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Description  |
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BACKGROUND OF THE INVENTION
1. Field of Invention
The present invention relates to the memory control circuit of a computer
system. More particularly, the present invention relates to a feedback
system on a computer motherboard capable of accommodating different memory
module loading through delay adjustment.
2. Description of Related Art
Through rapid advance in semiconductor fabrication technologies, raw
processing power of the central processing unit (CPU) inside a computer
has increased considerably. Because of such rapid progress, clocking
frequency of most personal computer (PC) has also increased from a few MHz
in the past to more than one GHz now. To operate a high-power computer
system, considerably amount of memory must also be used. Nowadays, most
personal computer may contain several megabytes to a few gigabytes of
memory. Following the increase in the clocking rate of CPU, most memory
unit operates at a clocking frequency of 100 Mz or above.
A conventional low-speed memory control circuit transmits data by matching
data signals with clocking signals. However, as the operating frequency of
a computer system increases, such a simple arrangement is impossible to
transmit data with sufficient accuracy. To increase data transmission
capacity and improve high-speed transmission accuracy of memory signal, a
data strobe (DS) method is introduced to reduce data loss due to
high-speed transmission.
In some actual applications, data signal DAT and data strobe signal DS are
transmitted synchronously from the same transmitting end. At the receiving
end, the data strobe signal DS is delayed by a short interval. The short
delay allows an integrated circuit to setup and hold a particular data
signal such that the data can be accurately read. In other words, the
transmitting end sends out a data signal DAT and a data strobe signal DS
at the same edge of a clocking signal. Utilizing the almost identical
delay trace of an integrated circuit, transmission route and integrated
circuit buffer delays are balanced so that any skew between the data
signal DAT and the data strobe signal DS is minimized.
In practice, the delay depends on a number of factors including the skew
between the data signal DAT and the data strobe signal DS, the design of
delay elements, the operating frequency of system and a few other
environmental factors. Due to such complications, another method is
suggested to tackle the delay setup problem. The method is to delay the
data strobe signal DS by a quarter cycle of the clocking signal CLK. No
matter what the clocking frequency of a particular system is, the data
strobe signal DS always starts in the mid-portion of the positive half
cycle or the negative half cycle of the a clock cycle CLK. By this means,
accuracy of the data is ensured.
To ensure the triggering of the data strobe signal DS at a proper time, for
example, at one quarter cycle delay of the clock signal CLK, and match the
data signal DAT, most data strobe signal DS line includes a feedback route
that connects from a half-way point to the memory unit to a data strobe
feedback (DSF) pin. By tapping the return signal at the data strobe
feedback (DSF) pin, status of signal transmission can be monitored and the
moment to emit data strobe signal for obtaining correct data can be
determined. In general, a phase lock circuit is employed to perform the
timing adjustment.
FIG. 1 is a sketch of a conventional feedback control circuit of a memory
module. As shown in FIG. 1, the control chipset 10 has a plurality of data
strobe pins DQS[0:8] and a data strobe feedback pin DQSFB. The data strobe
pins DQS[0:8] are connected to the data strobe pins (not shown) of a
plurality of memory module slots 12, 14 and 16. A trace line is selected
such that a branch back line is tapped at a halfway point back to the data
strobe feedback pin DQSFB. The branching point is set to make the path
length from the point to the memory module slots 12, 14, 16 (Path 1) and
the path length from the point to the data strobe feedback pin (Path 2)
almost identical. Hence, almost identical transmission delay is simulated.
With this arrangement, signal submitted to the data strobe feedback pin
DQSFB of the control chipset reflects actual data strobe delay at the
memory module terminal.
However, actual delay is also dependent upon the loading at the memory
module slots. In other words, the data transmission delay varies according
to the number of memory modules plugged into the memory module slots and
the number of integrated circuits inside the memory module. The
aforementioned feedback system has no special mechanism for adjusting the
timing between data signal DAT and data strobe signal DS according to the
actual memory module loading. Therefore, the stability of a computer
system may be affected.
In addition, signal waveform arriving at the memory slot terminal is
slightly distorted due to the presence of a branch along the trace line.
Such distortion is likely to affect timing tolerance when data are read.
