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| United States Patent | 6793409 |
| Link to this page | http://www.wikipatents.com/6793409.html |
| Inventor(s) | Wickman; Randy (Cadott, WI);
Greene; John (Chippewa Falls, WI);
O'Connor; Gary (Bolingbrook, IL);
Mansur; Daniel (Chippewa Falls, WI);
Barneson; David (Eleva, WI);
Gregory; Bryan (Glen Ellyn, IL) |
| Abstract | A method and apparatus are provided for aligning an array of optical
devices with optical processing equipment. The method includes the steps
of providing a transparent substrate with a plurality of optical
transmission paths passing directly through the substrate, providing a
plurality of alignment guides on the optical array, providing a
complementary plurality of respective alignment guides on the transparent
substrate and guiding the optical devices of the array into alignment with
the substrate using respective pairs of the alignment guides on the
optical array and transparent substrate. |
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Title Information  |
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| Publication Date |
September 21, 2004 |
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| Filing Date |
February 19, 2003 |
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| Parent Case |
FIELD OF THE INVENTION
This application is a divisional of U.S. patent application Ser. No.
09/920,917 filed Aug. 2, 2001, now U.S. Pat. No. 6,547,454, which is a
continuation-in-part of U.S. Provisional Application No. 60/234,126, filed
on Sep. 21, 2000 (now abandoned). The field of the invention relates to
optoelectric data transmission systems, and to interconnection of
subsystems. |
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Title Information  |
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Description  |
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BACKGROUND OF THE INVENTION
Precision alignment of optical arrays to ribbon fiber can be difficult. In
order to minimize loss in multimode fiber, a placement tolerance of +/-5
.mu.m (micrometers) is needed. In contrast, the 3 standard deviation
alignment tolerances of single-mode optical fiber is less than 1 micron.
To achieve this alignment tolerance, active alignment and complex vision
systems are often used. This alignment requirement reduces manufacturing
output and yield, making optical assemblies more costly than traditional
electronic packaging techniques.
Active alignment uses the features of optical components to align optical
fibers to an optoelectronic device. For example, in coupling an optical
fiber to the surface of a light emitting laser, a device such as a
photodetector is used in alignment. The photodetector is positioned at one
end of the optical fiber, detecting the light from the surface emitting
laser at the other end of the optical fiber. The optical fiber's position,
relative to the surface emitting laser, is adjusted until light hitting
the photodetector reaches a maximum. When the photodetector senses a
maximum amount of light, the fiber is bonded in a permanent position.
Increased manufacturing demands have caused a need for replacement of this
type of alignment, as it can be time consuming and costly.
Electronic packaging assemblers often use pick-and-place methodology to
position electronic components for subsequent assembly. Components are
picked from a component holder and placed on a substrate no more than 25
microns from an absolute reference position. This alignment tolerance is 5
times greater than that required for low-loss optical interconnects.
Thus, there is a need for high precision alignment and placement of optical
components. Described herein is a detailed methodology for accurately
aligning optical components to one another, using features applied to the
optical components.
SUMMARY
A method and apparatus are provided for aligning an array of optical
devices with optical processing equipment. The method includes the steps
of providing a transparent substrate with a plurality of optical
transmission paths passing directly through the substrate, providing a
plurality of alignment guides on the optical array, providing a
complementary plurality of respective alignment guides on the transparent
substrate and guiding the optical devices of the array into alignment with
the substrate using respective pairs of the alignment guides on the
optical array and transparent substrate.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a perspective view of a waveguide system and a transparent
substrate with corresponding guide pins under an illustrated embodiment of
the invention;
FIG. 2 is a top view of an optical array of FIG. 1 showing optical ports,
electrical features and registration targets;
FIG. 3 is a top view of the optical array of FIG. 1 showing a plurality of
alignment structures, as well as optical ports, electrical features and
registration targets;
FIG. 4 is a cross-sectional view of an optical array and substrate of FIG.
1 with a plurality of alignment features placed on a substrate also
containing a plurality of alignment features;
FIG. 5 is a cross-sectional view of an optical array, substrate and optical
fiber of FIG. 1 under an alternate embodiment;
FIG. 6 is a side cut-away view of an alignment feature of the optical array
of FIG. 4;
FIG. 7 is a top view of an optical via that may be used with the system of
FIG. 1;
FIG. 8 is a transparent substrate of FIG. 1 containing a layer of a
dielectric material;
FIG. 9 is an perspective view of a optical system of FIG. 1 under an
alternate embodiment wherein the array and substrate are disposed within a
sealed can, further connected to a plurality of optical fibers; and
FIG. 10 is a top view of an array of optical systems of FIG. 1 disposed on
a single, common transparent substrate.
