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Method and apparatus for measuring and analyzing mass spectrum
   
Document Number
US Patent 6008490
Issued Date
December 28, 1999
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Abstract
An analyzing portion searches a mass spectrum for a mass peak exceeding a threshold level and adds the mass corresponding to the searched peak to the mass differences listed in an adduct ion table stored in a table, thereby forming a quasi-mass spectrum. The analyzing portion compares the formed quasi-mass spectrum with a measured mass spectrum in terms of mass. If agreement in mass between both the spectra is found, an index S is incremented by one and finally a total value of the index S is calculated. The analyzing portion then searches for another mass peak exceeding the threshold level and executes a similar process. Resulting values of the indexes S are compared with each other and probabilities of m/z and adduct ions are output to a display portion. Emergence frequency is counted for each of detected ion types and stored in storage means. If the measurement is executed in a predetermined number of times, then a greater weight is allocated to the ion types having larger emergence frequency, followed by updating the adduct ion table stored in the table. That arrangement realizes a method and apparatus for measuring and analyzing a mass spectrum by which a quasi-molecular ion and hence the molecular weight of a sample can be quickly estimated with high accuracy while preventing an error from being mixed in the process of analysis.
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Number of Claims:
14
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Owner
Hitachi, Ltd. (Tokyo,JP)
Published
December 28, 1999
Application Number
09/048,347
Filed
March 26, 1998
US Classification
250/282  
Int'l Classification
H01J   49/02   (20060101)   H01J   49/04   (20060101)  
Examiner
Attorney/Law Firm
Priority Data
Mar 31, 1997 [JP] 9-080207
USPTO Field of Search
250/282  
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