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Systems, methods and computer program for measuring the surface contour of an object
   
Document Number
US Patent 6373963
Issued Date
April 16, 2002
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Abstract
Systems methods and computer program products are provided for obtaining a three-dimensional data set that is representative of a surface of a three-dimensional object. A grating pattern, having a sinusoidally varying intensity pattern, is projected onto the surface of an object. The projected grating pattern is shifted a number of times and two-dimensional deformed grating images of an area segment of the object surface are captured and stored. A two-dimensional array of optical phase values is then created. Optical phase values in the two-dimensional array are then used to generate a plurality of three-dimensional data points that represent respective points on the surface of the object. Each three-dimensional data point is found by locating, for each pixel in the detector array of pixels, a point on the surface of the object wherein a ray from a respective pixel passing through a nodal point of a detector lens is intersected by a plane of constant phase from the projected first grating pattern passing through a nodal point of a projector lens.
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Systems, methods and computer program for measuring the surface contour of an object - US Patent 6373963 Drawing
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Number of Claims:
47
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Published
April 16, 2002
Application Number
09/241,708
Filed
February 2, 1999
US Classification
382/108   108/100
Int'l Classification
G01B   11/24   (20060101)   G01B   11/25   (20060101)  
Examiner
Assistant Examiner
Attorney/Law Firm
Parent Case
This application claims benefit of U.S. provisional applicaton No. 60/073,776, filed Feb. 5, 1998.
USPTO Field of Search
382/108   382/154   356/600   356/603   356/604   356/605   355/53  
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