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| United States Patent | 6255666 |
| Link to this page | http://www.wikipatents.com/6255666.html |
| Inventor(s) | Brunfeld; Andrei (Bat-Yam, IL);
Shamir; Joseph (Haifa, IL);
Toker; Gregory (Jerusalem, IL);
Singher; Liviu (Haifa, IL);
Laver; Ilan (Kefar Saba, IL);
Pekel; Ely (Kefar Saba, IL) |
| Abstract | An optical inspection apparatus operates at high speed at very high
resolution for detecting defects in transparent flat panels in a
production environment. This apparatus uses a laser which provides a light
beam directed to a polygon scanner, which provides a linear scan of the
beam along the width of the flat panel. The flat panel to be inspected is
moved such that its entire surface passes the scan path of the light beam.
The light beam passes through the transparent flat panel, and is reflected
off a spherical mirror, back through the transparent flat panel, and
returns to the scanning optics and the polygon scanner in a path
coincident with the transmitted light beam. The reflected light beam is
distinguished from the transmitted light beam by using a beam splitter to
direct the reflected light beam to a parallel detector array, which
detects changes in the nominal Gaussian distribution of the light beam
that correspond to defects in the surface of the transparent flat panel
above a programmable threshold level. This parallel detection method
allows the inspection apparatus to identify defects much smaller than the
diffraction limits of the optics used, and will accurately identify
changes in the light beam caused by defects in the flat panel. An
automatic flat panel handler loads untested flat panels into the apparatus
and unloads and sorts tested flat panels according to the results of the
inspection. |
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Title Information  |
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Drawing from US Patent 6255666 |
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High speed optical inspection apparatus for a large transparent flat panel
using gaussian distribution analysis and method therefor |
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| Publication Date |
July 3, 2001 |
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| Filing Date |
December 3, 1992 |
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| Parent Case |
RELATED APPLICATIONS
This patent application is related to three other U.S. patent applications
entitled: "High Speed Optical Inspection Apparatus and Method", "High
Speed Optical Inspection Apparatus for a Transparent Disk and Method
Therefor", and "High Speed Optical Inspection Apparatus for a Reflective
Disk and Method Therefor", which are assigned to the same assignee as this
patent application and which are filed on the same date as the date of
this patent application. |
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Title Information  |
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References  |
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Market Review  |
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Technical Review  |
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Claims  |
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What is claimed is:
1. An optical inspection apparatus for inspecting a transparent flat panel
comprising, in combination:
computer means for controlling said apparatus;
operator interface means coupled to said computer means for providing input
data from an operator to said computer means and for providing output data
from said computer means to said operator;
an optical inspection assembly, coupled to said computer means having
output means for reporting to said computer means results of an inspection
performed by said optical inspection assembly, comprising inspection means
consisting of detector means for detecting changes of a normal Gaussian
distribution of a light beam passing through a transparent flat panel; and
said transparent flat panel which is placed in said optical inspection
assembly to inspect said transparent flat panel for surface defects.
2. The apparatus of claim 1 further comprising automatic media handling
means coupled to said computer means for loading under control of said
computer means said transparent flat panel into said optical inspection
assembly and for unloading under control of said computer means said
transparent flat panel out of said optical inspection assembly.
3. The apparatus of claim 1 wherein said computer means comprising, in
combination:
an IBM compatible personal computer; and
control software means loaded into memory of said IBM compatible personal
computer for determining function and sequence of operations of said
apparatus.
4. The apparatus of claim 3 wherein said control software comprising:
a main control program; and
a plurality of device drivers which provide subroutines for said main
control program and which control individual components of said apparatus.
5. The apparatus of claim 1 wherein said computer means periodically polls
said output means of said optical inspection assembly to determine whether
a surface defect has been detected by said optical inspection assembly.
6. The apparatus of claim 1 wherein said output means of said optical
inspection means is coupled to said computer means such that said output
means interrupts said computer means when a surface defect is detected by
said optical inspection assembly.
7. The apparatus of claim 1 wherein said operator interface means
comprising, in combination:
keyboard means coupled to said computer means for providing said input data
from said operator to said computer means; and
display means coupled to said computer means for displaying said output
data from said computer means to said operator.
