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High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor    
United States Patent6255666   
Link to this pagehttp://www.wikipatents.com/6255666.html
Inventor(s)Brunfeld; Andrei (Bat-Yam, IL); Shamir; Joseph (Haifa, IL); Toker; Gregory (Jerusalem, IL); Singher; Liviu (Haifa, IL); Laver; Ilan (Kefar Saba, IL); Pekel; Ely (Kefar Saba, IL)
AbstractAn optical inspection apparatus operates at high speed at very high resolution for detecting defects in transparent flat panels in a production environment. This apparatus uses a laser which provides a light beam directed to a polygon scanner, which provides a linear scan of the beam along the width of the flat panel. The flat panel to be inspected is moved such that its entire surface passes the scan path of the light beam. The light beam passes through the transparent flat panel, and is reflected off a spherical mirror, back through the transparent flat panel, and returns to the scanning optics and the polygon scanner in a path coincident with the transmitted light beam. The reflected light beam is distinguished from the transmitted light beam by using a beam splitter to direct the reflected light beam to a parallel detector array, which detects changes in the nominal Gaussian distribution of the light beam that correspond to defects in the surface of the transparent flat panel above a programmable threshold level. This parallel detection method allows the inspection apparatus to identify defects much smaller than the diffraction limits of the optics used, and will accurately identify changes in the light beam caused by defects in the flat panel. An automatic flat panel handler loads untested flat panels into the apparatus and unloads and sorts tested flat panels according to the results of the inspection.
   














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Drawing from US Patent 6255666
High speed optical inspection apparatus for a large transparent flat panel

     using gaussian distribution analysis and method therefor - US Patent 6255666 Drawing
High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor
Inventor     Brunfeld; Andrei (Bat-Yam, IL); Shamir; Joseph (Haifa, IL); Toker; Gregory (Jerusalem, IL); Singher; Liviu (Haifa, IL); Laver; Ilan (Kefar Saba, IL); Pekel; Ely (Kefar Saba, IL)
Owner/Assignee     Brown & Sharpe Surface Inspection Systems, Inc. (North Kingstown, RI)
Patent assignment
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Publication Date     July 3, 2001
Application Number     07/985,629
PAIR File History     Application Data   Transaction History
Image File Wrapper   Patent Term   Fees
Litigation
Filing Date     December 3, 1992
US Classification     250/559.45 356/239.1
Int'l Classification     G01H 021/88
Examiner     Allen; Stephone B.
Assistant Examiner    
Attorney/Law Firm     Wolf, Greenfield & Sacks, P.C.
Address
Parent Case     RELATED APPLICATIONS This patent application is related to three other U.S. patent applications entitled: "High Speed Optical Inspection Apparatus and Method", "High Speed Optical Inspection Apparatus for a Transparent Disk and Method Therefor", and "High Speed Optical Inspection Apparatus for a Reflective Disk and Method Therefor", which are assigned to the same assignee as this patent application and which are filed on the same date as the date of this patent application.
Priority Data    
USPTO Field of Search     250/234 250/235 250/236 250/562 250/563 250/559.45 250/559.48 250/559.49 356/238 356/239 356/429 356/430 356/431 356/237.2 356/239.1 364/507 209/588
Patent Tags     high speed optical inspection large transparent flat panel gaussian distribution analysis
   
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ReferenceRelevancyCommentsReferenceRelevancyComments
5157266
Schmiedl
250/559.17
Oct,1992

[0 after 0 votes]
5026983
Meyn
250/223R
Jun,1991

[0 after 0 votes]
4725139
Hack
356/237.1
Feb,1988

[0 after 0 votes]
4570074
Jette
250/559.49
Feb,1986

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4455086
West
356/239.1
Jun,1984

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4376583
Alford
356/237.2
Mar,1983

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Slaker
356/431
May,1981

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Merlen
356/431
Aug,1975

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What is claimed is:

1. An optical inspection apparatus for inspecting a transparent flat panel comprising, in combination:

computer means for controlling said apparatus;

operator interface means coupled to said computer means for providing input data from an operator to said computer means and for providing output data from said computer means to said operator;

an optical inspection assembly, coupled to said computer means having output means for reporting to said computer means results of an inspection performed by said optical inspection assembly, comprising inspection means consisting of detector means for detecting changes of a normal Gaussian distribution of a light beam passing through a transparent flat panel; and

said transparent flat panel which is placed in said optical inspection assembly to inspect said transparent flat panel for surface defects.