Moreover, the conventional feedback system demands setting of the
branching point to a position where the path length from the point to the
memory module slot and the path from the point to the data strobe feedback
pin are identical. Hence, wiring layout is further constrained and
additional printed circuit board area may be required.
SUMMARY OF THE INVENTION
Accordingly, one object of the present invention is to provide a feedback
system capable of accommodating different memory module loading. In other
words, the feedback system can self-adjust to accommodate any number of
memory modules plugged into the memory slots and any difference in the
number of integrated circuits inside the memory module. Consequently, the
control chipset is able to adjust the timing between the data signal DAT
and the data strobe signal DS according to the actual memory loading so
that data transmission accuracy is greatly improved.
A second object of the invention is to provide a feedback system capable of
accommodating different memory module loading without having to set a
branching point in such a way that the path from the point to a memory
module slot and the path from the point to a data strobe feedback pin are
almost identical. Hence, layout design is simplified and demands for
printed circuit board area is reduced.
To achieve these and other advantages and in accordance with the purpose of
the invention, as embodied and broadly described herein, the invention
provides a feedback system in a computer system for accommodating
different memory module loading. The feedback system includes a plurality
of memory module slots, a control chipset, a variable reference voltage
and a comparator. The memory module slots can accommodate at least one
memory module. The control chipset has a plurality of data strobe pins and
a data strobe feedback pin. The data strobe pins are connected to the data
strobe pin on the memory module slots. The variable reference voltage
provides a reference voltage. The comparator has a first input terminal, a
second input terminal and an output terminal. The output terminal of the
comparator is connected to the data strobe feedback signal pin. The first
input terminal of the comparator receives a reference voltage. The second
input terminal of the comparator is connected to any point along the line
from the data strobe pins of the control chipset to the data strobe pins
at the memory module slots. The variable reference voltage is set by the
computer system so that output timing of the comparator can be adjusted.
Through the adjustment of the reference voltage, a suitable data strobe
feedback signal is sent to the control chipset for adjusting data signal
DAT and data strobe signal DS timing and obtaining accurate data from the
memory module.
According to one embodiment of this invention, the variable reference
voltage of the feedback system is under the control of a control signal.
The control signal is issued from the control chipset. When a computer
system is started, the computer system will automatically read out the
state of assembly of the memory modules plugged onto the memory module
slots. The variable reference voltage is set according to the state of
assembly. However, a user may set up some other configuration through the
basic input/output system of the computer.
The invention provides a second feedback system in a computer system
capable of accommodating different memory module loading. The computer
system uses memory modules. Each memory module has loading pins and
simulating loads. The simulating loads are connected to the loading pins.
The feedback system of this invention includes a plurality of memory
module slots and a control chipset. Each memory module slot can
accommodate a memory module and has a loading pin. When a memory module is
plugged into the memory module slot, the loading pin on the memory module
is connected to the loading pin of the memory module slot. The control
chipset is coupled to the memory module slots. The control chipset has
data strobe pin and data strobe feedback signal pin. The data strobe pins
of the control chipset are first connected to the loading pins of any one
of the memory module slots and then serially connected to the other memory
module slots. The last memory slot is connected to the data strobe
feedback signal pin to form a `branchless` signal feedback loop. When a
memory module is plugged into the memory slot, the control chipset
utilizes the signal received from the data strobe feedback pin to simulate
the delay caused by the load on the memory slot. Hence, data can be
accurately written to or read from the memory module.
The invention provides a third feedback system capable of accommodating
different memory module loading. The feedback system includes a plurality
of memory module slots and a control chipset. The memory module slots can
accommodate at least one memory module. Each memory slot has data strobe
pins. The control chipset is coupled to the memory slots. The control
chipset has data strobe pins and a data strobe feedback pin. The data
strobe pin of the control chipset is first connected to the data strobe
pin of any one of the memory slots and then serially connected to the data
strobe pin of the other memory slots. The last memory slot is connected to
the data strobe feedback pin of the control chipset to form a `branchless`
signal feedback loop. When a memory module is plugged into the memory
slot, the control chipset utilizes the signal received from the data
strobe feedback pin to obtain loading information on the memory slot.