8. The apparatus of claim 7 wherein said operator interface means further
comprising printer means for printing said output data from said computer
means.
9. The apparatus of claim 7 wherein said operator interface means further
comprising operator panel means having knobs and switches for selecting
one of a plurality of detection thresholds for said optical inspection
assembly.
10. The apparatus of claim 7 including means for permitting said operator
to select one of a plurality of detection thresholds for said optical
inspection assembly via said keyboard means.
11. The apparatus of claim 2 wherein said automatic media handling means
comprising, in combination:
at least one input tray wherein said transparent flat panel is placed prior
to inspection by said apparatus;
at least one movable gripper hand located in proximity to said input tray
for gripping and transporting said transparent flat panel from said input
tray to said optical inspection assembly;
a first output tray located in proximity to said movable gripper hand such
that said transparent flat panel is moved from said optical inspection
assembly to said first output tray by said movable gripper hand if said
output of said optical inspection assembly signals to said computer means
that said transparent flat panel has no surface defects; and
a second output tray located in proximity to said movable gripper hand such
that said transparent flat panel is moved from said optical inspection
assembly to said second output tray by said movable gripper hand if said
output of said optical inspection assembly signals to said computer means
that said transparent flat panel has surface defects.
12. The apparatus of claim 1 wherein said optical inspection assembly
comprising, in combination:
flat panel movement actuator means in physical proximity to said inspection
means for moving said transparent flat panel to allow said inspection
means to fully inspect said transparent flat panel for surface defects;
and
flat panel movement driver means electrically coupled to said flat panel
movement actuator means and to said computer means for allowing said
computer means to control said flat panel movement actuator means by
providing appropriate commands to said flat panel movement driver means.
13. The apparatus of claim 12 wherein said flat panel movement actuator
means comprising a lifter having a notch wherein an edge of said flat
panel is placed and wherein said optical inspection assembly providing a
linear sweep of a light beam on a flat surface of said flat panel, said
lifter having a range of motion in a direction normal to a plane created
by said linear sweep of said light beam, said lifter being coupled to and
controlled by said computer means.
14. The apparatus of claim 12 wherein said inspection means is a surface
inspection assembly means comprising, in combination:
a light source providing said light beam;
optical scanner means in physical proximity to said light source for
permitting said light beam to contact said optical scanner means and for
reflecting said light beam thereby providing a linear sweep of said light
beam;
scanning optics means having a front face portion and a rear face portion
for permitting said linear sweep of said light beam to contact said front
face portion of said scanning optics means for causing said light beam
that contacts said front face portion to exit said rear face portion and
to contact said transparent flat panel;
spherical mirror means for reflecting said light beam after passing through
said transparent flat panel back through said transparent flat panel to
said scanning optics means in a path. coincident with said light beam
being directed to said transparent flat panel;
trigger detector means coupled to said computer means and placed within
said linear sweep of said light beam for providing a synchronizing
electrical signal to said computer means for indicating a position of said
light beam along said linear sweep;
beam splitter means through which said light beam passes for separating
said light beam being reflected by said spherical mirror means from said
light beam being directed to said transparent flat panel;
said detector means receiving said light beam from said beam splitter means
and detecting changes of a nominal Gaussian distribution of said light
beam, wherein said changes correspond to and identify defects in said flat
surface of said transparent flat panel.
15. The apparatus of claim 14 wherein said light source comprising a laser
diode and said light beam comprising a laser beam from said laser diode.
16. The apparatus of claim 14 wherein said light source comprising a
helium-neon laser, and said light beam comprising a laser beam from said
helium-neon laser.
17. The apparatus of claim 14 wherein said optical scanner means having a
motor-driven polygonal head coupled to said computer means and having
reflective faces such that said light beam contacts said reflective faces
of said polygonal head, and having means for rotating of said polygonal
head for causing said light beam reflected off said reflective faces to
create said linear sweep of said light beam across said scanning optics
means.
18. The apparatus of claim 17 wherein said motor-driven polygonal head is
turned on and off by said computer means.
19. The apparatus of claim 14 wherein said optical scanner means being
located at a distance from said scanning optics means less than the focal
length of said scanning optics means.