2. The apparatus of claim 1 further comprising automatic media handling means coupled to said computer means for loading under control of said computer means said transparent flat panel into said optical inspection assembly and for unloading under control of said computer means said transparent flat panel out of said optical inspection assembly.

3. The apparatus of claim 1 wherein said computer means comprising, in combination:

an IBM compatible personal computer; and

control software means loaded into memory of said IBM compatible personal computer for determining function and sequence of operations of said apparatus.

4. The apparatus of claim 3 wherein said control software comprising:

a main control program; and

a plurality of device drivers which provide subroutines for said main control program and which control individual components of said apparatus.

5. The apparatus of claim 1 wherein said computer means periodically polls said output means of said optical inspection assembly to determine whether a surface defect has been detected by said optical inspection assembly.

6. The apparatus of claim 1 wherein said output means of said optical inspection means is coupled to said computer means such that said output means interrupts said computer means when a surface defect is detected by said optical inspection assembly.

7. The apparatus of claim 1 wherein said operator interface means comprising, in combination:

keyboard means coupled to said computer means for providing said input data from said operator to said computer means; and

display means coupled to said computer means for displaying said output data from said computer means to said operator.

8. The apparatus of claim 7 wherein said operator interface means further comprising printer means for printing said output data from said computer means.

9. The apparatus of claim 7 wherein said operator interface means further comprising operator panel means having knobs and switches for selecting one of a plurality of detection thresholds for said optical inspection assembly.

10. The apparatus of claim 7 including means for permitting said operator to select one of a plurality of detection thresholds for said optical inspection assembly via said keyboard means.

11. The apparatus of claim 2 wherein said automatic media handling means comprising, in combination:

at least one input tray wherein said transparent flat panel is placed prior to inspection by said apparatus;

at least one movable gripper hand located in proximity to said input tray for gripping and transporting said transparent flat panel from said input tray to said optical inspection assembly;

a first output tray located in proximity to said movable gripper hand such that said transparent flat panel is moved from said optical inspection assembly to said first output tray by said movable gripper hand if said output of said optical inspection assembly signals to said computer means that said transparent flat panel has no surface defects; and

a second output tray located in proximity to said movable gripper hand such that said transparent flat panel is moved from said optical inspection assembly to said second output tray by said movable gripper hand if said output of said optical inspection assembly signals to said computer means that said transparent flat panel has surface defects.

12. The apparatus of claim 1 wherein said optical inspection assembly comprising, in combination:

flat panel movement actuator means in physical proximity to said inspection means for moving said transparent flat panel to allow said inspection means to fully inspect said transparent flat panel for surface defects; and

flat panel movement driver means electrically coupled to said flat panel movement actuator means and to said computer means for allowing said computer means to control said flat panel movement actuator means by providing appropriate commands to said flat panel movement driver means.

13. The apparatus of claim 12 wherein said flat panel movement actuator means comprising a lifter having a notch wherein an edge of said flat panel is placed and wherein said optical inspection assembly providing a linear sweep of a light beam on a flat surface of said flat panel, said lifter having a range of motion in a direction normal to a plane created by said linear sweep of said light beam, said lifter being coupled to and controlled by said computer means.

14. The apparatus of claim 12 wherein said inspection means is a surface inspection assembly means comprising, in combination:

a light source providing said light beam;

optical scanner means in physical proximity to said light source for permitting said light beam to contact said optical scanner means and for reflecting said light beam thereby providing a linear sweep of said light beam;

scanning optics means having a front face portion and a rear face portion for permitting said linear sweep of said light beam to contact said front face portion of said scanning optics means for causing said light beam that contacts said front face portion to exit said rear face portion and to contact said transparent flat panel;

spherical mirror means for reflecting said light beam after passing through said transparent flat panel back through said transparent flat panel to said scanning optics means in a path. coincident with said light beam being directed to said transparent flat panel;

trigger detector means coupled to said computer means and placed within said linear sweep of said light beam for providing a synchronizing electrical signal to said computer means for indicating a position of said light beam along said linear sweep;

beam splitter means through which said light beam passes for separating said light beam being reflected by said spherical mirror means from said light beam being directed to said transparent flat panel;

said detector means receiving said light beam from said beam splitter means and detecting changes of a nominal Gaussian distribution of said light beam, wherein said changes correspond to and identify defects in said flat surface of said transparent flat panel.