Hence, the delay can be computed and data can be accurately written to or
read from the memory module.
The invention provides a fourth feedback system capable of accommodating
different memory module loading. The feedback system includes a plurality
of memory module slots, a plurality of simulating loads, a group of
switches and a control chipset. The memory slots can accommodate at least
one memory module. The simulating loads are used to simulate the delay
caused by memory module loading. The switches are coupled to the
simulating loads for activating a portion of the simulating loads. The
control chipset is coupled to the memory slots. The control chipset has
data strobe pins and a data strobe feedback pin. The data strobe pins of
the control chipset are first connected to the simulating loads and then
connected back to the data strobe feedback pin. When a memory module is
plugged into the memory slot, the switches activate a portion of the
simulating loads. The control chipset utilizes the signals received from
the data strobe feedback pin to simulate possible delay caused by the
loading condition at the memory slot. Hence, data can be accurately
written to or read from the memory module.
According to another embodiment of this invention, the group of switches
for activating the simulating load is triggered by a switch control
signal. The switch control signal is issued by the control chipset. After
the computer system is switched on, the computer system will automatically
read out information about the state of assembly of memory modules in the
memory slots. According to the configuration information, the group of
switches is set to activate a portion of the simulating load simulating
the actual loading condition of the memory modules. Alternatively, a user
may set the grouping state of the memory module and hence the switches by
programming through the basic input/output system.
It is to be understood that both the foregoing general description and the
following detailed description are exemplary, and are intended to provide
further explanation of the invention as claimed.
BRIEF DESCRIPTION OF THE DRAWINGS
The accompanying drawings are included to provide a further understanding
of the invention, and are incorporated in and constitute a part of this
specification. The drawings illustrate embodiments of the invention and,
together with the description, serve to explain the principles of the
invention. In the drawings,
FIG. 1 is a sketch of a conventional feedback control circuit of a memory
module;
FIG. 2 is a diagram showing a memory module feedback control circuit
according to a first embodiment of this invention;
FIG. 3 is a diagram showing a memory module feedback control circuit
according to a second embodiment of this invention;
FIG. 4 is a diagram showing one of the memory modules shown in FIG. 3;
FIG. 5 is a diagram showing a memory module feedback control circuit
according to a third embodiment of this invention;
FIG. 6 is a diagram showing a memory module feedback control circuit
according to a fourth embodiment of this invention;
FIG. 7 is a graph showing the relationship between the reference voltage
and the timing delay according to the control circuit shown in FIG. 6; and
FIG. 8 is a block diagram showing an actual example of the variable voltage
provider for the control circuit shown in FIG. 6.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
Reference will now be made in detail to the present preferred embodiments
of the invention, examples of which are illustrated in the accompanying
drawings. Wherever possible, the same reference numbers are used in the
drawings and the description to refer to the same or like parts.
FIG. 2 is a diagram showing a memory module feedback control circuit
according to a first embodiment of this invention. As shown in FIG. 2, the
feedback control circuit includes a plurality of memory module slots 22,
24, 26 and a control chipset 20. Each memory slot has a data strobe pin.
The control chipset 20 has a data strobe pin and a data strobe feedback
pin.
Since each memory slots 22, 24, 26 can accommodate one memory module, the
original computer system (motherboard) designer has no foresight regarding
the number of memory modules in use and hence the actual memory module
loading. Consequently, the data strobe pin of the control chipset 20 is
first connected to the data strobe pin of any one of the memory slots and
then sequentially connected to the other memory slots. The data strobe pin
of the last serially connected memory slot is connected to a data strobe
feedback pin on the control chipset 20 to form a `branchless` signal
feedback loop. In general, the motherboard of a computer system will
include many data strobe pins. However, to simplify the description, only
a data strobe line is shown in the feedback loop.
To facilitate wiring layout in the first embodiment, the branchless signal
feedback loop starts from the data strobe pin of the control chipset 20
and connects with the data strobe pin of the memory slot 22, which is
closest to the control chipset 20. The other memory slots 24 and 26 are
connected in sequence according to their relative closeness from the first
memory slot 22. Finally, the last connected memory slot 26, which is
furthest from the control chipset 20, is connected to the data strobe
feedback pin of the control chipset.