20. The apparatus of claim 14 wherein said scanning optics means focus said
light beam on said transparent flat panel.
21. The apparatus of claim 14 wherein said trigger detector means
comprising an optical sensor having an electrical output corresponding to
the presence of said light beam on said optical sensor which is coupled to
said computer means.
22. The apparatus of claim 21 wherein said optical sensor comprising a
photodiode.
23. The apparatus of claim 21 wherein said optical sensor comprising a
charge-coupled device (CCD).
24. The apparatus of claim 14 wherein said detector means comprising, in
combination:
at least two optical detectors having electrical outputs, said optical
detectors functioning in parallel; and
electronic circuitry means for processing said electrical outputs of said
optical detectors and generating an electrical signal to said computer
means comprising, in combination:
first input means coupled to said electrical outputs of said optical
detectors for monitoring said electrical outputs;
second input means coupled to said computer means for receiving a threshold
value from said computer means;
processing means coupled to said first input means and to said second input
means for measuring said electrical outputs of said optical detectors and
for determining the existence of changes of said nominal Gaussian
distribution of said light beam above said threshold value on said second
input means; and
output means coupled to said computer means for signaling an occurrence of
a change above said threshold value to said computer means.
25. The apparatus of claim 24 wherein said optical detectors comprise
photodiodes.
26. The apparatus of claim 24 wherein said optical detectors comprise
charge-coupled devices (CCDs).
27. The apparatus of claim 24 wherein said optical detectors are arranged
in rows and columns to form a substantially square matrix.
28. The apparatus of claim 24 wherein said optical detectors are arranged
in a series of concentric circular rings.
29. The apparatus of claim 14 further comprising filter optics means for
increasing spatial coherence of said light beam.
30. A method for inspecting a transparent flat panel using an optical
inspection apparatus including the steps of:
providing computer means for controlling said apparatus;
providing operator interface means coupled to said computer means for
providing input data from an operator to said computer means and for
providing output data from said computer means to said operator;
providing an optical inspection assembly, coupled to said computer means
having output means for reporting to said computer means results of an
inspection performed by said optical inspection assembly, comprising
inspection means consisting of detector means for detecting changes of a
nominal Gaussian distribution of a light beam passing through a
transparent flat panel; and
providing said transparent flat panel which is placed in said optical
inspection assembly to inspect said transparent flat panel for surface
defects.
31. The method of claim 30 further comprising the step of providing
automatic media handling means coupled to said computer means for loading
under control of said computer means said transparent flat panel into said
optical inspection assembly and for unloading under control of said
computer means said transparent flat panel out of said optical inspection
assembly.
32. The method of claim 30 wherein said computer means comprising, in
combination:
an IBM compatible personal computer; and
control software means loaded into memory of said IBM compatible personal
computer for determining function and sequence of operations of said
apparatus.
33. The method of claim 30 wherein said computer means periodically polls
said output means of said optical inspection assembly to determine whether
a surface defect has been detected by said optical inspection assembly.
34. The method of claim 30 wherein said output means of said optical
inspection means is coupled to said computer means such that said output
means interrupts said computer means when a surface defect is detected by
said optical inspection assembly.
35. The method of claim 30 wherein said operator interface means
comprising, in combination:
keyboard means coupled to said computer means for providing said input data
from said operator to said computer means; and
display means coupled to said computer means for displaying said output
data from said computer means to said operator.
36. The method of claim 35 wherein said operator interface means further
comprising operator panel means having knobs and switches for selecting
one of a plurality of detection thresholds for said optical inspection
assembly.
37. The method of claim 35 including means for permitting said operator to
select one of a plurality of detection thresholds for said optical
inspection assembly via said keyboard means.
38. The method of claim 31 wherein said automatic media handling means
comprising, in combination:
at least one input tray wherein said transparent flat panel is placed prior
to inspection by said apparatus;
at least one movable gripper hand located in proximity to said input tray
for gripping and transporting said transparent flat panel from said input
tray to said optical inspection assembly;
a first output tray located in proximity to said movable gripper hand such
that said transparent flat panel is moved from said optical inspection
assembly to said first output tray by said movable gripper hand if said
output of said optical inspection assembly signals to said computer means
that said transparent flat panel has no surface defects; and
a second output tray located in proximity to said movable gripper hand such
that said transparent flat panel is moved from said optical inspection
assembly to said second output tray by said movable gripper hand if said
output of said optical inspection assembly signals to said computer means
that said transparent flat panel has surface defects.
