A method and apparatus that couple a change input scan chain test pattern with an initialization scan chain test pattern such that a resultant scan chain test pattern is produced, and apply the resultant scan chain test pattern to at least one combinational logic path. In one embodiment, the coupling is achieved by interleaving the change input scan chain test pattern with the initialization scan chain test pattern. In another embodiment, the coupling is achieved by creating a constructed test pattern set from the change input and the initialization scan chain test pattern.
CROSS REFERENCE TO RELATED APPLICATIONS
This application is a continuation of U.S. patent application Ser. No. 09/265,513, entitled "Combinational Test Pattern Generation Method and Apparatus", filed Mar. 10, 1999, now U.S. Pat. No. 6,480,980.