DETAILED DESCRIPTION OF THE DRAWINGS AND EMBODIMENT
FIG. 1 shows an optical coupler and converter assembly 31 in a context of
use and generally in accordance with an illustrated embodiment of the
invention. Included within the converter assembly 31 may be an optically
transparent substrate 5 and optical array 8 (FIG. 2). The optically
transparent substrate 5 may be attached to a guide pin holder 27. Both the
substrate 5 and guide pin holder 27 may be attached to a common printed
circuit board (PCB) 28. Transmission paths 25 of the optical array 8 (FIG.
2) pass through the optically transparent substrate 5. An external
waveguide coupler 26 containing optical fibers 12 may be aligned to the
optically clear substrate 5 and the optical array 8.
The optically transparent substrate 5 may be provided with guide pin
apertures 21. Guide pin apertures 21 may be laser drilled to relatively
close tolerances for insertion of the guide pins 22. The external
waveguide coupler 26 may contains guide pin apertures 24 for receiving
guide pins 22 and for aligning the optical fibers 12 to the transparent
substrate 5. The guide pin apertures 24 and/or guide pins 22 form
alignment references for coupling the converter assembly 31 to other
optical devices.
The relatively limited tolerances against lateral misalignment provided by
the combination of the aperture 21, pin 22 and connector aperture 24
allows for the precise alignment of the external waveguide coupler 26 and
optical fibers with the substrate 5. FIG. 1 shows guide pins held in place
by an accompanying pin holder 27. Thus, the pins 22 are placed through the
optically transparent substrate 5, and the external waveguide system 26 is
aligned to the optical array by operation of the substrate 5 which
functions as an alignment substrate that aligns the transmission paths of
the optical array 8 with the transmission paths of the fibers 12.
While the optical assembly 31 is shown in the context of converting between
an electrical signal on the PCB 28 and an optical signal on the fibers 12,
it should be understood that the converter assembly 31 may be used in any
of a number of other applications. For example, the assembly 31 could be
coupled electrically to a communication cable and optically coupled to
another optical array on a circuit board using the guide pins 22 for
alignment to form an electro-optical isolator.
FIG. 2 shows an optical array 8 containing optical ports 1 (e.g., VCSEL
lasers, DFB lasers, photodetectors, etc.) with transmission paths 25
extending normal to the top surface (i.e., out of the page). Thus, the
direction of light is normal to the surface of interest. The optical array
8 may be fabricated using conventional techniques.
Also shown on the array 8 are electrical pads 3, electrical traces 2, and
registration targets 4. The assembly process of the optical array 8 could
use registration targets 4 to generally locate the position of the optical
array 8 on the corresponding substrate 5 (as described in more detail
below). The electrical traces 2, electrical pads 3, or optical ports 1
could also be used as registration targets. The scope of the registration
targets is not limited to one or the other, but could include a
combination of registration targets. For instance, electrical traces 2 and
optical ports 1 could both be used as registration targets 4 in
determining the location of the optical array 8 on the array substrate 5.
In addition to registration targets 4, other alignment structures and
features can also be placed on the surface to further guide the array 8
into a precise alignment with the transparent substrate 5. The distances
from the registration targets to the outer boundaries of the optical
device 8 may be programmed into the pick and place machinery. Thus, the
delivered location of the optical array 8 by the pick and place machinery
is known.
In order to further guide the array 8 into precise alignment with the
substrate 5, a series of alignment devices 6, 7 (shown in FIG. 3) may be
fabricated on mating surfaces of the array 8 and substrate 5. The
alignment devices may be fabricated on the same side of the array 8 as the
ports 1. In some cases (described below) the alignment devices may be
fabricated directly over the ports 1.
The registration and alignment features 6, 7 on the optical array 8 are not
limited to any type of material, or any particular location on the surface
of the optical array. The registration features are not limited to any
number either. For instance, there could be `m` optical ports 1, `n`
electrical pads 3, and `o` electrical traces 2, and some combination used
as registration features.
