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Scan path circuitry for programming a variable clock pulse width    
United States Patent6115836   
Link to this pagehttp://www.wikipatents.com/6115836.html
Inventor(s)Churchill; Jonathan F. (Reading, GB), Raftery; Neil P. (Guildford, GB), Hendry; Colin J. (South Maidenhead, GB), Shanmugam; Jeyakumar (San Jose, CA), Finn; Mark A. (Mountain View, CA), Surrette; Thomas M. (Saratoga, CA), Phelan; Cathal G. (Mountain View, CA), Pancholy; Ashish (Milpitas, CA)
AbstractA circuit for generating a pulse including a scan register having a first scan bit; first logic device receiving a first signal and generating a second signal; and a programmable delay circuit coupled to the scan register and the first logic device. The programmable delay circuit receives the second signal and generates a delayed second signal after a programmable period of time. The programmable period of time is determined by the first scan bit. The circuit also includes a logic circuit that recevies the second signal and the delayed second signal. The logic circuiit outputs the pulse having a pulse width proportional to the programmable period of time.
   














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Drawing from US Patent 6115836
Scan path circuitry for programming a variable clock pulse width - US Patent 6115836 Drawing
Scan path circuitry for programming a variable clock pulse width
Inventor     Churchill; Jonathan F. (Reading, GB) , Raftery; Neil P. (Guildford, GB) , Hendry; Colin J. (South Maidenhead, GB) , Shanmugam; Jeyakumar (San Jose, CA) , Finn; Mark A. (Mountain View, CA) , Surrette; Thomas M. (Saratoga, CA) , Phelan; Cathal G. (Mountain View, CA) , Pancholy; Ashish (Milpitas, CA)
Owner/Assignee     Cypress Semiconductor Corporation (San Jose, CA)
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Publication Date     September 5, 2000
Application Number     08/931,989
PAIR File History     Application Data   Transaction History
Image File Wrapper   Patent Term   Fees
Litigation
Filing Date     September 17, 1997
US Classification     714/726
Int'l Classification    
Examiner     De Cady; Albert
Assistant Examiner     Ton; Daird
Attorney/Law Firm     Wagner, Murabito & Hao LLP
Address
Parent Case     CROSS-REFERENCE TO RELATED APPLICATIONS This application may be related to U.S. patent application Ser. No. 08/932,315 entitled "SCAN PATH CIRCUITRY INCLUDING A PROGRAMMABLE DELAY CIRCUIT" (attorney docket no. 16820.P214), now U.S. Pat. No. 5,936,977, U.S. patent application Ser. No. 08/932,638 entitled "SCAN PATH CIRCUITRY INCLUDING AN OUTPUT REGISTER HAVING A FLOW THROUGH MODE" (attorney docket no. 16820.P215), now U.S. Pat. No. 5,953,285, and U.S. patent application Ser. No. 08/932,637 entitled "TEST MODE FEATURES FOR SYNCHRONOUS AND PIPELINED MEMORIES" (attorney docket no. 16820.P201) now U.S. Pat. No. 6,006,347.
Priority Data    
USPTO Field of Search     327/202 327/172 327/100 315/194 714/738 714/724 714/726 714/729 365/233 377/153
Patent Tags     scan path circuitry programming variable clock pulse width
   
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