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Projection exposure apparatus and method employing rectilinear aperture stops for use with periodic mask patterns
   
Document Number
US Patent 6661498
Issued Date
December 9, 2003
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Inventors
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Abstract
A projection optical system and method projects and forms an image of a pattern arrayed on a first surface (mask), and exhibiting a periodicity in a predetermined direction (X- or Y-direction), on a second surface (wafer). A stop has an aperture showing a line symmetry with respect to a symmetric axis intersecting an optical axis of the projection optical system and extending in a direction (Y- or X-direction) orthogonal to the predetermined direction and having the outline at least a part of which are rectilinear portions. The stop is disposed on a Fourier transform plane of the first surface within the projection optical system or a surface in the vicinity thereof.
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Projection exposure apparatus and method employing rectilinear aperture stops for use with periodic mask patterns - US Patent 6661498 Drawing
Drawing from US Patent 6661498
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Number of Claims:
30
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Owner
Published
December 9, 2003
Application Number
09/546,233
Filed
April 10, 2000
US Classification
355/71   355/53
Int'l Classification
G03B   27/42   (20060101)  
Examiner
Attorney/Law Firm
Parent Case
CROSS REFERENCE TO RELATED APPLICATION This application is a continuation of application Ser. No. 08/597,982 filed Feb. 7, 1996, now abandoned.
Priority Data
Feb 10, 1995 [JP] 7-022666
USPTO Field of Search
355/30   355/52   355/53   355/71   355/77  
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Description
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