High temperature, conductive thin film diffusion barrier for ceramic/metal systems

Claims

Thus, having described the invention, what is claimed is:

1. An interposer capacitor comprising:

a multilayer ceramic substrate comprising a plurality of ceramic layers having therein metallized circuitry, interconnecting metallized vias and bottom to top vias;

a thin film structure electrically connected to the multilayer ceramic substrate, the thin film structure containing at least one capacitor comprising at least one lower first electrode comprising a layer of first conductive material and an upper second electrode comprising a layer of second conductive material with a dielectric material therebetween with each electrode layer being connected by wiring to a corresponding pad on the surface of the thin film structure; and a barrier layer on the lower surface of the first conductive material, the barrier layer being between the first conductive material and the vias and metallized circuitry of the multilayer ceramic substrate.

2. The structure of claim 1 wherein the barrier layer comprises conductive materials, silicides or other low resistance inert materials.

3. The structure of claim 1 wherein the barrier layer is selected from the group consisting of tantalum silicon nitride, tantalum aluminum nitride, titanium silicon nitride, titanium nitride, tantalum nitride, tungsten nitride and titanium aluminum nitride.

4. The structure of claim 1 wherein the conductive materials are selected from the group consisting of platinum, iridium, ruthenium, palladium, gold, silver or alloys thereof or conductive oxides RuOx and IrOx.

5. The structure of claim 1 wherein the lower electrode comprises the layer of first conductive material and the barrier layer.

6. The structure of claim 1 wherein the dielectric material is selected from the group consisting of barium titanate, barium strontium titanate, strontium titanate, barium zirconate titanate, lead lanthanum zirconate titanate, lead zirconate titanate or tantalum oxide.

7. The Structure of claim 1 wherein the barrier layer is about 50 to 5000 .ANG. thick.

8. A multilayer electronic component comprising a lower electronic component and an upper electronic component which are electrically connected by the interposer capacitor of claim 1.

9. A method for fabricating an interposer capacitor comprising:

forming a thin film structure on the surface of a multilayer ceramic substrate having metallization therein, metal containing via interconnectings and bottom to top vias, the thin film structure containing at least one capacitor within said thin film structure comprising a first layer of conductive material as a lower first electrode, a dielectric material layer formed on the upper surface of the first electrode and an upper second layer of conductive material on the surface of the dielectric as a second electrode, the first electrode and second electrode being connected to corresponding pads on the surface of the thin film structure by separate wirings from each electrode, the lower first electrode having a barrier layer on the lower surface of the first electrode between the first electrode and the vias and metallization of the multilayer ceramic substrate.

10. The method of claim 9 wherein the barrier layer comprises conductive materials, silicides or other low resistance inert materials.

11. The method of claim 9 wherein the barrier layer is selected from the group consisting of tantalum silicon nitride, tantalum aluminum nitride, titanium silicon nitride, titanium nitride, tantalum nitride, tungsten nitride and titanium aluminum nitride.

12. The method of claim 9 wherein the conductive materials are selected from the group consisting of platinum, iridium, ruthenium, palladium, gold, silver or alloys thereof or conductive oxides RuOx and IrOx.

13. The method of claim 9, wherein the lower first electrode comprises the layer of first conductive material and the barrier layer.

14. The method of claim 8 wherein the dielectric material is selected from the group consisting of barium titanate, barium strontium titanate, strontium titanate, barium zirconate titanate, lead lanthanum zirconate titanate, lead zirconate titanate or tantalum oxide.

15. The method of claim 9 wherein the barrier layer is about 50 to 5000 .ANG. thick.