Coaxial spatially resolved refractometer

What is claimed is:

1. A refractometer for determining the optimal wavefront at a measurement plane, said refractometer comprising

a first spatial light pattern generator disposed at a first plane, said first plane being optically conjugate to said measurement plane,

a second spatial light pattern generator coaxial with said first spatial light pattern generator, said second spatial light pattern generator disposed at a second plane optically conjugate to a detector plane,

control means coupled to said first and second spatial light pattern generators for operating said refractometer in

a measurement interval during which a measurement pattern is projected through a selected measurement site on said measurement plane and onto a measurement pattern position on said detector plane, and

a reference interval during which a reference pattern is projected through a selected reference site on said measurement plane and onto a reference pattern position on said detector plane, and

detector means in optical communication with said detector plane, said detector means providing an estimate of said measurement pattern position and said reference pattern position,

automated alignment means in communication with said detector means for controlling an angle at which said measurement pattern is projected through said selected measurement site during said measurement interval, said angle being selected by said automatic alignment means on the basis of said estimate of said reference pattern position and said measurement pattern position.

2. The refractometer of claim 1 wherein said control means comprises means for operating said refractometer such that said measurement interval and said reference interval are successive intervals.

3. The refractometer of claim 1 wherein said control means comprises means for operating said refractometer such that said measurement interval is contemporaneous with said reference interval.

4. The refractometer of claim 1 further comprising reference target projection means coaxial with said first spatial light pattern generator for generating, on a plane optically conjugate to said detector plane, a reference pattern.

5. The refractometer of claim 4 wherein said reference target projection means comprises

a reference target disposed at a reference plane optically conjugate to said detector plane, and

a reference light source illuminating said reference target.

6. The refractometer of claim 5 wherein said reference plane is coplanar with said second plane.

7. The refractometer of claim 5 wherein said reference plane is disposed between said second plane and said detector plane.

8. The refractometer of claim 5 wherein said reference target comprises a reticle disposed at said reference plane.

9. The refractometer of claim 4 wherein said reference target projection means comprises

means forming an aperture in said second spatial light pattern generator,

illumination means for generating light passing through said aperture, and

means for coordinating the operation of said aperture forming means and said illumination means.

10. The refractometer of claim 9 wherein said means forming an aperture comprises means for selecting an extent of said aperture.

11. The refractometer of claim 1 further comprising site-selection means for selecting said measurement site.

12. The refractometer of claim 11 wherein said site-selection means comprises

means for forming a site-selection light source in said first plane, and

means for moving said site-selection light source to a selected point on said first plane.

13. The refractometer of claim 12 wherein said means for forming a moveable site-selection light source comprises

a cathode ray tube illuminated by a beam, said cathode ray tube disposed coplanar with said first plane, and

means for controlling the location of said beam on said cathode ray tube.

14. The refractometer of claim 12 wherein said means for forming a moveable site-selection light source comprises

an array of light-emitting elements disposed coplanar with said first plane, each of said light-emitting elements having an active state in which it emits light and a darkened state in which it does not emit light, and

means for selectively addressing said light-emitting elements.

15. The refractometer of claim 12 wherein said means for forming a site-selection light source in said first plane comprises means for selecting an extent of said site-selection light source.

16. The refractometer of claim 11 wherein said site-selection means comprises

means for forming a moveable site-selection aperture in said first plane, and

means for passing light through said site-selection aperture.

17. The refractometer of claim 16 wherein said means for forming a moveable site-selection aperture comprises

an opaque screen disposed coplanar with said first plane, said opaque screen having a site-selection aperture therethrough, and

means for moving said opaque screen, thereby moving said site-selection aperture in said first plane.

18. The refractometer of claim 16 wherein said means for forming a moveable site-selection aperture comprises

an array of light-modulating elements disposed coplanar with said first plane, each of said light modulating elements having an ON state and an OFF state, and

means for switching selected light-modulating elements from said array between said ON state and said OFF state, thereby forming a moveable site-selection aperture in said first plane.

19. The refractometer of claim 16 wherein said site-selection means further comprises means for selecting an extent of said aperture.

20. The refractometer of claim 1 wherein said alignment means comprises

a measurement light source moveable in said first plane, and

means for controlling the location of said light source within said first plane.