39. The method of claim 30 wherein said optical inspection assembly
comprising, in combination:
flat panel movement actuator means in physical proximity to said inspection
means for moving said transparent flat panel to allow said inspection
means to fully inspect said transparent flat panel for surface defects;
and
flat panel movement driver means electrically coupled to said flat panel
movement actuator means and to said computer means for allowing said
computer means to control said flat panel movement actuator means by
providing appropriate commands to said flat panel movement driver means.
40. The method of claim 39 wherein said flat panel movement actuator means
comprising a lifter having a notch wherein an edge of said flat panel is
placed and wherein said optical inspection assembly providing a linear
sweep of a light beam on said flat surface of said flat panel, said lifter
having a range of motion in a direction normal to a plane created by said
linear sweep of said light beam, said lifter being coupled to and
controlled by said computer means.
41. The method of claim 39 wherein said inspection means comprises surface
inspection assembly means comprising, in combination:
a light source providing said light beam;
optical scanner means in physical proximity to said light source for
permitting said light beam to contact said optical scanner means and for
reflecting said light beam thereby providing a linear sweep of said light
beam;
scanning optics means having a front face portion and a rear face portion
for permitting said linear sweep of said light beam to contact said front
face portion of said scanning optics means for causing said light beam
that contacts said front face portion to exit said rear face portion and
to contact said transparent flat panel;
spherical mirror means for reflecting said light beam after passing through
said transparent flat panel back through said transparent flat panel to
said scanning optics means in a path coincident with said light beam being
directed to said transparent flat panel;
trigger detector means coupled to said computer means and placed within
said linear sweep of said light beam for providing a synchronizing
electrical signal to said computer means for indicating a position of said
light beam along said linear sweep;
beam splitter means through which said light beam passes for separating
said light beam being reflected by said spherical mirror means from said
light beam being directed to said transparent flat panel;
said detector means for receiving said light beam from said beam splitter
means and for detecting changes of a nominal Gaussian distribution of said
light beam, said changes corresponding to and identifying defects in said
flat surface of said transparent flat panel.
42. The method of claim 41 wherein said optical scanner means having a
motor-driven polygonal head coupled to said computer means and having
reflective faces such that said light beam contacts said reflective faces
of said polygonal head, and having means for rotating said polygonal head
for causing said light beam reflected off said reflective faces to create
said linear sweep of said light beam across said scanning optics means.
43. The method of claim 42 wherein said motor-driven polygonal head is
turned on and off by said computer means.
44. The method of claim 41 wherein said optical scanner means being located
at a distance from said scanning optics means less than the focal length
of said scanning optics means.
45. The apparatus of claim 41 wherein said scanning optics means focus said
light beam on said transparent flat panel.
46. The method of claim 41 wherein said trigger detector means comprising
an optical sensor having an electrical output corresponding to the
presence of said light beam on said optical sensor which is coupled to
said computer means.
47. The method of claim 41 wherein said detector means comprising, in
combination:
at least two optical detectors having electrical outputs, said optical
detectors functioning in parallel; and
electronic circuitry means for processing said electrical outputs of said
optical detectors and generating an electrical signal to said computer
means comprising, in combination:
first input means coupled to said electrical outputs of said optical
detectors for monitoring said electrical outputs;
second input means coupled to said computer means for receiving a threshold
value from said computer means;
processing means coupled to said first input means and to said second input
means for measuring said electrical outputs of said optical detectors and
for determining the existence of changes of said nominal Gaussian
distribution of said light beam above said threshold value on said second
input means; and
output means coupled to said computer means for signaling an occurrence of
a change above said threshold value to said computer means.
48. The method of claim 47 wherein said optical detectors are arranged in
rows and columns to form a substantially square matrix.
49. The method of claim 47 wherein said optical detectors are arranged in a
series of concentric circular rings.