15. The apparatus of claim 14 wherein said light source comprising a laser diode and said light beam comprising a laser beam from said laser diode.

16. The apparatus of claim 14 wherein said light source comprising a helium-neon laser, and said light beam comprising a laser beam from said helium-neon laser.

17. The apparatus of claim 14 wherein said optical scanner means having a motor-driven polygonal head coupled to said computer means and having reflective faces such that said light beam contacts said reflective faces of said polygonal head, and having means for rotating of said polygonal head for causing said light beam reflected off said reflective faces to create said linear sweep of said light beam across said scanning optics means.

18. The apparatus of claim 17 wherein said motor-driven polygonal head is turned on and off by said computer means.

19. The apparatus of claim 14 wherein said optical scanner means being located at a distance from said scanning optics means less than the focal length of said scanning optics means.

20. The apparatus of claim 14 wherein said scanning optics means focus said light beam on said transparent flat panel.

21. The apparatus of claim 14 wherein said trigger detector means comprising an optical sensor having an electrical output corresponding to the presence of said light beam on said optical sensor which is coupled to said computer means.

22. The apparatus of claim 21 wherein said optical sensor comprising a photodiode.

23. The apparatus of claim 21 wherein said optical sensor comprising a charge-coupled device (CCD).

24. The apparatus of claim 14 wherein said detector means comprising, in combination:

at least two optical detectors having electrical outputs, said optical detectors functioning in parallel; and

electronic circuitry means for processing said electrical outputs of said optical detectors and generating an electrical signal to said computer means comprising, in combination:

first input means coupled to said electrical outputs of said optical detectors for monitoring said electrical outputs;

second input means coupled to said computer means for receiving a threshold value from said computer means;

processing means coupled to said first input means and to said second input means for measuring said electrical outputs of said optical detectors and for determining the existence of changes of said nominal Gaussian distribution of said light beam above said threshold value on said second input means; and

output means coupled to said computer means for signaling an occurrence of a change above said threshold value to said computer means.

25. The apparatus of claim 24 wherein said optical detectors comprise photodiodes.

26. The apparatus of claim 24 wherein said optical detectors comprise charge-coupled devices (CCDs).

27. The apparatus of claim 24 wherein said optical detectors are arranged in rows and columns to form a substantially square matrix.

28. The apparatus of claim 24 wherein said optical detectors are arranged in a series of concentric circular rings.

29. The apparatus of claim 14 further comprising filter optics means for increasing spatial coherence of said light beam.

30. A method for inspecting a transparent flat panel using an optical inspection apparatus including the steps of:

providing computer means for controlling said apparatus;

providing operator interface means coupled to said computer means for providing input data from an operator to said computer means and for providing output data from said computer means to said operator;

providing an optical inspection assembly, coupled to said computer means having output means for reporting to said computer means results of an inspection performed by said optical inspection assembly, comprising inspection means consisting of detector means for detecting changes of a nominal Gaussian distribution of a light beam passing through a transparent flat panel; and

providing said transparent flat panel which is placed in said optical inspection assembly to inspect said transparent flat panel for surface defects.

31. The method of claim 30 further comprising the step of providing automatic media handling means coupled to said computer means for loading under control of said computer means said transparent flat panel into said optical inspection assembly and for unloading under control of said computer means said transparent flat panel out of said optical inspection assembly.

32. The method of claim 30 wherein said computer means comprising, in combination:

an IBM compatible personal computer; and

control software means loaded into memory of said IBM compatible personal computer for determining function and sequence of operations of said apparatus.

33. The method of claim 30 wherein said computer means periodically polls said output means of said optical inspection assembly to determine whether a surface defect has been detected by said optical inspection assembly.

34. The method of claim 30 wherein said output means of said optical inspection means is coupled to said computer means such that said output means interrupts said computer means when a surface defect is detected by said optical inspection assembly.

