the mask. Each light ray of the incoming reflected light pattern is recorded by a detecting device, such as a charge coupled device camera (CCD camera). The detecting device measures the blurring of the light pattern and records the associated gray-scale value, a measurement of the reflected light intensity, at each pixel location. A series of recordings are taken at each pixel location as the structured light pattern moves across the object. A vector defined by the series of gray scale values recorded at each pixel location corresponds to a unique location along the pattern of light. Once the series of gray-scale values is matched to this unique location, the range of each pixel location and a three-dimensional image of the object can be formed using triangulation calculation methods.
A mechanism, employed for a camera, which obtains precise information upon a three-dimensional configuration of an object, without its being affected by nature of the object and/or by nature of a light with which the object is lit. The mechanism includes an image-taking apparatus, a projection apparatus for selectively projecting more than two types of pattern lights onto a photographing area, and a detecting apparatus for detecting a photographing condition about the object and/or the light. The projection apparatus selectively projects one of the pattern lights on the basis of a result of detection, executed by the detecting apparatus, of the photographing condition about the object and/or the light.
This invention concerns a device for non-contact measurement of the surface of a three dimensional object in a measuring chamber with a projection device which projects a strip structure on the surface of an object, an observing device for recording the strip structure at measuring points on the surface of the object, a device for moving the object together with the observing device around a first axis of rotation, and an evaluation unit for determining the co-ordinates of the measuring points using the phase values of the strip structure in a predetermined co-ordinate system. A device (8) for moving the object about at least a second axis of rotation (D2) independent of the first axis of rotation (D1) and a calibration unit are provided, where the calibration unit (10) can determine the position of the second rotational axis (D2) in the predetermined co-ordinate system.
Systems and methods for identifying an object, such as a human face, are described. The systems and methods obtain parameters indicative of direct light and disperse light illuminating the object. Using these parameters, an albedo of the object is computed. The albedo is related to the radiance of the object after light is shone on the object, and is used to identify the object.
A method and apparatus to capture stereoscopic images is disclosed. A light source having a diffracting device to project a structured light unto a target object is provided. A plurality of imaging devices to capture images of the target object is provided.
In a three-dimensional shape detecting system comprising a three-dimensional shape detecting device and an external calculating device, the three-dimensional shape detecting device includes: projection means which projects pattern light onto a subject; image data obtaining means which captures a pattern light projection image of the subject and thereby obtains image data of the pattern light projection image while capturing a pattern light non-projection image of the subject and thereby obtaining image data of the pattern light non-projection image; pattern light position extraction means which extracts a position of the pattern light projected on the subject based on the obtained image data; and three-dimensional shape calculation means which figures out three-dimensional shape data of the subject based on the position of the pattern light extracted by the pattern light position extraction means.