In the feedback circuit, the memory module loading is in the feedback loop.
When memory modules are plugged into the memory slots such as 22, 24, and
26, the control chipset 20 can make use of signals received from the data
strobe feedback pin to obtain loading information for setting signaling
delay. Hence, data can be accurately written to or read from the memory
module.
FIG. 3 is a diagram showing a memory module feedback control circuit
according to a second embodiment of this invention. FIG. 4 is a diagram
showing one of the memory modules shown in FIG. 3. As shown in FIGS. 3 and
4, the feedback control circuit can be applied to a computer system. The
computer system uses a memory module 38 shown in FIG. 4. The memory module
38 has a loading pin and a simulating load 39 such as a capacitor. The
simulating load 39 is connected to the loading pin. The feedback system in
this embodiment includes a plurality of memory module slots 32, 34 and 36
and a control chipset 30. Each memory slot has a loading pin. The control
chipset 30 has an independent data strobe pin and a data strobe feedback
pin in addition to the original data strobe pins.
In the invention, when a memory module is plugged into any one of the
memory slots 32, 34, 36, the loading pin of the memory module is connected
to the loading pin of the memory slot. The data strobe pin of the control
chipset 30 is first connected to the loading pin of any one of the memory
slots 32, 34, 36 and then connected to the loading pin of the other memory
slots. Finally, the loading pin of the last memory slot is connected to
the data strobe feedback pin of the control chipset 30 to form a
`branchless` signal feedback loop.
To facilitate wiring design and shorten path length, the branchless signal
feedback loop starts from a data strobe pin of the control chipset 30 and
joins with the loading pin of memory slot 32, which is closest to the
control chipset 30. The other memory slots 34 and 36 are connected in
sequence according to their relative closeness from the first memory slot
32. Finally, the last connected memory slot 36, which is furthest from the
control chipset 30, is connected to the data strobe feedback pin of the
control chipset 30.
In the second embodiment, the simulating load feedback loop and the actual
memory module loading circuit are separate. Hence, interference of the
data strobe circuit by the feedback loop is prevented. Furthermore, the
simulating loads are in the feedback loop. Therefore, the memory control
chipset 30 can utilize the signal picked up by the data strobe pin to
simulate the loading at the memory slots when memory modules are plugged
into the memory slots 32, 34, 36. Hence, data can be accurately written to
or read from the memory modules.
FIG. 5 is a diagram showing a memory module feedback control circuit
according to a third embodiment of this invention. As shown in FIG. 5, the
feedback control circuit includes a plurality of memory module slots 42,
44, 46, a plurality of simulating loads 52, 54, 56, a group of switches 50
and a control chipset 40. Aside from the original data strobe pins, the
control chipset 40 also has an independent data strobe pin and a data
strobe feedback pin.
The data strobe pin of the control chipset 40 connects in series with the
simulating loads 52, 54, 56 and then returns to the data strobe feedback
pin. The simulating loads 52, 54, 56 that connect with the group of
switches can be a group of capacitors having different capacitance values.
The simulating loads 52, 54, 56 emulate loading delay caused by the memory
modules. The group of switches 50 serves to activate (switch) a portion of
the simulating loads. The control chipset 40 is connected to the memory
module slots 42, 44 and 46. When memory modules are plugged into the
memory slots 42, 44, 46, a portion of the simulating loads 52, 54, 56 is
activated by the group of switches 50. Utilizing the signal picked up by
the data strobe feedback pin, the control chipset 40 can emulate loading
on the memory slots 42, 44, 46 to set up proper delay. Hence, data can be
accurately written to or read from the memory modules.
According to the third embodiment, the group of switches 50 is triggered by
a control switch signal to activate a portion of the simulating loads 52,
54 and 56. The control switch signal is issued by the control chipset 40.