35. The method of claim 30 wherein said operator interface means comprising, in combination:

keyboard means coupled to said computer means for providing said input data from said operator to said computer means; and

display means coupled to said computer means for displaying said output data from said computer means to said operator.

36. The method of claim 35 wherein said operator interface means further comprising operator panel means having knobs and switches for selecting one of a plurality of detection thresholds for said optical inspection assembly.

37. The method of claim 35 including means for permitting said operator to select one of a plurality of detection thresholds for said optical inspection assembly via said keyboard means.

38. The method of claim 31 wherein said automatic media handling means comprising, in combination:

at least one input tray wherein said transparent flat panel is placed prior to inspection by said apparatus;

at least one movable gripper hand located in proximity to said input tray for gripping and transporting said transparent flat panel from said input tray to said optical inspection assembly;

a first output tray located in proximity to said movable gripper hand such that said transparent flat panel is moved from said optical inspection assembly to said first output tray by said movable gripper hand if said output of said optical inspection assembly signals to said computer means that said transparent flat panel has no surface defects; and

a second output tray located in proximity to said movable gripper hand such that said transparent flat panel is moved from said optical inspection assembly to said second output tray by said movable gripper hand if said output of said optical inspection assembly signals to said computer means that said transparent flat panel has surface defects.

39. The method of claim 30 wherein said optical inspection assembly comprising, in combination:

flat panel movement actuator means in physical proximity to said inspection means for moving said transparent flat panel to allow said inspection means to fully inspect said transparent flat panel for surface defects; and

flat panel movement driver means electrically coupled to said flat panel movement actuator means and to said computer means for allowing said computer means to control said flat panel movement actuator means by providing appropriate commands to said flat panel movement driver means.

40. The method of claim 39 wherein said flat panel movement actuator means comprising a lifter having a notch wherein an edge of said flat panel is placed and wherein said optical inspection assembly providing a linear sweep of a light beam on said flat surface of said flat panel, said lifter having a range of motion in a direction normal to a plane created by said linear sweep of said light beam, said lifter being coupled to and controlled by said computer means.

41. The method of claim 39 wherein said inspection means comprises surface inspection assembly means comprising, in combination:

a light source providing said light beam;

optical scanner means in physical proximity to said light source for permitting said light beam to contact said optical scanner means and for reflecting said light beam thereby providing a linear sweep of said light beam;

scanning optics means having a front face portion and a rear face portion for permitting said linear sweep of said light beam to contact said front face portion of said scanning optics means for causing said light beam that contacts said front face portion to exit said rear face portion and to contact said transparent flat panel;

spherical mirror means for reflecting said light beam after passing through said transparent flat panel back through said transparent flat panel to said scanning optics means in a path coincident with said light beam being directed to said transparent flat panel;

trigger detector means coupled to said computer means and placed within said linear sweep of said light beam for providing a synchronizing electrical signal to said computer means for indicating a position of said light beam along said linear sweep;

beam splitter means through which said light beam passes for separating said light beam being reflected by said spherical mirror means from said light beam being directed to said transparent flat panel;

said detector means for receiving said light beam from said beam splitter means and for detecting changes of a nominal Gaussian distribution of said light beam, said changes corresponding to and identifying defects in said flat surface of said transparent flat panel.

42. The method of claim 41 wherein said optical scanner means having a motor-driven polygonal head coupled to said computer means and having reflective faces such that said light beam contacts said reflective faces of said polygonal head, and having means for rotating said polygonal head for causing said light beam reflected off said reflective faces to create said linear sweep of said light beam across said scanning optics means.

43. The method of claim 42 wherein said motor-driven polygonal head is turned on and off by said computer means.

44. The method of claim 41 wherein said optical scanner means being located at a distance from said scanning optics means less than the focal length of said scanning optics means.

45. The apparatus of claim 41 wherein said scanning optics means focus said light beam on said transparent flat panel.

46. The method of claim 41 wherein said trigger detector means comprising an optical sensor having an electrical output corresponding to the presence of said light beam on said optical sensor which is coupled to said computer means.