21. The refractometer of 20 wherein

said measurement light source comprises an array of light-modulating elements disposed coplanar with said first plane, each of said light modulating elements having an ON state and an OFF state, and

said location control means comprises means for switching selected light-modulating elements from said array between said ON state and said OFF state, thereby forming a moveable site-selection aperture in said first plane.

22. The refractometer of claim 20 wherein

said measurement light source comprises a cathode ray tube illuminated by a beam, said cathode ray tube disposed coplanar with said first plane, and

said location control means comprises means for controlling the location of said beam on said cathode ray tube.

23. The refractometer of claim 20 wherein said alignment means comprises

an array of light-emitting elements disposed coplanar with said first plane, each of said light-emitting elements having an active state in which it emits light and a darkened state in which it does not emit light, and

means for selectively addressing said light-emitting elements.

24. The refractometer of claim 1 wherein said control means further comprises means for repeating said reference interval and said measurement interval.

25. The refractometer of claim 1 wherein said detector means is disposed on a plane optically conjugate to said second plane to receive light from said site-selection plane, and said detector means is responsive to the spatial location of an incident light source.

26. The refractometer of claim 25 wherein said detector plane is coaxial with said measurement plane.

27. The refractometer of claim 25 wherein said automated alignment means further comprises means for receiving a signal from said detector means and means for responding to said signal by aligning said reference pattern position with said measurement pattern position.

28. The refractometer of claim 25 wherein said plane on which said detector is disposed is coplanar with said detector plane.

29. The refractometer of claim 25 wherein said detector means comprises a beamsplitter disposed between said second plane and said measurement plane to direct a first beam toward said detector plane and a second beam re-emegent from the lens system toward said detector.

30. The refractometer of claim 1 wherein said detector means comprises

a spatially-responsive light-detector, and

a beam splitter disposed to direct a portion of a beam reflected from a location on said detector plane toward a location on said spatially-responsive light-detector that corresponds to said location on said detector plane.

31. The refractometer of claim 1 wherein said automatic alignment means comprises

a processor in communication with said detector means and configured to determine a vector along which to translate said measurement pattern position to coincide with said reference pattern position; and

a controller in communication with said processor and said second spatial light pattern generator, said controller being configured to control said second spatial light pattern generator on the basis of instructions provided by said processor.

32. A refractometer for determining the optimal wavefront at a measurement plane, said refractometer comprising

means for generating a spatially varying optical pattern, said optical pattern being disposed at a first plane optically conjugate to said measurement plane,

means for modulating said spatially varying optical pattern, said modulating means being disposed coaxially with said pattern generating means on a second plane optically conjugate to a detector plane,

control means coupled to said pattern generating means and said pattern modulating means for operating said refractometer in

a measurement interval during which a measurement pattern is projected through a selected measurement site on said measurement plane and onto a measurement pattern position on said detector plane, and

a reference interval during which a reference pattern is projected through a selected reference site on said measurement plane and onto a reference pattern position on said detector plane,

detector means in optical communication with said detector plane, said detector means providing an estimate of said measurement pattern position and said reference pattern position,

automatic alignment means in communication with said detector means for controlling an angle at which said measurement pattern is projected through said selected measurement site during said measurement interval, said angle being selected by said automatic alignment means on the basis of said reference pattern position and said measurement pattern position.

33. A method for determining the optimal wavefront at a measurement plane, said method comprising the steps of

providing a first spatial light pattern generator disposed at a first plane, said first plane being optically conjugate to said measurement plane,

providing a second spatial light pattern generator coaxial with said first spatial light pattern generator, said second spatial light pattern generator disposed at a second plane optically conjugate to a detector plane,

projecting a measurement pattern through a selected measurement site on said measurement plane and onto a measurement pattern position on said detector plane during a measurement interval,

projecting a reference pattern through a reference pattern site on said measurement plane and onto a reference pattern position on said detector plane during a reference interval,

determining said measurement pattern position and said reference pattern position, and

aligning said measurement pattern position with said reference pattern position on said detector plane.

34. The method of claim 33 wherein said step of projecting said measurement pattern follows said step of projecting said reference pattern.

35. The method of claim 33 wherein said step of projecting said measurement pattern and said step of projecting said reference pattern occur contemporaneously.

