At least one exemplary embodiment of the present invention includes a method comprising providing an input signal from a first differential temperature sensor to a first primary coil of a transformer, and detecting a transient signal from a secondary coil of the transformer, said transient signal arising upon a halting of the input signal.
CROSS REFERENCE TO RELATED APPLICATIONS
This application claims priority to, and incorporates by reference in its entirety, U.S. Provisional Patent Application Ser. No. 60/336,590, filed Dec. 5, 2001, titled "System for Measurement of Temperature Differentials and Minute Current Flow".
A method for testing a contact region of a semiconductor module having a circuit arrangement is disclosed. In one embodiment, the semiconductor module is heated by an electrical heating current flow and the electrical and/or thermal quality of a plurality of contacts provided in the contact region is determined in the process from a temperature-dependent measurement quantity. The heating current flow is formed by a plurality of heating current pulses. The application of the heating current pulses leads to different phases of the measurement quantity. The different phases are assigned to the different contacts and evaluated correspondingly for determining the electrical and/or thermal quality of the contacts.