47. The method of claim 41 wherein said detector means comprising, in combination:

at least two optical detectors having electrical outputs, said optical detectors functioning in parallel; and

electronic circuitry means for processing said electrical outputs of said optical detectors and generating an electrical signal to said computer means comprising, in combination:

first input means coupled to said electrical outputs of said optical detectors for monitoring said electrical outputs;

second input means coupled to said computer means for receiving a threshold value from said computer means;

processing means coupled to said first input means and to said second input means for measuring said electrical outputs of said optical detectors and for determining the existence of changes of said nominal Gaussian distribution of said light beam above said threshold value on said second input means; and

output means coupled to said computer means for signaling an occurrence of a change above said threshold value to said computer means.

48. The method of claim 47 wherein said optical detectors are arranged in rows and columns to form a substantially square matrix.

49. The method of claim 47 wherein said optical detectors are arranged in a series of concentric circular rings.

50. The method of claim 41 further comprising the steps of:

loading said transparent flat panel into said flat panel movement actuator means in said optical inspection assembly;

activating said surface inspection assembly means with said computer means;

said computer means providing commands to said flat panel movement driver, thereby causing said flat panel movement actuator to move said transparent flat panel such that the entirety of said flat surface is inspected;

checking with said computer means said output of said optical inspection assembly to determine whether a defect was detected by said optical inspection assembly; and

unloading said transparent flat panel from said optical inspection assembly into a first destination if said output on said optical inspection assembly did not indicate the presence of a defect on said transparent flat panel, and unloading said transparent flat panel from said optical inspection assembly into a second destination if said output of said optical inspection assembly did indicate the presence of a defect on said transparent flat panel.

51. An apparatus for optically scanning a transparent flat panel comprising, in combination:

a light source providing a light beam;

light beam reflecting means for reflecting said light beam for providing a linear sweep of said light beam;

a transparent flat panel having a flat surface to be inspected positioned in said linear sweep of said light beam;

detector means for receiving said light beam after it has passed through said transparent flat panel and for detecting changes of a nominal Gaussian distribution of said light beam corresponding to defects in said flat surface of said transparent flat panel; and

means for moving said transparent flat panel within said linear sweep of said light beam and for permitting a linear scan of said flat surface for complete scanning of all of said flat surface to be inspected.

52. The apparatus of claim 51 wherein said light source comprising a laser diode and said light beam comprising a laser beam from said laser diode.

53. The apparatus of claim 51 wherein said light source comprising a helium-neon laser, and said light beam comprising a laser beam from said helium-neon laser.

54. The apparatus of claim 51 wherein said light beam reflecting means comprising an optical scanner.

55. The apparatus of claim 54 wherein said optical scanner having a motor-driven polygonal head having reflective faces positioned to permit said light beam to contact said reflective faces of said polygonal head, and having means for rotating said polygonal head for causing said light beam reflected off said reflective faces to create said linear sweep of said light beam.

56. The apparatus of claim 51 wherein said means for moving said transparent flat panel comprising a lifter having a notch wherein an edge of said flat panel is placed, said lifter having a range of motion in a direction normal to a plane created by said linear sweep of said light beam, said lifter being coupled to and controlled by said computer means.

57. A method for optically scanning a transparent flat panel comprising, in combination:

providing a light source having a light beam;

providing light beam reflecting means for reflecting said light beam for providing a linear sweep of said light beam;

providing a transparent flat panel having a flat surface to be inspected positioned in said linear sweep of said light beam;

providing detector means for receiving said light beam after it has passed through said transparent flat panel and for detecting changes of a nominal Gaussian distribution of said light beam corresponding to defects in said flat surface of said transparent flat panel; and

providing means for moving said transparent flat panel within said linear sweep of said light beam and for permitting a linear scan of said flat surface for complete scanning of all of said flat surface to be inspected.

58. The method of claim 57 wherein said light beam reflecting means comprising an optical scanner.

59. The method of claim 58 wherein said optical scanner having a motor-driven polygonal head having reflective faces positioned to permit said light beam to contact said reflective faces of said polygonal head, and having means for rotating said polygonal head for causing said light beam reflected off said reflective faces to create said linear sweep of said light beam.

60. The method of claim 57 wherein said means for moving said transparent flat panel comprising a lifter having a notch wherein an edge of said flat panel is placed, said lifter having a range of motion in a direction normal to a plane created by said linear sweep of said light beam.

61. The method of claim 57 further comprising detector means for receiving said light beam and for detecting changes of a nominal Gaussian distribution of said light beam corresponding to defects in said flat surface of said transparent flat panel.