36. The method of claim 33 wherein said step of projecting a reference pattern further comprises the step of generating, on a plane optically conjugate to said detector plane, a reference pattern.

37. The method of claim 36 wherein said step of generating a reference pattern comprises the step of

illuminating a reference target disposed at a reference plane optically conjugate to said detector plane.

38. The method of claim 37 further comprising the step of positioning said reference plane to be coplanar with said second plane.

39. The method of claim 37 further comprising the step of positioning said reference plane between said second plane and said detector plane.

40. The method of claim 36 wherein said step of projecting a reference pattern comprises the steps of

forming an aperture in a second spatial light pattern generator disposed at a plane optically conjugate to said detector plane, and

passing light through said aperture.

41. The method of claim 40 further comprising the step of selecting an extent of said aperture.

42. The method of claim 33 further comprising the step of selecting said measurement site.

43. The method of claim 42 wherein said step of selecting said measurement site comprises the steps of

forming a site-selection light source in a first plane conjugate to said measurement plane, and

moving said site-selection light source to a selected point on said first plane.

44. The method of claim 43 wherein said step of forming a moveable site-selection light source comprises the step of

controlling the location of a beam on a cathode ray tube illuminated by said beam, said cathode ray tube disposed coplanar with said first plane.

45. The method of claim 43 wherein said step of forming a moveable site-selection light source comprises the step of

selectively addressing said light-emitting elements from an array of light-emitting elements disposed coplanar with said first plane, each of said light-emitting elements having an active state in which it emits light and a darkened state in which it does not emit light.

46. The method of claim 43 wherein said step of forming a site-selection light source comprises the step of specifying an extent of said site-selection light source.

47. The method of claim 42 wherein said step of selecting said measurement site comprises the steps of

forming a moveable site-selection aperture in said first plane, and

passing light through said site-selection aperture.

48. The method of claim 47 wherein said step of forming a moveable site-selection aperture comprises the step of

moving an opaque screen disposed coplanar with said first plane in a direction coplanar with said first plane, said opaque screen having a site-selection aperture therethrough.

49. The method of claim 47 wherein said step of forming a moveable site-selection aperture comprises the steps of

providing an array of light-modulating elements disposed coplanar with said first plane, each of said light modulating elements having an ON state and an OFF state, and

switching selected light-modulating elements from said array between said ON state and said OFF state, thereby forming a moveable site-selection aperture in said first plane.

50. The method of claim 47 wherein said step of forming a movable site-selection aperture comprises the step of specifying an extent of said site-selection aperture.

51. The method of claim 33 wherein said aligning step comprises the step of controlling the location of a measurement light source within said first plane.

52. The method of claim 51 wherein said controlling step comprises the steps of

providing an array of light-modulating elements disposed coplanar with said first plane, each of said light modulating elements having an ON state and an OFF state, and

switching selected light-modulating elements from said array between said ON state and said OFF state, thereby forming a moveable site-selection aperture in said first plane.

53. The method of claim 51 wherein said controlling step comprises the steps of

providing a cathode ray tube illuminated by a beam, said cathode ray tube disposed coplanar with said first plane, and

controlling the location of said beam on said cathode ray tube.

54. The method of claim 51 wherein said aligning step comprises the steps of

providing an array of light-emitting elements disposed coplanar with said first plane, each of said light-emitting elements having an active state in which it emits light and a darkened state in which it does not emit light, and

selectively addressing said light-emitting elements.

55. The method of claim 33 further comprising the step of

detecting, at the detector plane, the spatial location of an incident light source.

56. The method of claim 55 wherein said detecting step includes the step of providing a CCD array.

57. The method of claim 55 wherein said detecting step includes the step of providing a quadrant detector.

58. The method of claim 33 wherein said estimating step comprises the steps of:

providing a spatially-responsive light-detector, and

diverting a beam from said location on said detector plane to a corresponding location on said spatially-responsive light-detector.

59. The method of claim 33 wherein said aligning step comprises the steps of

determining a vector along which to translate said measurement pattern position toward said reference pattern position, and

controlling said measurement pattern position on the basis of said vector.

