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In-situ monitoring method and system for mold deformation in nanoimprint
   
Document Number
US Patent 6909998
Issued Date
June 21, 2005
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Inventors
Hocheng; Hong (Hsinchu City 300,TW)
Nien; Chin Chung (Jhudong Township, Hsinchu County 310,TW)
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Abstract
The present invention provides a method for in-situ real-time monitoring of mold deformation by using a database to store temporary information during the following steps: (a) providing a mark on the mold body that is easy to observe in order to monitor the mold deformation, (b) installing a signal source and a monitor device for monitoring the deformation quantity on the mold, (c) transforming the above deformation quantity into computer signals for storing in the database and (d) issuing controlling or warning signals to the imprinting machine based on the processing results of the stored information in the database.
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Number of Claims:
34
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Published
June 21, 2005
Application Number
10/665,191
Filed
September 16, 2003
US Classification
702/189   216/44 216/52 430/30 430/5 702/32 977/887
Int'l Classification
G06F   11/30   (20060101)   H01L   21/02   (20060101)   G01N   21/84   (20060101)   H01L   21/31   (20060101)  
Examiner
Assistant Examiner
Priority Data
Jun 02, 2003 [TW] 92114912 A
USPTO Field of Search
702/189   702/32   702/22   430/30   430/5   430/17   430/22   430/272.1   430/275.1   430/302   430/320   216/44   216/52   216/53  
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