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Apparatus and method for estimating background tilt and offset
   
Document Number
US Patent 6115491
Issued Date
September 5, 2000
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Abstract
A computer implemented software device for estimating background tilt and offset is disclosed to preferably be adaptable to an optical measurement instrument wherein the estimated parameters are resolved to generate a reference plane to be subtracted from a height map of a phase profile. A set of histograms of heights is used to develop a merit function. A two-dimensional high speed iterative search is used to optimize the merit function to generate a reference plane coincident with the spatial tilt of the phase profile. The invention enables real-time measurement of substrate height for preferred use in high-speed image processing operations relating to circuit-board production lines.
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Number of Claims:
33
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Owner
CyberOptics Corporation (Minneapolis, MN)
Published
September 5, 2000
Application Number
09/159,857
Filed
September 24, 1998
US Classification
382/154   382/150 382/151 382/168 382/294 702/153 702/40 702/94
Int'l Classification
G06T   7/00   (20060101)  
Examiner
Assistant Examiner
Parent Case
This is a Continuation of application Ser. No. 08/607,846 filed Feb. 27, 2996 now abandoned.
USPTO Field of Search
382/106   382/108   382/145   382/147   382/149   382/151   382/154   382/168   382/275   382/277   382/286   382/289   382/294   382/295   382/150   348/87   348/126   250/559.22   250/559.23   250/559.34   250/559.38   356/375   356/376   356/237.4   356/237.5   345/437   702/40   702/94   702/95   702/152   702/153  
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