50. The method of claim 41 further comprising the steps of:
loading said transparent flat panel into said flat panel movement actuator
means in said optical inspection assembly;
activating said surface inspection assembly means with said computer means;
said computer means providing commands to said flat panel movement driver,
thereby causing said flat panel movement actuator to move said transparent
flat panel such that the entirety of said flat surface is inspected;
checking with said computer means said output of said optical inspection
assembly to determine whether a defect was detected by said optical
inspection assembly; and
unloading said transparent flat panel from said optical inspection assembly
into a first destination if said output on said optical inspection
assembly did not indicate the presence of a defect on said transparent
flat panel, and unloading said transparent flat panel from said optical
inspection assembly into a second destination if said output of said
optical inspection assembly did indicate the presence of a defect on said
transparent flat panel.
51. An apparatus for optically scanning a transparent flat panel
comprising, in combination:
a light source providing a light beam;
light beam reflecting means for reflecting said light beam for providing a
linear sweep of said light beam;
a transparent flat panel having a flat surface to be inspected positioned
in said linear sweep of said light beam;
detector means for receiving said light beam after it has passed through
said transparent flat panel and for detecting changes of a nominal
Gaussian distribution of said light beam corresponding to defects in said
flat surface of said transparent flat panel; and
means for moving said transparent flat panel within said linear sweep of
said light beam and for permitting a linear scan of said flat surface for
complete scanning of all of said flat surface to be inspected.
52. The apparatus of claim 51 wherein said light source comprising a laser
diode and said light beam comprising a laser beam from said laser diode.
53. The apparatus of claim 51 wherein said light source comprising a
helium-neon laser, and said light beam comprising a laser beam from said
helium-neon laser.
54. The apparatus of claim 51 wherein said light beam reflecting means
comprising an optical scanner.
55. The apparatus of claim 54 wherein said optical scanner having a
motor-driven polygonal head having reflective faces positioned to permit
said light beam to contact said reflective faces of said polygonal head,
and having means for rotating said polygonal head for causing said light
beam reflected off said reflective faces to create said linear sweep of
said light beam.
56. The apparatus of claim 51 wherein said means for moving said
transparent flat panel comprising a lifter having a notch wherein an edge
of said flat panel is placed, said lifter having a range of motion in a
direction normal to a plane created by said linear sweep of said light
beam, said lifter being coupled to and controlled by said computer means.
57. A method for optically scanning a transparent flat panel comprising, in
combination:
providing a light source having a light beam;
providing light beam reflecting means for reflecting said light beam for
providing a linear sweep of said light beam;
providing a transparent flat panel having a flat surface to be inspected
positioned in said linear sweep of said light beam;
providing detector means for receiving said light beam after it has passed
through said transparent flat panel and for detecting changes of a nominal
Gaussian distribution of said light beam corresponding to defects in said
flat surface of said transparent flat panel; and
providing means for moving said transparent flat panel within said linear
sweep of said light beam and for permitting a linear scan of said flat
surface for complete scanning of all of said flat surface to be inspected.
58. The method of claim 57 wherein said light beam reflecting means
comprising an optical scanner.
59. The method of claim 58 wherein said optical scanner having a
motor-driven polygonal head having reflective faces positioned to permit
said light beam to contact said reflective faces of said polygonal head,
and having means for rotating said polygonal head for causing said light
beam reflected off said reflective faces to create said linear sweep of
said light beam.
60. The method of claim 57 wherein said means for moving said transparent
flat panel comprising a lifter having a notch wherein an edge of said flat
panel is placed, said lifter having a range of motion in a direction
normal to a plane created by said linear sweep of said light beam.
61. The method of claim 57 further comprising detector means for receiving
said light beam and for detecting changes of a nominal Gaussian
distribution of said light beam corresponding to defects in said flat
surface of said transparent flat panel.
62. The method of claim 57 further comprising the steps of:
placing said transparent flat panel into said means for moving said
transparent flat panel; and
activating said means for moving said transparent flat panel causing all of
said flat surface to pass through said linear sweep of said light beam.