60. A refractometer for determining the normal vector to a wavefront at a selected measurement site on a cornea of a patient, said refractometer comprising

reference projection means coaxial with an optical axis for projecting, onto a reference pattern position on a retina of a patient, a reference pattern,

site-selection means, coaxial with said optical axis, for selecting said selected measurement site,

measurement projection means, coaxial with said optical axis, for

projecting a measurement pattern through said selected measurement site for refraction to a measurement pattern position on said retina,

detector means in optical communication with said retina, said detector means providing an estimate of the locations of said measurement pattern position and said reference pattern position, and

automated alignment means for changing the location of said measurement pattern position on the basis of said estimate, said alignment means permitting alignment of said measurement pattern position with said reference pattern position.

61. The refractometer of claim 60 wherein said detector means comprises

a spatially-responsive light-detector, and

a beamsplitter disposed to direct a portion of a beam reflected from a location on said retina toward a location on said spatially-responsive light-detector that corresponds to said location on said retina.

62. The refractometer of claim 60 wherein said automated alignment means comprises

a processor in communication with said detector means and configured to determine a vector along which to translate said measurement pattern position to coincide with said reference pattern position, and

a controller in communication with said processor and said site-selection means, said controller configured to control said site-selection means on the basis of instructions provided by said processor.

63. A refractometer for determining the optimal wavefront at a measurement plane, said refractometer comprising

pattern generating means for generating a spatially varying optical pattern, said optical pattern being disposed at a first plane conjugate to a detector plane,

pattern modulating means for modulating said spatially varying optical pattern, said pattern modulating means being disposed coaxially with said pattern generating means on a second plane optically conjugate to said measurement plane,

control means coupled to said first and second spatial light pattern generators for operating said refractometer in

a measurement interval during which a measurement pattern is projected through a selected measurement site on said measurement plane and onto a measurement pattern position on said detector plane, and

a reference interval during which a reference pattern is projected through a selected reference site on said measurement plane and onto a reference pattern position on said detector plane,

detector means in optical communication with said detector plane, said measurement means configured to provide an estimate of the locations of said reference pattern position and said measurement pattern position, and

automated alignment means in communication with said measurement means for controlling, on the basis of said estimate, an angle at which said measurement pattern is projected through said selected measurement site during said measurement interval.

64. The refractometer of claim 63 wherein said detector means comprises

a spatially-responsive light-detector, and

a beamsplitter disposed to direct a portion of a beam reflected from a location on said detector plane toward a location on said spatially-responsive light-detector that corresponds to said location on said detector plane.

65. The refractometer of claim 63 wherein said detector means comprises

a spatially-responsive light-detector, and

a beamsplitter disposed to direct a portion of a beam reflected from a location on said detector plane toward a location on said spatially-responsive light-detector that corresponds to said location on said detector plane.

66. The refractometer of claim 63 wherein said automated alignment means comprises

a processor in communication with said detector means and configured to determine a vector along which to translate said measurement pattern position toward said reference pattern position, and

a controller in communication with said processor and said pattern modulating means, said controller being configured to control said pattern modulation means on the basis of instructions provided by said processor.

Description Submit all comments and votes

This invention relates to the field of instrumentation for optical measurements and, in particular, to instruments for determining the direction of the vector normal to the optimal wavefront at selected points of an optical system. An optimal wavefront of an optical system is that wavefront which is brought to an optimal focus by the optical system. In the case of an ideal optical system, the optimal wavefront is a planar wavefront.

BACKGROUND

The action of an optical system can be considered as a transformation that operates on an incident wavefront to generate a transmitted wavefront. In many optical systems, different points on the wavefront experience different transformations depending on what portions of the optical system they traverse. For example, when a wave is incident on a lens, those portions of the wavefront that traverse the periphery of the lens will experience phase delays which differ from those experienced by those portions of the wavefront that illuminate the center of the lens. Since a wavefront is a locus of points having constant phase, this results in a transmitted wavefront having a shape that differs from that of the incident wavefront. By appropriately shaping and positioning lenses, one can conform the shape of the output wavefront of an optical system to a desired shape.

In some cases, an optical system is known to produce an incorrect transformation and the optical designer's role is to design a second optical system to correct that deficiency. For example, in the case of a human eye requiring a corrective lens, the optical components of the human eye perform an optical transformation that is imperfect. In another example, one might inadvertently install a flawed objective lens in a large telescope. Rather than attempting to replace the objective lens, it may be preferable to install a corrective lens. In both of these cases, it is useful for the designer of corrective lenses to know the nature of the flawed optical transformation.

