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High density non-volatile memory device
   
Document Number
US Patent 6381169
Issued Date
April 30, 2002
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Abstract
This invention provides novel high density memory devices that are electrically addressable permitting effective reading and writing, that provide a high memory density (e.g., 10.sup.15 bits/cm.sup.3), that provide a high degree of fault tolerance, and that are amenable to efficient chemical synthesis and chip fabrication. The devices are intrinsically latchable, defect tolerant, and support destructive or non-destructive read cycles. In a preferred embodiment, the device comprises a fixed electrode electrically coupled to a storage medium having a multiplicity of different and distinguishable oxidation states wherein data is stored in said oxidation states by the addition or withdrawal of one or more electrons from said storage medium via the electrically coupled electrode.
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High density non-volatile memory device - US Patent 6381169 Drawing
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Number of Claims:
93
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Published
April 30, 2002
Application Number
09/346,228
Filed
July 1, 1999
US Classification
365/151   365/153
Int'l Classification
C07D   487/22   (20060101)   C07D   487/00   (20060101)   H01L   27/28   (20060101)   C07D   519/00   (20060101)   C07F   17/00   (20060101)   C07F   17/02   (20060101)   G11C   13/02   (20060101)   G11C   11/56   (20060101)   H01L   51/05   (20060101)   H01L   51/30   (20060101)  
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Parent Case
CROSS-REFERENCE TO RELATED APPLICATIONS This application is related to an application entitled "High Density Non-Volatile Memory Device Incorporating Thiol-Derivatized Porphyrins" (Ser. No. 09/346,221), filed on Jul. 1, 1999, naming Daniel Tomasz Gryko, Peter Christian Clausen, David F. Bocian, Werner G. Kuhr, and Jonathan S. Lindsey as inventors, which is herein incorporated by reference in its entirety for all purposes.
USPTO Field of Search
365/151   365/153  
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