63. An apparatus for detecting surface defects in a transparent flat panel
comprising, in combination:
a light source providing a light beam;
light beam reflecting means for reflecting said light beam for providing a
linear sweep of said light beam;
a transparent flat panel having a flat surface to be inspected positioned
in said linear sweep of said light beam;
means for moving said transparent flat panel within said linear sweep of
said light beam and for permitting a linear scan of said flat surface for
complete scanning of all of said flat surface to be inspected; and
detector means for measuring changes in said light beam corresponding to
defects on said flat surface of said transparent flat panel, wherein said
detector means receives said light beam after it has passed through said
transparent flat panel and detects changes of a nominal Gaussian
distribution of said light beam, said changes corresponding to defects in
said flat surface of said transparent flat panel.
64. The apparatus of claim 63 wherein said light source comprising a laser
diode and said light beam comprising a laser beam from said laser diode.
65. The apparatus of claim 63 wherein said light source comprising a
helium-neon laser, and said light beam comprising a laser beam from said
helium-neon laser.
66. The apparatus of claim 63 wherein said light beam reflecting means
comprising an optical scanner.
67. The apparatus of claim 66 wherein said optical scanner having a
motor-driven polygonal head having reflective faces positioned to permit
said light beam to contact said reflective faces of said polygonal head,
and having means for rotating said polygonal head for causing said light
beam reflected off said reflective faces to create said linear sweep of
said light beam.
68. The apparatus of claim 63 wherein said means for moving said
transparent flat panel comprising a lifter having a notch wherein an edge
of said flat panel is placed, said lifter having a range of motion in a
direction normal to a plane created by said linear sweep of said light
beam.
69. The apparatus of claim 63 wherein said detector means comprising, in
combination:
at least two optical detectors having electrical outputs, said optical
detectors functioning in parallel; and
electronic circuitry means for processing said electrical outputs of said
optical detectors and generating an electrical signal output in response
to changes of a nominal Gaussian distribution of said light beam above a
selectable threshold value.
70. A method for detecting surface defects in flat media comprising, in
combination:
providing a light source having a light beam;
providing light beam reflecting means for reflecting said light beam for
providing a linear sweep of said light beam;
providing a transparent flat panel having a flat surface to be inspected
positioned in said linear sweep of said light beam;
providing means for moving said transparent flat panel within said linear
sweep of said light beam and for permitting a linear scan of said flat
surface for complete scanning of all of said flat surface to be inspected;
and
providing detector means for measuring changes in said light beam
corresponding to defects on said flat surface of said transparent flat
panel, wherein said detector means receives said light beam after it has
passed through said transparent flat panel and detects changes of a
nominal Gaussian distribution of said light beam, said changes
corresponding to defects in said flat surface of said unit test.
71. The method of claim 70 wherein said light beam reflecting means
comprising an optical scanner.
72. The method of claim 71 wherein said optical scanner having a
motor-driven polygonal head having reflective faces positioned to permit
said light beam to contact said reflective faces of said polygonal head,
and having means for rotating said polygonal head for causing said light
beam reflected off said reflective faces to create said linear sweep of
said light beam.
73. The method of claim 70 wherein said means for moving said transparent
flat panel comprising a lifter having a notch wherein an edge of said flat
panel is placed, said lifter having a range of motion in a direction
normal to a plane created by said linear sweep of said light beam.
74. The method of claim 70 wherein said detector means comprising, in
combination:
at least two optical detectors having electrical outputs, said optical
detectors functioning in parallel; and
electronic circuitry means for processing said electrical outputs of said
optical detectors and generating an electrical signal output in response
to changes of a nominal Gaussian distribution of said light beam above a
selectable threshold value.
75. The method of claim 70 further comprising the steps of:
placing said transparent flat panel into said means for moving said
transparent flat panel;
activating said means for moving said transparent flat panel causing all of
said flat surface to pass through said linear sweep of said light beam;
and
activating said detector means. |
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Claims  |
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Description  |
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FIELD OF THE INVENTION
This invention generally relates to optical apparatus and methods, and
relates, more specifically, to an optical inspection apparatus and method
for detecting faults in a flat, polished flat panel, such as those
commonly used in Liquid Crystal Display (LCD) panels. This apparatus
inspects with high resolution at high speed with automatic handling of the
flat panel to allow the apparatus to be used effectively in a production
inspection environment.