An optical transformation can be pictured as the change in the shape of the wavefront illustrated in FIGS. 12A-12C, which illustrate physical principles underlying optical transformations. FIG. 12A shows a known optical system in which an incident plane wave is transformed into a spherical wave. The system in FIG. 12A is therefore representative of a human eye which does not require corrective lenses.

FIG. 12B shows a known optical system representative of a human eye in need of correction. In contrast to the system of FIG. 12A, this system shows a planar wavefront transformed into an irregular wavefront. The eye's inability to bring this irregular wavefront into focus on the retina causes the perceived image to appear distorted or blurred.

FIG. 12C shows the optical system of FIG. 12B but with an "optimal wavefront" incident on the system. The shape of this optimal wavefront is chosen such that the transformation provided by the optical system in FIG. 12B results in a spherical wavefront instead of the irregularly shaped wavefront shown in FIG. 12B. It is apparent from comparison of FIGS. 12A and 12C that a corrective optical system which transforms an incident wavefront into this optimal wavefront before the wave undergoes the flawed optical transformation has the effect of correcting for the flawed optical transformation.

Once the wavefront normal vectors at selected points on the wavefront are known, one can estimate the shape of the wavefront. Using this estimate of the wavefront shape, one can then design an optical system that corrects for the flawed optical transformation.

A common method for measuring the optical characteristics of a human eye is a simple substitution technique of placing lenses having different correction factors in front of the eye and asking the patient whether or not the overall image has improved. Using this method, a clinician can determine an overall correction for the optical characteristics of the eye. The instrument that is typically used to approximate an optical system that corrects for the flawed optical transformation of an eye is referred to as a "refractometer." In the case of a general lens system, corrections are determined by a variety of tests, each referred to by its own name, such as the "Foucault test." Throughout this specification, the term "refractometer" will be used to refer to instruments that make such tests.

The simple substitution technique determines the overall correction for the eye, but it is limited to prismatic, cylindrical, and spherical corrections. These corrections provide only the lower-order terms of the Siedel or polynomial model of the eye's optical system. The foregoing method does not correct for the errors that are specified by higher-order terms of the Siedel or polynomial model. Additionally, it is not possible, using this method, to obtain point-by-point measurements of the optimal wavefront's normal vector at designated sites on an optical system having spatial extent. For example, where the optical system is a cornea, it is not possible, using this method, to determine the optimal wavefront's normal vector at each point on the cornea.

A number of refractometers have been developed that are designed to determine the optimal wavefront at designated sites on an optical system. For example, Penney et al. U.S. Pat. No. 5,258,791, incorporated herein by this reference, describes an optical system including (i) a reference optical subsystem for projecting a reference pattern on the patient's retina through a reference area on the cornea, and (ii) a separate measurement optical subsystem for projecting a measurement pattern on the patient's retina through a measurement area on the cornea.

To determine the shape of the optimal wavefront at a designated site on the cornea using the refractometer disclosed in Penney, the measurement pattern is moved across the retina until its location coincides with the location of the reference pattern. Based on the difference between the initial and final positions of the measurement pattern, the refractometer disclosed in Penney can infer the direction of the vector normal to the optimal wavefront at the selected corneal site.

A disadvantage of the device disclosed in Penney is, simply put, that it has far too many parts. As a result, it is costly to acquire, complex to assemble, and requires frequent alignment during operation. What is therefore desirable in the art is a refractometer that provides the functionality of the Penney refractometer at reduced cost and complexity and without the need for frequent alignment.

SUMMARY

A refractometer according to the invention provides a reference path that is coaxial with a measurement path. This feature of the invention simplifies construction by reducing the number of parts and simplifies maintenance by halving the number of optical axes to be aligned.

In a refractometer embodying the invention, two spatial light pattern generators are aligned along a common optical axis. The term "spatial

light pattern generator" is used throughout this specification to refer to any device that changes a property of light, such as brightness, according to a spatially variable pattern. As used herein, spatial light pattern generators include holes in an opaque masking material, electronically addressable transmissive or reflective arrays, and light sources having controllable brightness patterns.

