or
Bookmark and Share
Method and system for spatial filtering of an extended radiation source with chromatic aberration of imaging optics in single-element detector measurement for monitoring of the extended radiation source
 
   
Document Number
US Patent 5875026
Issued Date
February 23, 1999
Link
Inventors
Map
Abstract
A method and system is disclosed in which the local variation of an extended radiation source is monitored with single-element detector. The chromatic aberration of the imaging optics induces the different transmittance curves for different wavelengths, and the different shape in the transmittance curve is used as a spatial filter which is multiplied to the chromatic intensity profile of the extended radiation source to detect the local variation in the intensity profile of the extended radiation source. The signal processing of the chromatic signals is implemented to detect the size variation and the environmental effects on the extended radiation source. A fiber is also used for remote operation.
Tags:
Description:
Amusing 0%
Clever 0%
Complex 0%
Efficient 0%
Historic 0%
Important 0%
Innovative 0%
Interesting 0%
Practical 0%
Simple 0%
Number of Claims:
10
Comments:
no comments yet
Published
February 23, 1999
Application Number
08/763,752
Filed
December 11, 1996
US Classification
356/121   356/402 356/419
Int'l Classification
G01J   1/42   (20060101)   G01J   1/06   (20060101)  
Examiner
Assistant Examiner
Attorney/Law Firm
USPTO Field of Search
356/121   356/402   356/406   356/416   356/419   250/226  
Related Patents
6707550 - Wavelength monitor for WDM systems - Owned by PTS Corporation (San Jose, CA)

A method of monitoring input light having a plurality of spectral bands (wavelength channels) includes the following, carried out for at least two different spectral bands at different times, using a common photodetector and wavelength-monitoring circuit that is coupled to the photodetector: separating one of the spectral bands from the plurality of spectral bands, directing light in only that spectral band to the photodetector, and generating, with the wavelength-monitoring circuit, a signal representing a quality characteristic of a modulated or unmodulated pattern of light in that spectral band. Each of the plurality of spectral bands can be individually and sequentially monitored in round-robin fashion, each of a subset of the spectral bands can be individually and sequentially monitored in round-robin fashion (to provide selective wavelength monitoring), or the monitoring can be ad hoc in response to external requirements. If desired, the opitcal power of the plurality of spectral bands can be monitored by directing the light in the spectral bands other than the band that has been separated from the plurality to an additional common photodetector and a common power-monitoring circuit.

Claims
Description
About| FAQs| Terms & Disclaimer| Link to Us| Contact Us