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IC socket and IC tester
   
Document Number
US Patent 6464511
Issued Date
October 15, 2002
Link
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Abstract
A housing and a bottom cover are secured together and have pairs of aligned through-apertures, and probe pins are accommodated in respective pairs of through-apertures to provide an IC socket. Each probe pin comprises a tube having a stop flange formed around its outer periphery, a movable plunger accommodated in the tube such that an extension portion of the movable plunger in urged to project out of a narrowed first end portion of the tube by a first coil spring, and a fixed plunger fitted to a second end portion of the tube. Each probe pin is urged by a second coil spring such that the stop flange on the tube is urged into abutment with a shoulder portion of a through-aperture of the bottom cover, whereby a tip end of the fixed plunger is projected beyond the outer surface of the bottom cover and a tip end of the movable plunger is projected beyond the outer surface of the housing.
Drawing
IC socket and IC tester - US Patent 6464511 Drawing
Drawing from US Patent 6464511
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Number of Claims:
5
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Owner
Published
October 15, 2002
Application Number
09/763,568
Filed
February 22, 2001
US Classification
439/66   439/700
Int'l Classification
G01R   1/073   (20060101)   G01R   1/067   (20060101)   H01R   13/24   (20060101)   H01R   13/22   (20060101)   G01R   1/02   (20060101)   G01R   1/04   (20060101)  
Examiner
Assistant Examiner
USPTO Field of Search
439/66   439/700   439/482   439/824  
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Claims
Description
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