The first spatial light pattern generator of the refractometer is optically conjugate to a measurement plane at which the optimal wavefront's normal vector is to be determined. This measurement plane is coplanar with a pupil of the lens system, a pupil or cornea of an eye, or a similar structure whose optical properties are of interest. The second spatial light pattern generator is optically conjugate to a detector plane on which a detector spatially responsive to a light source can be placed. Three non-limiting examples of such a detector are a CCD array, a quadrant detector, or the retina of an eye. In optical design terminology, a plane often refers to the apical position of a surface. It is in this sense that the term "plane" is used throughout this specification.

A controller coupled to the first and second spatial light pattern generators operates the refractometer in two time intervals: a measurement interval, and a reference interval. During the measurement interval, the measurement pattern is projected through a selected measurement site on the measurement plane, and, ultimately, to a measurement pattern position on the detector plane. During the reference interval, a reference pattern is projected through a generally different site, referred to as the "selected reference site," on the measurement plane and onto a generally different reference pattern position on the detector plane. The controller switches between operating the refractometer in the reference interval and operating it in the measurement interval rapidly enough so that, as a result of persistence of vision, the measurement pattern and the reference pattern appear, to a detector or a human observer, to be projected simultaneously. Alternatively, the measurement interval and the reference interval can temporally overlap or, in the limit, can be contemporaneous.

The refractometer of the invention includes an image aligner for controlling the location of the measurement pattern during the measurement interval. By operation of the aligner, the measurement pattern can be moved relative to the reference pattern. The distance and direction that the measurement pattern is moved in order to align it with the reference pattern on the detector plane provides a measure of the normal vector of the optimal wavefront at the measurement plane.

The refractometer can further include lenses that make the detector plane optically conjugate to a reference plane, at which the reference pattern is generated, and to an object plane, at which the measurement pattern is generated. Other, or the same, lenses in the refractometer can make the measurement plane optically conjugate to a site-selection plane, at which the sites or areas on the measurement plane used during the reference and the measurement intervals are selected.

A refractometer embodying this invention consists of two optical subsystems aligned along substantially the same optical axis: a reference optical subsystem and a measurement optical subsystem. The reference optical subsystem projects a reference pattern onto a reference pattern position on a detector plane through a selected reference site on the measurement plane. The measurement optical subsystem projects a measurement pattern onto a measurement pattern position on the detector plane through a selected measurement site on the measurement plane. These two subsystems can have some elements in common. The fact that the two subsystems are aligned along the same optical axis is a distinguishing feature of this invention. A second distinguishing feature of this invention is that the subsystems may be temporally rather than spatially distinct. In the case in which the optical system to be evaluated is a human eye, the measurement plane can be at the cornea or pupil of the eye being evaluated and the detector can be the retina of that eye.

In one preferred embodiment, the location of the measurement pattern on the detector can be controlled by an observer through the use of an optical aligner coupled to the measurement optical subsystem. Using this optical aligner, the observer can move the measurement pattern on the detector until it is aligned with the reference pattern on the detector. The distance and the direction in which the observer moves the measurement pattern in order to align it with the reference pattern provide a measure of the shape of the optimal wavefront associated with the portion of the wave incident on the selected measurement site on the measurement plane. In the case in which the optical system is the human eye, the observer is typically the patient. However, the observer can also be an automatic computer processor that is coupled to a detector that observes the retina and that can determine the relative locations of the reference pattern and of the measurement pattern on the retina.

In embodiments of the invention disclosed herein, a first spatial light pattern generator functions as a moveable aperture and a second spatial light pattern generator functions as a moveable light source. In a first embodiment, the moveable aperture is conjugate to the measurement plane and the moveable light source is conjugate to the detector plane. A second embodiment reverses this. In the second embodiment, it is the moveable aperture that is conjugate to the detector plane and the moveable light source that is conjugate to the measurement plane.

A reference optical subsystem for practice of the invention can include a spatial light pattern generator located at a reference plane conjugate to the detector plane and a light source for illuminating that spatial light pattern generator. Where the optical system is the eye, the detector is a retina and the reference plane is a proximal retinal conjugate plane. In the first embodiment, the reference optical subsystem can include a clear plate on which is engraved a reticle and a light source for illuminating the reticle. In this first embodiment, the measurement interval and the reference interval can be contemporaneous. In the second embodiment, the first spatial light pattern generator generates both reference and measurement light patterns in alternating time intervals, and the second spatial light pattern generator selects both the reference and measurement sites in the corresponding time intervals.