62. The method of claim 57 further comprising the steps of:

placing said transparent flat panel into said means for moving said transparent flat panel; and

activating said means for moving said transparent flat panel causing all of said flat surface to pass through said linear sweep of said light beam.

63. An apparatus for detecting surface defects in a transparent flat panel comprising, in combination:

a light source providing a light beam;

light beam reflecting means for reflecting said light beam for providing a linear sweep of said light beam;

a transparent flat panel having a flat surface to be inspected positioned in said linear sweep of said light beam;

means for moving said transparent flat panel within said linear sweep of said light beam and for permitting a linear scan of said flat surface for complete scanning of all of said flat surface to be inspected; and

detector means for measuring changes in said light beam corresponding to defects on said flat surface of said transparent flat panel, wherein said detector means receives said light beam after it has passed through said transparent flat panel and detects changes of a nominal Gaussian distribution of said light beam, said changes corresponding to defects in said flat surface of said transparent flat panel.

64. The apparatus of claim 63 wherein said light source comprising a laser diode and said light beam comprising a laser beam from said laser diode.

65. The apparatus of claim 63 wherein said light source comprising a helium-neon laser, and said light beam comprising a laser beam from said helium-neon laser.

66. The apparatus of claim 63 wherein said light beam reflecting means comprising an optical scanner.

67. The apparatus of claim 66 wherein said optical scanner having a motor-driven polygonal head having reflective faces positioned to permit said light beam to contact said reflective faces of said polygonal head, and having means for rotating said polygonal head for causing said light beam reflected off said reflective faces to create said linear sweep of said light beam.

68. The apparatus of claim 63 wherein said means for moving said transparent flat panel comprising a lifter having a notch wherein an edge of said flat panel is placed, said lifter having a range of motion in a direction normal to a plane created by said linear sweep of said light beam.

69. The apparatus of claim 63 wherein said detector means comprising, in combination:

at least two optical detectors having electrical outputs, said optical detectors functioning in parallel; and

electronic circuitry means for processing said electrical outputs of said optical detectors and generating an electrical signal output in response to changes of a nominal Gaussian distribution of said light beam above a selectable threshold value.

70. A method for detecting surface defects in flat media comprising, in combination:

providing a light source having a light beam;

providing light beam reflecting means for reflecting said light beam for providing a linear sweep of said light beam;

providing a transparent flat panel having a flat surface to be inspected positioned in said linear sweep of said light beam;

providing means for moving said transparent flat panel within said linear sweep of said light beam and for permitting a linear scan of said flat surface for complete scanning of all of said flat surface to be inspected; and

providing detector means for measuring changes in said light beam corresponding to defects on said flat surface of said transparent flat panel, wherein said detector means receives said light beam after it has passed through said transparent flat panel and detects changes of a nominal Gaussian distribution of said light beam, said changes corresponding to defects in said flat surface of said unit test.

71. The method of claim 70 wherein said light beam reflecting means comprising an optical scanner.

72. The method of claim 71 wherein said optical scanner having a motor-driven polygonal head having reflective faces positioned to permit said light beam to contact said reflective faces of said polygonal head, and having means for rotating said polygonal head for causing said light beam reflected off said reflective faces to create said linear sweep of said light beam.

73. The method of claim 70 wherein said means for moving said transparent flat panel comprising a lifter having a notch wherein an edge of said flat panel is placed, said lifter having a range of motion in a direction normal to a plane created by said linear sweep of said light beam.

74. The method of claim 70 wherein said detector means comprising, in combination:

at least two optical detectors having electrical outputs, said optical detectors functioning in parallel; and

electronic circuitry means for processing said electrical outputs of said optical detectors and generating an electrical signal output in response to changes of a nominal Gaussian distribution of said light beam above a selectable threshold value.

75. The method of claim 70 further comprising the steps of:

placing said transparent flat panel into said means for moving said transparent flat panel;

activating said means for moving said transparent flat panel causing all of said flat surface to pass through said linear sweep of said light beam; and

activating said detector means.
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FIELD OF THE INVENTION

This invention generally relates to optical apparatus and methods, and relates, more specifically, to an optical inspection apparatus and method for detecting faults in a flat, polished flat panel, such as those commonly used in Liquid Crystal Display (LCD) panels. This apparatus inspects with high resolution at high speed with automatic handling of the flat panel to allow the apparatus to be used effectively in a production inspection environment.

