An image detector for X-ray technology enables different image resolutions in a simple way. In an a-Si:H detector matrix, several pixels can be fixed via a row lead and a column lead, and these pixels can be interrogated together or, by the use of voltage impulses of different levels or polarity, can be interrogated separately.
An electro-optical sensor includes a detector pixel including a plurality of detector elements responsive to electromagnetic radiation, and a plurality of switches configurable to selectively combine signals from the detector elements in the detector pixel to provide a signal corresponding to a pixel in an image. The sensor may include a plurality of such detector pixels arranged, for example, in a linear array or in a two-dimensional array. Each of the detector pixels may have an associated group of switches configurable to selectively combine signals from the detector elements in the detector pixel.
An X-ray examination apparatus includes an X-ray source, an X-ray detector and an exposure control system. The exposure control system is arranged to control the X-ray source so as to perform a test exposure at a low X-ray dose and to perform an X-ray exposure at a higher X-ray dose. The X-ray detector applies a control signal resulting from the test exposure to the exposure control system and the X-ray source is adjusted on the basis of this control signal. The X-ray exposure produces an X-ray image and the X-ray detector supplies an image signal representing this X-ray image. The exposure control system is arranged to adjust the X-ray detector to a low spatial resolution during the test exposure and to a high spatial resolution during the X-ray exposure. The X-ray detector preferably includes a sensor matrix having sensor elements arranged in columns and rows. The spatial resolution is adjusted by deriving the control signal and the image signal from large and small groups of sensor elements, respectively.
A method and apparatus for testing an image sensor array such as a C-MOS imager which has sensing circuits arranged in rows and columns and wherein the sensing circuits include photosensitive devices is described. A reset voltage is applied to the photosensitive device in each of the sensor circuits such that at least adjacent circuits are reset to different voltage levels. The voltage on each photosensitive device is detected and compared to an expected level to determine if and where any faults may exist in the sensing circuits or lines in the array. A different reset voltage may be applied to each of the sensor circuits, however in one embodiment, a supply with only two voltage levels may be used. One voltage level is applied to every second column to provide a supply voltage to the photosensitive devices and to every second row to generate a reset enable signal for the photosensitive devices. The second voltage level is applied to the remaining columns and rows resulting in different reset voltage levels on adjacent sensing circuits.
The present invention, in one form, is a flexible interconnect circuit for altering the resolution of an imaging system. In one embodiment, by combining a plurality of detector array signal lines within the interconnect circuit, the imaging system resolution is altered. Each interconnect circuit includes a plurality of contacts at a first end and a second end and a plurality of conductors extending therebetween electrically connected to at least one contact at each end. By altering the number of contacts which are connected together, the resolution of the imaging system is altered.
An X-ray examination apparatus includes an X-ray source, an X-ray detector and an exposure control system. The exposure control system is arranged to control the X-ray source so as to perform a test exposure at a low X-ray dose and to perform an X-ray exposure at a higher X-ray dose. The X-ray detector applies a control signal resulting from the test exposure to the exposure control system and the X-ray source is adjusted on the basis of this control signal. The X-ray exposure produces an X-ray image and the X-ray detector supplies an image signal representing this X-ray image. The exposure control system is arranged to adjust the X-ray detector to a low spatial resolution during the test exposure and to a high spatial resolution during the X-ray exposure. The X-ray detector preferably includes a sensor matrix having sensor elements arranged in columns and rows. The spatial resolution is adjusted by deriving the control signal and the image signal from large and small groups of sensor elements, respectively.