In the first embodiment, the site-selecting spatial light pattern generator provides a small aperture mask or light source that can be moved, under the control of a processor such as a computer, to selected positions in a site-selection plane. This site-selection plane is optically conjugate to a measurement plane on which is disposed the optical system whose optimal wavefront is sought. Where the optical system is the eye, the measurement plane is coplanar with the cornea or pupil. Where the optical system is a non-living lens system, the measurement plane can be coplanar with the pupil of the lens system.

Because the site-selection plane and the measurement plane are conjugates of one another, all light emanating from a selected point on the site-selection plane is directed to a corresponding point on the measurement plane. Since each point on the site-selection plane corresponds to a point on the measurement plane, when the site selector moves the mask or light source to a particular location on the site-selection plane, it also selects a measurement site on the measurement plane. This has the effect of selecting a measurement site on the cornea or pupil of the eye, or on the pupillary plane of the lens system.

In the first embodiment, the site selector can be implemented as a moveable aperture on the site-selection plane operating in conjunction with a light source behind the aperture. In the second embodiment, the site selector can be implemented as a small, moveable light source on the site-selection plane.

The optical measurement subsystem for either illustrated embodiment of the invention includes a light source or mask at an object plane optically conjugate to the detector plane. Where the optical system is the eye, the object plane can be optically conjugate to the retina of the eye. Where the optical system is a lens system, the object plane can be optically conjugate to a detector at the lens system's image plane. In the second embodiment, the light source can be formed by addressing selected light modulating elements in a spatial light pattern generator on the object plane in a manner that forms a small aperture through which light from a light source can pass. In the first embodiment, the light source can be formed directly by providing a spatial light pattern generator and by either addressing selected areas of the spatial light pattern generator.

Where the optical system to be evaluated is a system of lenses, the refractometer is as described above but with the retinal conjugate plane replaced by a plane conjugate to a detector and with the corneal conjugate plane replaced by a plane which is optically conjugate to the plane at which optical correction is to be effected. The detector in such a case can be an array responsive to the spatial location of an optical pattern, such as a CCD array or quadrant detector.

The foregoing and other objects, features and advantages of the invention will be apparent from the following description and from the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a refractometer projecting a reference pattern on the retina of an eye in a first embodiment of the invention;

FIG. 2 is a perspective view of an illuminated reticle for projecting the reference pattern in FIG. 1;

FIG. 3 shows a measurement pattern being projected on the retina of the eye in the embodiment depicted in FIG. 1;

FIG. 4 shows a reference pattern being projected on the retina of an eye in a second embodiment of the invention;

FIG. 5 shows a measurement pattern being projected on the retina of the eye in the embodiment depicted in FIG. 4;

FIG. 6A shows the mask of FIGS. 1 and 3 implemented with an opaque screen and a stepping motor;

FIG. 6B shows the mask of FIGS. 1, and 3 implemented using a spatial light modulator;

FIG. 6C shows the mask of FIGS. 4 and 5 implemented using a spatial light modulator;

FIG. 7A shows an implementation of the illumination pattern source for the embodiments of FIGS. 1, 3, 4 and 5 as a cathode ray tube;

FIG. 7B shows an implementation of the illumination pattern source for the embodiments of FIGS. 1, 3, 4 and 5 as an array of light-emitting elements;

FIG. 7C shows an implementation of the illumination pattern source for the embodiments of FIGS. 1, 3, 4 and 5 as an array of light-modulating elements;

FIGS. 8-9 correspond to the embodiment illustrated in FIGS. 1 and 3but with the eye replaced by a lens system and with the retina of the eye replaced by a detector;

FIGS. 10-11 correspond to the embodiment illustrated in FIGS. 4 and 5 but with the eye replaced by a lens system and with the retina of the eye replaced by a detector;

FIGS. 12A, 12B, and 12C, illustrate known physical principles underlying the invention, respectively: an ideal optical system which transforms a planar wavefront into a spherical wavefront, an optical system which transforms a planar wavefront into an irregular wavefront, and an optical system which transforms its optimal wavefront into a spherical wavefront; and

FIG. 13 shows a beamsplitter and lens adaptable for use with the embodiments of FIGS. 1, 3, 4, 5, 8, 9, 10 and 11 for transmitting the reference pattern and measurement pattern at the retina of an eye to a detector.

