A testing unit is provided for mounting on a connector testing device for testing a connector which includes a plurality of metal terminals fastened to the connector by a lance system. A probe pin for testing conductivity is held by a molded resin slider having a pair of electrodes. The slider is integrally formed with a probe pin which holds a protrusion for testing, whether the fastening of the lance is complete. Positioning a lance testing member or protrusion relative to the lance can be achieved without providing a rotation-free stopper of the probe pin. In addition, individual failure testing can be achieved compared with the case which holds all of the probe pins. Furthermore, damage to the lance resulting from the material selection can also be avoided. Furthermore, a better connection between a probe pin and a lead wire is also provided when displacing probe pin of a connector testing device relative to the position of a lead wire. This is accomplished by providing a conductive member fixed to a block and connecting a lead wire with the fixed conductive member. Furthermore, the fixed conductive member and a probe pin are relatively and displaceably connected in an electrically conductive manner. The probe pin is retained in a relatively displaceable manner to the block by a slider. Thus, even when the probe pin is displaced relative to the block area during testing, a connecting position of the lead wire is not subjected to displacement from the predetermined position.
A check fixture for electrical connectors, including a pin nest made of a rigid plastic such as Delrin, having parallel slots and bores contiguous with said slots formed therein to receive one piece contact pins in precise arrangements and orientations to fit a connector to be checked. The contact pins are spring biased into the bores with blade portions extending outwardly from the slots. Wires are soldered into the butt ends of the contact pins and run to a conventional indicator. The pin nest is held within an outer body having a keyed opening to accept the connector in the proper orientation to be checked.
In a connector continuity checking device comprising continuity checking pins 38 corresponding to terminals 41 in a connector 32, and lance displacement detecting pins 34 corresponding to lances 44 having elasticity and adapted to lock the terminals, the continuity checking pins 38 are respectively provided at their distal ends with concave terminal receiving portions 55 to receive distal ends of the terminals 41, and the lance displacement detecting pins 34 are respectively provided at their distal ends with concave lance receiving portions 56 to receive distal ends of the lances 44. The concave terminal receiving portions 55 and the concave lance receiving portions 56 are formed in a U-shape or a V-shape in cross section.
An electrical connection testing device is provided with a connector holder (12), first and second probe holders (13, 14) which are successively arranged such that the connector holder (12) and the second probe holder are movable toward and away from the connector holder (12). A pushing mechanism (18) for pushing a receiving surface (14d) of the second probe holder (14) at the opposite side from the connector holder (12) is so coupled with the second probe holder (14) as to be movable toward and away from the second probe holder (14). The second probe holder (14) and the connector holder (12) are moved according to the movement of the pushing mechanism (18), thereby being positioned at testing positions (P1) where probes (16, 17) are inserted into testing holes (1a) of a connector (C) from opposite sides or at retracted positions (P2) where the connector can be taken out of a connector holder (12).
A continuity checking device for a connector which comprises a connector holding part 3, a checking part 11 including continuity checking pins 5 capable of contacting with terminals 4, and insertion checking pins 8 which can be inserted into spaces where flexible locking lances 7 of the connector are deflected, the checking part being movable back and forth with respect to the connector holding part, and links 12 which are connected to the checking part at its one end and connected to an operating lever 13 at the other end, wherein the insertion checking pins 8 are immovably fixed inside the checking part, whereby a gap 14 is created between the checking part 11 and the connector holding part 3, when the insertion checking pins are abutted against the flexible locking lances 72. Each of the links 12 includes a displacement absorbing mechanisms. Each of the links includes a pair of link plates 51, 52 and a link cover, and the displacement absorbing mechanism includes elongated holes 57, 58 respectively provided in the link plates, shafts 61 of the link cover, and an elastic member provided in the link cover for urging the link plates in an expanding direction. Biasing force of the elastic member is larger than resisting force for advancing the checking part 11.
A low pin testing system for efficiently detecting unlocked terminals within an electrical connector. The low pin testing system includes a housing with a receiver opening for removably receiving an electrical connector to be tested, a plurality of probe passages within the housing, a plurality of testing probes slidably positioned within the housing in a biased manner each having an engaging end extending into said receiver opening and corresponding to a terminal within the electrical connector, a plurality of light emitters for illuminating light through corresponding light passages, and a plurality of light receivers at the opposite end of the light passages. The light passages extend substantially transverse through a row of the probe passages and the testing probes each include a cutout that allows the light to pass through the testing probes when the testing probes are moved from engagement with the terminals of an electrical connector.
