A three-dimensional image is derived from two-dimensional images. At least one of the two-dimensional images has a predetermined number of pixels. Depth measurements are derived from the two-dimensional images. The number of derived depth measurements is substantially equal to the predetermined number of pixels. The three-dimensional image is derived from the two-dimensional digital images and the depth measurements.
CROSS REFERENCE TO RELATED APPLICATIONS
This application claims the benefit of U.S. Provisional Patent Application Serial No. 60/054,113, filed on Jul. 29, 1997, which is incorporated by reference.
The system and method speeds up the image composition process based upon the blurring function and the blurring function determination process; facilitates the confirmation and correction of the blurring function determination results; determines the relative position of image data and to enable the position match for the difficult image data that is corrected for the zoom ratio; and facilitates the confirmation and the correction of the image data relative positioning results.
A method and arrangement are disclosed for increasing the depth contrast in microscope imaging. The method and implementation described can be designated as structured illumination for generating quasi-confocal optical sections. In implementing the method, a grating structure located in the field diaphragm plane of a microscope, the object plane and the TV intermediate image plane of a microscope are arranged confocally. The term "confocally" refers to the fact that the grating, object and the intermediate image plane are positioned on optically conjugate planes. By this arrangement, the grating structure is projected in the object plane of the microscope and the object which is structured in this way is imaged in the TV intermediate image plane of the microscope by the optical system following it. Optical sections are generated by calculating the modulation depth of the structured object. Three-dimensional acquisition of the object is achieved in that the object is imaged in a plurality of focus planes at right angles to the direction of observation and is detected using an array detector (e.g., CCD camera). The method and implementation of structured illumination described herein can primarily be used in reflection microscopy and fluorescence microscopy. In principle, the method can be applied for all linear interactions between light and matter. The use of the method is likewise not limited to the field of microscopy.
A display for use in a printed circuit board inspection system for inspecting objects on a printed circuit board is capable of displaying a greater-than-two dimensional image of the shape of the surface of an object resident on the printed circuit board in at least two dimensions. The image of the object is generated based on optical imaging of the object under different illumination configurations.
A three-dimensional optical inspection system reconstructs a three-dimensional image of the shape of the surface of an at least partially specular object resident on a printed circuit board by capturing two or more two-dimensional images of the object under different illumination configurations. The diffuse reflection, as well as the specular reflection can be used to reconstruct the three-dimensional image using any reconstruction method, such as photometric stereo. The different illumination configurations can be achieved using an illumination source including light-emitting elements arranged in concentric circular arrays, in which each of the circular arrays is divided into sections. Each section is independently controlled to selectively activate the sections to illuminate the object in a pre-established illumination pattern.
Reconstructing the shape of the surface of an object in greater than two dimensions is performed using a noise-tolerant reconstruction process and/or a multi-resolution reconstruction process. The noise-tolerant reconstruction process can be a Bayesian reconstruction process that adds noise information representing the noise distribution in optical image(s) of the object to surface gradient information estimated from the images to determine surface height information that defines the shape of the surface of the object in greater than two dimensions. In the multi-resolution reconstruction process, for each resolution of the image, the surface gradient information is estimated and the surface height information is calculated using the estimated surface gradient information. To obtain the final surface height map, the surface height information from each resolution is combined to reconstruct the shape of the surface of the object in greater than two dimensions. The multi-resolution reconstruction process can be used with the Bayesian reconstruction process or with another decomposition process, such as a wavelet decomposition process.