DESCRIPTION OF ILLUSTRATED EMBODIMENTS

In one embodiment, shown in FIGS. 1 and 3, a refractometer 10 according to the invention includes an illuminated reticle 14 coplanar with a reference plane 15 which is optically conjugate to a detector plane 47. A first lens 16 is disposed along the optical axis X between the illuminated reticle 14 and a measurement plane 46. The illuminated reticle 14, shown in more detail in FIG. 2, is typically a transparent plate 14a having a cross or other reference mark 14b etched on the plate. The transparent plate 14a is illuminated by a light source 14c adjacent to the plate. Together, the illuminated reticle 14 and the lens 16 form a reference optical subsystem 12.

The refractometer 10 further includes a mask 22 coplanar with a site-selection plane 25 optically conjugate to the measurement plane 46. The mask 22 has a moveable site-selecting aperture 23 (FIG. 3) whose location in the site-selection plane 25 is controlled by an aperture controller 24 connected to a processor 50. A second lens 26 is disposed along the optical axis X between the mask 22 and the illuminated reticle 14. Together, the mask 22 and the lens 26 form a site designator 20 for selecting a measurement site 40 on the measurement plane 46.

When the refractometer 10 measures the optical properties of an eye 45, as shown in FIGS. 1 and 3, the eye 45 is positioned between the measurement plane 46 and the detector plane 47 with the retina 43 of the eye 45 being approximately coplanar with the detector plane 47 and with the cornea 41 of the eye 45 being approximately coplanar with the measurement pane 46.

The mask 22 of the refractometer 10 in FIG. 1 can be implemented in a variety of ways. These include the mechanically actuated mask 22a shown in FIG. 6A and the electronically actuated mask 22b shown in FIG. 6B. As shown in FIG. 6A, one illustrated mask 22a for use with the refractometer 10 of FIG. 1 and having a moveable site-selecting aperture 23' is implemented by coupling a stepping motor M to both an aperture controller 24' and an opaque screen 27a having an aperture 23'. The aperture controller 24' in this embodiment is a processor which receives a signal representative of the desired location for the aperture 23' from the processor 50 and translates the desired location into signals which control the action of the stepping motor M. In response to signals from the aperture controller 24', the stepping motor M translates the opaque screen 27a in the site-selection plane 25, thereby translating the aperture 23' in the site-selection plane 25 as well.

In an alternative embodiment, shown in FIG. 6B, a mask 22b for use with the refractometer 10 of FIG. 1 is implemented by providing a spatial light modulator 27b having a multiplicity of light-modulating elements 21, each of which is operable in an "ON" state and in an "OFF" state. In the preferred embodiment, "ON" and "OFF" refer to the presence and absence of light respectively. However, "ON" and "OFF" can also refer to the presence and absence of any physically measurable parameter such as color, phase, or polarization state. Light-modulating elements in the "ON" state form an aperture 23" whose size, shape, and location on the mask are controllable by the distribution of light-modulating elements forming it. If these light-modulating elements 21 are liquid crystal elements, the ON and OFF states correspond respectively to the transmissive and opaque states of the liquid crystal element. When a liquid crystal element is in the ON state, light travels through that liquid crystal element toward the measurement plane 46 (FIG. 1). When a liquid crystal element is in its OFF state, light incident on that liquid crystal element is blocked and does not reach the measurement plane 46. Alternatively, if the light-modulating elements 21 are moveable micro-mirrors, the ON state corresponds to the position in which the micro-mirror reflects light toward the measurement plane 46 and the OFF state corresponds to the position in which the micro-mirror deflects light away from measurement plane 46. It will be appreciated by those skilled in the art that it is possible to use other types of spatial light modulators. In this alternative embodiment, the aperture controller 24" is a video display controller such as a VGA card of the type used to control the display of a typical general purpose digital computer.

By implementing the mask 22b with a spatial light modulator 27b (FIG. 6B)having individually addressable light-modulating elements 21, the invention enables apertures 23" of different sizes and shapes to be easily

formed. For example, the spatial light modulator 27b has the ability to form annular apertures of varying inner and outer radii. Moreover, a mask 22b implemented by a spatial light modulator 27b is not subject to mechanical vibration