After the computer system is turned on, the central processing unit (not
shown) of the computer system will automatically read out the status of
configuration the memory modules in the memory slots 42, 44, 46 via the
control chipset 40. According to the status of configuration, the switches
50 are set to activate a portion of the simulating loads to emulate the
loading condition at the memory slots. Alternatively, a computer system
user may set up an status of configuration through the basic input/output
system (BIOS) to control the switches 50. The group of switches 50
comprises of a plurality of jumpers. The jumpers can be set by user when
the memory modules are plugged into the memory slots. In this case, a
control signal needs not be supply by the control chipset 40.
FIG. 6 is a diagram showing a memory module feedback control circuit
according to a fourth embodiment of this invention. As shown in FIG. 6,
the feedback control circuit can accommodate different memory module
loading in a computer system. The feedback control circuit includes a
plurality of memory module slots 62, 64, 66, a control chipset 60, a
variable reference voltage source 70 and a comparator 72. The control
chipset 60 has a data strobe pin and a data strobe feedback pin. Each
memory slot has a data strobe pin.
The data strobe pin of the control chipset 60 is connected the data strobe
pin of the memory slots 62, 64 and 66. One of the input terminal of the
comparator 72 is connected to a point somewhere along the line joining the
data strobe pin of the chipset 60 and the data strobe pin of the memory
slots 62, 64 and 66. The other input terminal of the comparator 72 is
connected to the variable reference voltage source 70. The output terminal
of the comparator 72 is connected to the data strobe feedback pin of the
control chipset 60. To simplify the description, only one data strobe
signal line is shown in the feedback circuit.
FIG. 7 is a graph showing the relationship between the reference voltage
and the timing delay according to the control circuit shown in FIG. 6. The
variable reference voltage source 70 provides a reference voltage to the
feedback circuit. When memory modules are plugged into the memory slots
62, 64, 66, the computer system controls the variable reference voltage
source 70 to output a voltage and adjust the output timing of the
comparator 72. The control chipset 60 utilizes the signal provided by the
comparator 72 at the data strobe feedback pin to modify the timing of the
data signal DAT and data strobe signal DS. Therefore, data can be
accurately written to or read from the memory modules.
According to the fourth embodiment, the variable reference voltage source
70 is controlled by a control signal. The control signal is issued by the
control chipset 60. After the computer system is turned on, the central
processing unit (not shown) of the computer system will automatically read
out the status of configuration of memory modules in the memory slots 62,
64, 66. The variable reference voltage source 70 is set according to the
status of configuration of the memory modules. The setting of a reference
voltage in turn controls the timing of the data signal DAT and the data
strobe signal DS. A computer system user can set the status of
configuration and hence control the voltage at the variable reference
voltage source 70 by programming the basic input/output system (BIOS).
Obviously, the status of configuration must correspond to the memory
module loading on the memory slots 62, 64 and 66.
FIG. 8 is a block diagram showing an actual example of the variable voltage
provider for the control circuit shown in FIG. 6. As shown in FIG. 8, the
variable reference voltage source 70 includes a voltage regulator 80, a
resistor 86, a plurality of parallel-connected resistors 82 and a group of
switches 84. The voltage regulator 80 provides a precise voltage. One end
of the resistor 86 is connected to the voltage regulator 80 while the
other end, which is also the reference voltage output terminal, is
connected to the parallel-connected resistors 82. The other terminal of
the parallel-connected resistors 82 is connected to the group of switches
84. The switches 84 are connected to ground. When the system operates, a
control signal is sent to the switches 84 changing the equivalent
resistance of the parallel-connected resistors 82 base on voltage divider
rule. Hence, voltage at the voltage reference output terminal is changed.
The group of switches 84 can also be replaced by a plurality of jumpers.
User can directly set the jumpers when the memory modules are plugged into
the memory slot. In this case, there is no need for the control chipset to
provide a control signal.
Both the variable reference voltage source 70 and the comparator 72 may be
incorporated inside the control chipset 60. In addition, the
aforementioned branching points may be inside the control chipset or very
close to the data strobe pin of the control chipset.
It will be apparent to those skilled in the art that various modifications
and variations can be made to the structure of the present invention
without departing from the scope or spirit of the invention. In view of
the foregoing, it is intended that the present invention cover
modifications and variations of this invention provided they fall within
the scope of the following claims and their equivalents.
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Description  |
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