A cleaning apparatus and method for removing debris from the seals of a pressurized enclosure, specifically a sputter load lock chamber. The cleaning apparatus includes a load lock replacement door, a cleaning tool, and a seal. The load lock replacement door includes a surface that seals the opening of the load lock chamber so as to maintain a desired vacuum pressure in the load lock chamber. The sealing surface supports a cleaning tool. The cleaning tool and the sealing surface are supported by a vacuum seal which limits leakage of gas at ambient conditions into the load lock chamber. Once the tool is installed, the load lock chamber is pumped-down to a desired vacuum pressure. The tool is manipulated as necessary to remove debris from the seals of the load lock chamber. Once the cleaning process has been completed, the load lock chamber is vented, the tool removed, and the load lock door closed and sealed. The load lock chamber is restored to the desired operating vacuum pressure and the machine is placed back on-line.
A diagnostic test unit is provided. The test unit comprises a stem having a first end and a second end, the stem defining at least one flow channel extending between the first end and the second end. A swab is disposed at the first end of the stem, the swab being configured to collect a test sample derived from a biological source that is suspected of containing an analyte. The test unit also comprises a fluid chamber configured to contain a fluid, wherein the fluid chamber is in fluid communication with the swab via the flow channel. The test unit also comprises a rupturable seal that inhibits leakage of the fluid from the fluid chamber prior to use, and an assay for detecting the presence or absence of the analyte. The assay is in fluid communication with the swab, the flow channel, and the fluid chamber.
