A scan test method of an integrated circuit including a combinational circuit and flip-flops forming a scan chain is disclosed. The method first sets an initial test value to the flip-flops forming the scan chain by serial scan input. Then, it repeats a capture operation and a feedback shift operation. The capture operation captures an output of the combinational circuit, to which a value set to a flip-flop has been applied, by another flip-flop. The feedback shift operation feeds an output of the scan chain back to an input side of the scan chain for re-input during a shift operation in the scan chain. Finally, it compares an output of the scan chain with an expected value.

A circuit comprising a data input and output, a memory interface, a programmable counter, a signal line, and a test circuit further comprising an instruction register and at least one data register for supporting testing and emulating a memory subsystem with different types of physical memory in a microprocessor based system.

An interface error monitor system for monitoring data exchanged between a controller and a data converter over an interface includes a multi-stage linear feedback shifter register associated with the data converter for generating a pseudo random number sequence; a signature generating circuit responsive to data exchanged between the controller and data converter for altering the pseudo random number sequence generated by the linear feedback shifter register to create a signature of the data.

A bus performance monitoring mechanism for systems on a chip (SOC) is disclosed. The system comprises a muxing logic adapted to be coupled to a plurality of master devices, a plurality of slave devices, a plurality of generic signals and a plurality of control signals. The monitoring mechanism includes a plurality of control registers coupled to the muxing logic to allow for the selection of master, slave, generic and pipeline stage events to be counted. Finally, the monitoring mechanism includes synchronizing logic coupled to the plurality of registers for providing and receiving synchronizing signals to and from the monitors coupled thereto to allow for scalability. The scalable on-chip bus performance monitoring system in accordance with the present invention performs on-chip bus monitoring within a SOC implementation, while eliminating the pitfalls as described above. Through a minimalistic design approach, scalability is easily accomplished through the concept of using multiple monitor instances of these monitoring mechanisms within an SOC design while maintaining synchronization among them. Should an SOC design increase in size, scalability is achieved by simply adding additional monitor instance(s). The multiple monitor instances could then be connected in a "lego-like" fashion, allowing each to operate independently, or concurrently with one another via a scalable synchronization technique. For these designs where multiple monitor instances may be required, this enhances wireability by allowing the SOC designer to scatter the monitor instance locations virtually anywhere within the smaller areas of unused chip space, and simply wire the synchronization signals among the monitor instances to allow for synchronous operation.

Integrated circuit bus integrity may be verified without specialized test equipment. In a diagnostic mode, the integrated circuit may output a series of predetermined activation patterns onto the data bus to verify integrity of the data bus. Further bus verification may be provided by an address capture mode where address bus contents are reflected onto the data bus. A microprocessor may control diagnostic mode operation.