DESCRIPTION OF THE PRIOR ART
Flat panels for LCD panels require a surface that is flat to a high degree
of accuracy, and that is free from defects such as scratches and chips.
Some optical inspection systems have been used with limited success in
inspecting transparent flat panels, but do not provide the accuracy or
speed that is needed in a production environment.
Dark field microscopes and scatterometers are inspection apparatus
well-known in the art. A dark field microscope can somewhat accurately
locate surface defects, but takes too long to inspect to be effectively
used in a production environment. A scatterometer is faster than a dark
field microscope, but has less accuracy (detects fewer defects). Both the
dark field microscope and the scatterometer have low detection sensitivity
to shallow defects or defects that have a depth less than the wavelength
of the light used, which cause a phase shift in the light beam but do not
diffuse (scatter) the light in different directions. An interferometer,
which is well-known in the art, is suitable to detecting phase shifts, but
takes substantial time and effort to set up, limiting its use to
laboratory environments.
The inherent limitations of the prior art inspection systems have limited
their use in industrial production environments. Indeed, the most common
inspection method used in a production environment is a manual, visual
inspection by human inspectors, which hold the flat panel in their hands
and move the flat panel in ambient or special light looking for the
presence of scratches, chips and other defects. This inspection method is
labor intensive, relatively slow, and subject to human errors such as
missed defects which the human eye cannot easily distinguish.
Therefore, there existed a need to provide a high speed optical inspection
system and method which has a high sensitivity to defects which can be
used to inspect transparent flat panels in a production environment. This
inspection system includes automatic handling of the flat panels, high
speed inspection, and high resolution to detect defects smaller that the
spot size of the beam and/or more shallow than the wavelength of light
used. The increased speed of this apparatus increases throughput of the
production system, and assures that any mistakes or defects introduced by
human inspectors is eliminated.
SUMMARY OF THE INVENTION
It is an object of this invention to provide a high-speed optical
inspection apparatus and method suitable for production testing of
transparent flat panels.
It is another object of this invention to provide a high speed optical
inspection apparatus and method which is computer-controlled using an IBM
PC-AT computer or equivalent.
It is a further object of this invention to provide a high speed optical
inspection apparatus and method with surface inspection which has a high
speed optical scanner to provide linear movement of the beam across one
axis of the flat panel, and a flat panel actuator to move the flat panel,
thereby positioning each portion of the flat panel in the path of the
linear movement of the beam, thereby completely inspecting the entire face
surface of the flat panel.
It is yet another object of this invention to provide a high speed optical
inspection apparatus and method which has an Automatic Flat Panel Handler
for automatically loading the flat panels into the apparatus and for
automatically unloading the flat panels from the apparatus.
It is a still further object of this invention to provide a high speed
optical inspection apparatus and method which detects both phase and
amplitude changes of the light beam using multiple detectors to sense
changes in the nominal Gaussian distribution of the light beam.
It is yet another object of this invention to provide a high speed optical
inspection apparatus and method which has a trigger detector within the
path of the scanning light beam to provide a signal to synchronize the
controlling computer to the scan of the light beam.
According to the preferred embodiment of the present invention, an optical
inspection apparatus for inspecting a transparent flat panel is provided.
This inspection apparatus is controlled by an IBM PC-AT computer or
equivalent, and has a typical color monitor, printer and keyboard. An
Optical Inspection Assembly is provided which comprises a Surface
Inspection Assembly. The Surface Inspection Assembly nominally comprises a
laser light source which transmits a light beam, a high-speed Optical
Scanner, Scanning Optics, a beam splitter, optional Detection Optics, and
a Parallel Detector Array within a Detector. In this configuration the
light beam in the Surface Inspection Assembly originates in the laser, is
transmitted through a filter, and is transmitted to the Optical Scanner,
which reflects the light beam off the moving polygonal scanner head,
causing the light beam to sweep across the Scanning Optics.
The size of a flat panel can be much greater than the size of a practical
lens. Placing the Optical Scanner at a distance from the Scanning Optics
less than the focal length of the Scanning Optics causes the light beam to
diverge at the Scanning Optics, making the beam sweep a distance larger
than the diameter of the lens. The beam is focused at the center of the
transparent flat panel media by the Scanning optics. On the opposit | | |