The alignment devices 6, 7 may be fabricated using convention fabrication
technique. FIG. 4 shows a layer 29 of polyimid may be disposed over the
mating surfaces of the array 8 and substrate 5. The layer 29 of polyimid
may be any commercially available photoreactive material (e.g., 20-100
microns thick) provided with an associated etching agent.
A mask may be placed over the polyimid layer on the array 8. The mask may
transmit (or block) light in areas defining the alignment devices 6, 7.
The mask and layer may then be exposed and the excess material etched away
to leave the devices 6, 7, shown in FIG. 3. The devices may be round,
square or any other shape.
Similarly, a mask may be placed over the polyimid layer 29 disposed on the
substrate 5. The mask on the substrate 5 may be aligned to the holes 21.
Once aligned to the substrate 5, the polyimid layer 29 may be exposed and
excess material etched away.
In general, the alignment devices 6, 7 may be provided as complementary
post and receptacle type devices (FIG. 4). Posts 6, 7 may be fabricated on
the array 8 and complementary receptacles 9 may be fabricated on the
substrate 5. Alternatively, any combination of posts 6, 7 and receptacles
9 may be placed on the array 8 or substrate, the only limitation being
that any corresponding locations on the array 8 and substrate 5 would
include a complementary pair of alignment devices 6, 7 and 9.
If the registration features (i.e., alignment devices) 7 are optically
transparent, they can be placed over the active optical regions of the
ports 1, as shown in FIG. 3. When placed over the optically active
regions, the alignment devices 7 have been found to function as a lens,
directing light along a predictable path through the substrate 5 into the
fibers 12.
Whether over the active optical region 1 or not, these alignment structures
6, 7 may have tapered sides of different sizes and profiles that may be
used to guide and align the optical-component to the mating substrate 5.
Alignment features 6 are not limited to the optical array 8 though.
Coinciding, complementary alignment features 6, 7, 9 can be placed on the
substrate 5 or on the metal traces 11. The metal traces 11 may be disposed
on the substrate 5 and used to connect the pads 3 to external connections
(e.g., on a supporting printed circuit board). Thus, a combination of
alignment features 6, 7, 9 on both the substrate and optical array surface
can be used in guiding and aligning the components to their proper
location.
FIG. 4 illustrates the relationship between the alignment features 6, 7 of
the optical array 8 and those corresponding features 9 of the substrate 5.
The structure of the alignment features 6, 7, 9 functions to guide the
optical component 8 into its correct position on the substrate 5. The
substrate 5 could have built-up sections or removed areas 9, such as guide
pin apertures 21, (see FIG. 1), depending on the desired features for the
application. The substrate 5 could also have on its surface a layer of a
polyimid 29 or similar material. This material might be easier in
manufacturing to a desired shape or form. FIG. 5 illustrates what a
substrate S might look like with a polyimid layer 29 between the optical
array 8 and the substrate 5 and with conductive traces partially disposed
over the layer 29.
Alignment features 6, 7 on the substrate 5 or polyimid are not limited to
one side. They could be located on the surface closest to the optical
fiber 12 or on the surface closest to the optical array 8. The initial
physical placement of the optical components 8 can be done using standard
pick-and-place equipment. Optical alignment occurs as the alignment
features 6, 7, 9 engage and lock into a final position. Tapered edges 18,
19 of the alignment features allow a smooth initial placement, and
automatic movement into the optical alignment.
The tapered alignment features (18, 19) of both surfaces can be of
different sizes in order to complete the alignment process. The tolerances
16 of the pick and place machine may be comparable in scope to the
operable range of the alignment feature 6, as shown in FIG. 6. Otherwise,
the initial alignment of the features may not be close enough to render
the tapered sides functional. Thus, the range of self-alignment provided
by the alignment features 6 would be expected to be larger than the pick
and place machinery tolerance 16.
The tapered surfaces 18, 19 may be shaped using any of a number of
different methods. Under a first method, the natural process of etching
may be used to control the rate of taper. Since an etchant would be
expected to etch at a constant rate, it would be expected that a top of a
hole 9 may have a larger diameter than a bottom of the hole.
Alternatively, the mask used to create the receptacle may have feathered
edges, thereby increasing an etching rate around a periphery of an entry
location of the hole. By varying the gradation of the feathering by
distance to an edge of the hole 9, varying degrees of taper may be
achieved.