DESCRIPTION OF THE PRIOR ART

Flat panels for LCD panels require a surface that is flat to a high degree of accuracy, and that is free from defects such as scratches and chips. Some optical inspection systems have been used with limited success in inspecting transparent flat panels, but do not provide the accuracy or speed that is needed in a production environment.

Dark field microscopes and scatterometers are inspection apparatus well-known in the art. A dark field microscope can somewhat accurately locate surface defects, but takes too long to inspect to be effectively used in a production environment. A scatterometer is faster than a dark field microscope, but has less accuracy (detects fewer defects). Both the dark field microscope and the scatterometer have low detection sensitivity to shallow defects or defects that have a depth less than the wavelength of the light used, which cause a phase shift in the light beam but do not diffuse (scatter) the light in different directions. An interferometer, which is well-known in the art, is suitable to detecting phase shifts, but takes substantial time and effort to set up, limiting its use to laboratory environments.

The inherent limitations of the prior art inspection systems have limited their use in industrial production environments. Indeed, the most common inspection method used in a production environment is a manual, visual inspection by human inspectors, which hold the flat panel in their hands and move the flat panel in ambient or special light looking for the presence of scratches, chips and other defects. This inspection method is labor intensive, relatively slow, and subject to human errors such as missed defects which the human eye cannot easily distinguish.

Therefore, there existed a need to provide a high speed optical inspection system and method which has a high sensitivity to defects which can be used to inspect transparent flat panels in a production environment. This inspection system includes automatic handling of the flat panels, high speed inspection, and high resolution to detect defects smaller that the spot size of the beam and/or more shallow than the wavelength of light used. The increased speed of this apparatus increases throughput of the production system, and assures that any mistakes or defects introduced by human inspectors is eliminated.

SUMMARY OF THE INVENTION

It is an object of this invention to provide a high-speed optical inspection apparatus and method suitable for production testing of transparent flat panels.

It is another object of this invention to provide a high speed optical inspection apparatus and method which is computer-controlled using an IBM PC-AT computer or equivalent.

It is a further object of this invention to provide a high speed optical inspection apparatus and method with surface inspection which has a high speed optical scanner to provide linear movement of the beam across one axis of the flat panel, and a flat panel actuator to move the flat panel, thereby positioning each portion of the flat panel in the path of the linear movement of the beam, thereby completely inspecting the entire face surface of the flat panel.

It is yet another object of this invention to provide a high speed optical inspection apparatus and method which has an Automatic Flat Panel Handler for automatically loading the flat panels into the apparatus and for automatically unloading the flat panels from the apparatus.

It is a still further object of this invention to provide a high speed optical inspection apparatus and method which detects both phase and amplitude changes of the light beam using multiple detectors to sense changes in the nominal Gaussian distribution of the light beam.

It is yet another object of this invention to provide a high speed optical inspection apparatus and method which has a trigger detector within the path of the scanning light beam to provide a signal to synchronize the controlling computer to the scan of the light beam.

According to the preferred embodiment of the present invention, an optical inspection apparatus for inspecting a transparent flat panel is provided. This inspection apparatus is controlled by an IBM PC-AT computer or equivalent, and has a typical color monitor, printer and keyboard. An Optical Inspection Assembly is provided which comprises a Surface Inspection Assembly. The Surface Inspection Assembly nominally comprises a laser light source which transmits a light beam, a high-speed Optical Scanner, Scanning Optics, a beam splitter, optional Detection Optics, and a Parallel Detector Array within a Detector. In this configuration the light beam in the Surface Inspection Assembly originates in the laser, is transmitted through a filter, and is transmitted to the Optical Scanner, which reflects the light beam off the moving polygonal scanner head, causing the light beam to sweep across the Scanning Optics.

The size of a flat panel can be much greater than the size of a practical lens. Placing the Optical Scanner at a distance from the Scanning Optics less than the focal length of the Scanning Optics causes the light beam to diverge at the Scanning Optics, making the beam sweep a distance larger than the diameter of the lens. The beam is focused at the center of the transparent flat panel media by the Scanning optics. On the opposit