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System and method for testing component IC chips
 
   
Document Number
US Patent 6598193
Issued Date
July 22, 2003
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Abstract
The present disclosure describes a system and method for testing component IC chips. The system includes a management controller that has an embedded JTAG test routine operable to test one or more component IC chips associated with the management controller. The system further includes a memory associated with the management controller and the management controller is further operable to save a JTAG test routine result within the memory. More specifically, the management controller is operable to test one or more associated component IC chips using the embedded JTAG test routine during boot up of the system.
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System and method for testing component IC chips - US Patent 6598193 Drawing
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Number of Claims:
18
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Owner
Dell Products L.P. (Round Rock, TX)
Published
July 22, 2003
Application Number
09/489,710
Filed
January 24, 2000
US Classification
714/727  
Int'l Classification
G01R   31/3185   (20060101)   G01R   31/3193   (20060101)   G01R   31/28   (20060101)  
Examiner
Assistant Examiner
Attorney/Law Firm
USPTO Field of Search
714/727  
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Description
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