The same process used for the receptacles 9 may be applied to the posts 6,
7. For a more extreme taper, a feathering of the mask may be used to
achieve any desired amount of taper.
For example, the diameter of the tip of the post 6, 7 may be approximately
70 microns. The diameter at the bottom of the receptacle may also be 70
microns. The taper of the post 6, 7 may be 45 degrees. The taper of the
receptacle may be 45-70 degrees.
If the length of the post 6, 7 and depth of the receptacle are each 70
microns, then a 45 degree taper within the receptacle 9 would provide an
entrance to the receptacle 9 with a diameter of approximately three times
the diameter of the tip of the post 6, 7. Because of the taper, the array
8 may be placed at least 70 microns to either side of the center of the
receptacle 9 and still operatively engage the receptacle 9. Alignment
would be achieved in this example because gravity would cause the tapered
post 6, 7 to slide down the tapered receptacle 9 until the post 6, 7
reaches the bottom of the receptacle 9. When the post reaches the bottom
of the receptacle 9, substantially complete alignment would be achieved.
Further, the taper of the post 6, 7 functions to further shape and direct
optical transmission. The tapered post 6, 7 may form a frustrum-shaped
lens directing light along an optical transmission path passing through
the substrate 5.
Many optical components could be placed on the substrate, as shown in FIG.
4. Once the critical alignment has been made, the optical arrays 8 may be
held in place by a mass rapid bonding process. Bonding could include
adhesives, solder, stud bumps, or a similar material.
If the alignment material is transparent such as a polyimid, then the
material can be modified to form an optical-wavefront transforming
structure, as shown in FIG. 5. In this example, the alignment device is a
lens and lens receptacle 9. Such structures may include, but are not
limited to negative or positive lens, Fresnel lens, or optical guide,
allowing more efficient coupling of the light between the active optical
component 1 and a light guiding device such as an optical fiber 12.
An optical-wavefront transforming or confining structure, here called an
optical via (or waveguide) 15, can also be made in the optical transparent
substrate 5. In FIG. 7, light is guided through the area encompassed by
the holes 17, normal to the surface of the page. The figure illustrates
how a system of confining light might look. The apertures 17 in the
substrate 5 may be filled with a polyimid, or similar substance having an
index of refraction lower than that of the substrate's 5. With a lower
index of refraction in the apertures 17, light will be reflected away from
the apertures 17. The apertures 17 would then act as a light confining
structure by deflecting light towards the center of the circular
structure. These apertures 17 are not limited to a certain type of
filling, but could be left unfilled (i.e., filled with air).
The index of refraction of the substrate 5 could be changed to direct light
as desired. Material diffusion, compression, or ultraviolet exposure are
examples of methods of creating an index step in refraction to change a
boundary region from guiding to non-guiding regions.
Antireflection coatings and structures can also be used and structured in
the package to minimize the coupling losses between the active optical
components 8 and passive optical waveguide coupler 26. They may be
disposed on the surface of the substrate 5 nearest to the optical fiber
12.
The dielectric material 20 shown in FIG. 8 used for the precision alignment
structures is placed on the substrate 5. Solder bumps 10, stud bumps, or
metal plating shown in FIG. 8 on the electrical contact pads 3 may be used
to electrically connect the package traces 2 to the optical components.
These traces can go to other electro-optic components (not shown).
Alignment of optical fibers 12 can be determined by alignment apertures 21
through the substrates or by structures built upon the substrate, as shown
in FIG. 6. These features, in turn, may be defined using photolithographic
registration targets 4 on the substrate 5 and provide the alignment that
is required between the active optical-component ports 1 and the optical
fiber 12.
The assembly shown in FIG. 8 can be placed in a housing 23 and sealed, as
shown in FIG. 9. Guide pins 22 mounted in the housing 23 or guide
structures fabricated on the transparent substrate 5 will guide the
waveguide connector assembly 26 to the active optical ports 1.
Testing or burn-in may be performed on the optical assemblies 31 before
use. This testing may be done once the optical array 8 has been placed and
aligned (as discussed above) on some form of substrate 30 to facilitate
handling of that component. These components may be electrically activated
during these procedures, and the optical characteristics can also be
examined at this time. FIG. 10 illustrates how optical components | | |